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The minute elements that causes the direct current (DC) and radiofrequency magnetic field dependence of the surface impedance during the functioning of microwave devices were examined. Measurements of impedance were conducted on cuprate superconducting films by a parallel plate resonator operating at 11 GHz and located perpendicular to a DC magnetic field. Results indicate that the characterization of the surface impedance of cuprates in the microwave range requires a thorough treatment of pinning and viscosity.

The dielectric features of a new insulating perovskite Sr2AlTaO6 (SAT) films and the changes in the structure and electrical properties of the high temperature superconductor YBa2Cu3O7 on LaAlO3 substrates due to SAT were examined. This involved the utilization of x-ray rocking curve and Rutherford backscattering channelling measurements on the SAT films. The applicability of SAT to bilayer and trilayer superconducting devices was demonstrated.

Examines the penetration depth, microwave surface resistance and gap ratio in niobium nitride and Ba[sub 1-x]K[sub x]BiO[sub 3] thin films. Deposition of samples by direct current reactive magnetron sputtering; Achievement of the transverse electrical mode excitation between the films; Impact of underlayer use on magnetic penetration depth.