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To quantify populations of the corn flea beetle, Chaetocnema, pulicaria Melsheimer (Coleoptera: Chrysomelidae), and refine estimates of a threshold for its control to prevent Stewart's wilt caused by Erwinia stewartii, sequential plantings of `Jubilee' sweet corn were made at 2-wk intervals from April or May through August or September 2001 and 2002 at four locations from southern to northern Illinois: Simpson, Brownstown, Champaign, and Mendota. Densities of C. pulicaria and incidence of Stewart's wilt were monitored weekly. At Mendota, where C. pulicaria populations were decimated by cold temperatures during winter 2000-2001, densities reached 33.3 beetles per 15-cm yellow sticky trap per day by September 2002, after a mild 2001-2002 winter. Maximum incidence of Stewart's wilt in single plots at Simpson, Brownstown, Champaign, and Mendota was 22, 36, 39, and 2%, respectively, in 2001, and 33, 47, 99, and 87%, respectively, in 2002. In 24 plots where beetle densities were ⩽2 per trap per day, Stewart's wilt incidence was <5% in 20 plots. We propose that two corn flea beetles per trap per day be used as a threshold for insecticide application to seedlings to control C. pulicaria and minimize subsequent incidence of Stewart's wilt in processing sweet corn. Enzyme-linked immunosorbent assays indicated that E. stewartii incidence in C. pulicaria peaked at 67, 62, and 54%, respectively, at Simpson, Brownstown, and Champaign, in 2001, and at 71, 76, and 60%, respectively, in 2002. Further studies might allow the use of areawide or field-specific estimates of E. stewartii incidence in corn flea beetles for adjusting management decisions. [ABSTRACT FROM AUTHOR]

The possibility that the Mi gene or genes tightly linked to Ht1 convey general resistance to races of Exserohilum turcicum that are virulent against Ht1 (i.e., residual resistance) could be useful in sweet corn where the Mi gene is present in many commercial hybrids and breeding populations. The objective of this study was to determine if the frequency of the Ht1 gene changed in populations of sweet corn selected for general resistance to E. turcicum race 1, thus conveying residual resistance. Four populations were developed with theoretical initial frequencies of the Mi gene of 0, 0.25, 0.25, and 0.5. The populations were advanced by recurrent mass selection with parental control through four or five cycles of selection following inoculation with an Ht-virulent race of E. turcicum (i.e., race 1). Plants from each cycle of each population were evaluated for severity of northern corn leaf blight (NCLB) and chlorotic lesion reactions following inoculation in field and greenhouse trials with either race 0 or 1 of E. turcicum. Recurrent mass selection for general resistance to E. turcicum race 1 reduced the severity of NCLB in all four populations of sweet corn, although the change in the most susceptible population was minimal. Percent gain per cycle was 14.5, 12.3, 14, and 3.7% for populations I, II, Ill, and IV, respectively. The Ht1 gene did not convey levels of general resistance to E. turcicum race 1 that were substantial enough to be selected for in this population improvement program. There was no apparent selection advantage for resistance to F. turcicum race 1 in the populations that contained the Ht1 gene. The frequency of the Ht1 gene did not differ among cycles of selection within any of the populations in response to improved levels of general resistance to NCLB. The lack of change in frequency of Ht1 in these populations and the similarity in gain per cycle among populations with and without Ht1 lead us to conclude that the Ht1 gene itself did not have a residual effect on resistance. [ABSTRACT FROM AUTHOR]