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1. Early Onset Diffusion Abnormalities in Refractory Headache Disorders

2. Cerebral volume and diffusion MRI changes in children with sensorineural hearing loss

3. Sociodemographic Disparities in the Diagnostic Management of Pediatric Thyroid Nodules

6. Thyroid Cancer Incidence, Clinical Presentation, and Survival Among Native Hawaiian and Other Pacific Islanders

7. Impact of Histologic Risk Factors on Recurrence Rates for Oral Cavity Squamous Cell Carcinoma

8. Association of Human Papillomavirus Status With Suicide Risk Among Patients With Head and Neck Cancer

9. Restoring metabolism of myeloid cells reverses cognitive decline in ageing

10. Infectious Complications Following Cochlear Implant: Risk Factors, Natural History, and Management Patterns

12. Parotid gland incidentalomas: A single-institution experience

13. Significance of Nodal Metastasis in Parotid Gland Acinar Cell Carcinoma

14. Association of Pediatric Acute-Onset Neuropsychiatric Syndrome With Microstructural Differences in Brain Regions Detected via Diffusion-Weighted Magnetic Resonance Imaging

15. Cerebral volume and diffusion MRI changes in children with sensorineural hearing loss

16. Macrophage de novo NAD+ synthesis specifies immune function in aging and inflammation

17. Revisiting IDO and its value as a predictive marker for anti-PD-1 resistance

19. NFB-04. EXAMINING DIFFUSION, ARTERIAL SPIN-LABELED PERFUSION, AND VOLUMETRIC CHANGES IN THE NEUROFIBROMATOSIS TYPE 1 BRAIN USING AN ATLAS-BASED, MULTI-PARAMETRIC APPROACH

20. O4‐02‐05: DE NOVO NAD+ SYNTHESIS RESCUES NEUROINFLAMMATION AND ALZHEIMER'S DISEASE PHENOTYPES: MODULATING IMMUNE CELL RESPONSES AND MITOCHONDRIAL BIOENERGETICS

22. Reevaluating the role of IDO1: Examining NAD + metabolism in inflammation

23. High volume manufacturing issues for on-die interconnects at the 45nm process node

24. Process roadmap and challenges for metal barriers [copper interconnects]

25. An enhanced 130 nm generation logic technology featuring 60 nm transistors optimized for high performance and low power at 0.7 - 1.4 V

26. A 130 nm generation logic technology featuring 70 nm transistors, dual Vt transistors and 6 layers of Cu interconnects

27. Fast ion conductors: future trends

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