38 results on '"Parks, H.G."'
Search Results
2. VHDL-AMS modeling of total ionizing dose radiation effects on CMOS mixed signal circuits
3. SET tolerant CMOS comparator
4. Multi-step process control and characterization of scanning probe lithography
5. Contamination of silicon dioxide films by aqueous zirconium and hafnium species
6. Bile flow and composition are modulated by intravenous glycine in an in vivo warm ischaemia reperfusion injury model
7. CHARACTERISTICS OF P+N ALLOY JUNCTIONS PRODUCED BY SINGLE LASER PULSES
8. Preface
9. Total dose radiation effect simulations on a high-precision data acquisition system
10. Hafnium or Zirconium High-k Fab Cross-Contamination Issues
11. A model for outgassing of organic contamination from wafer carrier boxes.
12. The effect of hafnium or zirconium contamination on MOS processes.
13. The influence of the pre-anneal ambient on the gate oxide integrity effect of copper contamination.
14. The effect of copper contamination on field overlap edges and perimeter junction leakage current
15. Quantifying the impact of homogeneous metal contamination using test structure metrology and device modeling
16. Concept and initial feasibility of contamination TCAD by integration with commercial software.
17. Threshold voltage shift caused by copper contamination.
18. Research accomplishments at the University of Arizona SEMATECH Center of Excellence for contamination/defect assessment and control
19. Mechanistic Study of the Deposition of Metals from HF Solutions onto Silicon Wafers
20. Yield modeling from SRAM failure analysis.
21. BEAMOS—A new electron beam digital memory device.
22. Research accomplishments at the University of Arizona SEMATECH Center of Excellence for contamination/defect assessment and control.
23. Characteristics of MOSFET's fabricated on laser-recrystallized Silicon islands on amorphous substrates using selective absorption and beam shaping techniques.
24. Estimating the effect of contamination-induced leakage current in view of DRAM architectural trends.
25. The nature of defect size distributions in semiconductor processes.
26. Fast turn around post process yield enhancement for custom VLSI foundries.
27. Test structure metrology of homogeneous contamination.
28. Evaluation of metallization systems with test structures and yield modeling.
29. A semiconductor nonvolatile electron beam accessed mass memory.
30. MOSFET's fabricated in laser-recrystallized Silicon on Quartz using selectively absorbing dielectrical layers.
31. The influence of copper contamination on gate oxide integrity.
32. A Binary-Analog Correlator
33. Transient Annealing of Ion-Implanted Silicon Using A Scanning IR Line Source
34. Fast turn around post process yield enhancement for custom VLSI foundries
35. The influence of the pre-anneal ambient on the gate oxide integrity effect of copper contamination
36. The influence of copper contamination on gate oxide integrity
37. Mechanistic Study of the Deposition of Metals from HF Solutions onto Silicon Wafers.
38. Transient Annealing of Ion-Implanted Silicon Using A Scanning IR Line Source.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.