50 results on '"Peter C. Maxwell"'
Search Results
2. Total Critical Area Based Testing.
3. Bridge over troubled waters: Critical area based pattern generation.
4. Cell-aware diagnosis: Defective inmates exposed in their cells.
5. Adaptive testing: Conquering process variations.
6. Towards Variation-Aware Test Methods.
7. Adaptive test directions.
8. Principles and results of some test cost reduction methods for ASICs.
9. The Design, Implementation and Analysis of Test Experiments.
10. Wafer/Package Test Mix for Optimal Defect Detection.
11. Debating the Future of Burn-In.
12. Current ratios: a self-scaling technique for production IDDQ testing.
13. Comparing functional and structural tests.
14. Deception by design: fooling ourselves with gate-level models.
15. Adaptive Testing: Dealing with Process Variability.
16. Current ratios: a self-scaling technique for production I_DDQ testing.
17. Estimation of defect-free IDDQ in submicron circuits using switch level simulation.
18. CMOS IC reliability indicators and burn-in economics.
19. IDDQ and AC Scan: The War Against Unmodelled Defects.
20. The use of IDDQ testing in low stuck-at coverage situations.
21. ETS 2015 best paper.
22. The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability.
23. Quality impacts of non-uniform fault coverage.
24. Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic.
25. Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings.
26. The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need?
27. The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%?
28. The effectiveness of different test sets for PLAs.
29. Reductions in quality caused by uneven fault coverage of different areas of an integrated circuit.
30. Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron Era.
31. Test Sets and Reject Rates: All Fault Coverages are Not Created Equal.
32. IDDQ testing as a component of a test suite: The need for several fault coverage metrics.
33. Wafer Level Reliability Screens.
34. Best Methods for At-Speed Testing?
35. So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment.
36. The Heisenberg Uncertainty of Test.
37. An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing.
38. The Many Faces of Test Synthesis.
39. Let's Grade ALL the Faults.
40. The Interaction of Test and Quality.
41. Alternative Descriptions in Line Drawing Analysis.
42. Incremental Computer Systems.
43. Comparative Analysis of Different Implementations of Multiple-Input Signature Analyzers.
44. Correct DDA Register Transfers for Trapezoidal Integration When Solving Nonlinear Equations of the Form y = A yn.
45. I DDQ Testing as a Component of a Test Suite: The Need for Several Fault Coverage Metrics
46. Comments on 'A Floating Point Multiplexed DDA System'.
47. Role of cyclic electron transport in photosynthesis as measured by the photoinduced turnover of P700 in vivo
48. Hydroxylamine oxidoreductase from Nitrosomonas: absorption spectra and content of heme and metal
49. The kinetic behavior of P-700 during the induction of photosynthesis in algae
50. Hydroxylamine oxidoreductase of Nitrosomonas. Oxidation of diethyldithiocarbamate concomitant with stimulation of nitrite synthesis
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.