1. ONLINE TESTING EMBEDDED SYSTEMS: ADAPTING AUTOMATIC CONTROL TECHNIQUES TO MICROELECTRONICS TESTING
- Author
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Libor Rufer, Emmanuel Simeu, Salvador Mir, Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), P. Horacek, M. Simandl, P. Zitek, Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Torella, Lucie, and P. Horacek, M. Simandl, P. Zitek
- Subjects
0209 industrial biotechnology ,Engineering ,Automatic control ,Relation (database) ,business.industry ,[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics ,Linear system ,Control engineering ,02 engineering and technology ,Integrated circuit ,Field (computer science) ,Fault detection and isolation ,020202 computer hardware & architecture ,law.invention ,Computer Science::Hardware Architecture ,020901 industrial engineering & automation ,Filter (video) ,law ,PACS 85.42 ,0202 electrical engineering, electronic engineering, information engineering ,Elliptic filter ,[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics ,business - Abstract
Invited Talk; International audience; This paper is aimed at exploiting Fault Detection and Isolation (FDI) techniques widely known in automatic control for solving online test problem in embedded Integrated Circuits (ICs). Before reaching this aim, we will briefly review the field of microelectronics testing, introducing basic concepts and techniques. We will next introduce FDI model-based approaches and their application for online testing of embedded ICs considering linear systems with potential faults and disturbances. The parity relation-based residual is specially suitable for this type of application. As an example, we will apply it to concurrent fault detection in a digital embedded filter. The proposed scheme will then be illustrated for a linear digital pass-band elliptic filter.
- Published
- 2005