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Metal-oxide semiconductors (MOS) are widely utilized for catalytic and photocatalytic applications in which the dynamics of charged carriers (e.g., electrons, holes) play important roles. Under operation conditions, photoinduced surface oxygen vacancies (PI-SOV) can greatly impact the dynamics of charge carriers. However, current knowledge regarding the effect of PI-SOV on the dynamics of hole migration in MOS films, such as titanium dioxide, is solely based upon volume-averaged measurements and/or vacuum conditions. This limits the basic understanding of hole-vacancy interactions, as they are not capable of revealing time-resolved variations during operation. Here, we measured the effect of PI-SOV on the dynamics of hole migration using time-resolved atomic force microscopy. Our findings demonstrate that the time constant associated with hole migration is strongly affected by PI-SOV, in a reversible manner. These results will nucleate an insightful understanding of the physics of hole dynamics and thus enable emerging technologies, facilitated by engineering hole-vacancy interactions.

We present results of atomic-force-microscopy-based friction measurements on Re-doped molybdenum disulfide (MoS

The onset of yielding and the related atomic-scale plastic flow behavior of bulk metallic glasses at room temperature have not been fully understood due to the difficulty in performing the atomic-scale plastic deformation experiments needed to gain direct insight into the underlying fundamental deformation mechanisms. Here we overcome these limitations by combining a unique sample preparation method with atomic force microscopy-based indentation, which allows study of the yield stress, onset of yielding, and atomic-scale plastic flow of a platinum-based bulk metallic glass in volumes containing as little as approximately 1000 atoms. Yield stresses markedly higher than in conventional nanoindentation testing were observed, surpassing predictions from current models that relate yield stress to tested volumes; subsequent flow was then established to be homogeneous without exhibiting collective shear localization or loading rate dependence. Overall, variations in glass properties due to fluctuations of free volume are found to be much smaller than previously suggested. Metallic glasses display a high yield strength and typically deform via heterogeneous shear bands beyond the yield point. Here, deformation of as little as 1000 atoms in a Pt-based metallic glass at room temperature leads to near-theoretical yield strength, beyond which homogeneous deformation occurs.

Perovskites are widely utilized either as a primary component or as a substrate in which the dynamics of charged oxygen vacancy defects play an important role. Current knowledge regarding the dynamics of vacancy mobility in perovskites is solely based upon volume- and/or time-averaged measurements. This impedes our understanding of the basic physical principles governing defect migration in inorganic materials. Here, we measure the ergodic and nonergodic dynamics of vacancy migration at the relevant spatial and temporal scales using time-resolved atomic force microscopy techniques. Our findings demonstrate that the time constant associated with oxygen vacancy migration is a local property and can change drastically on short length and time scales, such that nonergodic states lead to a dramatic increase in the migration barrier. This correlated spatial and temporal variation in oxygen vacancy dynamics can extend hundreds of nanometers across the surface in inorganic perovskites.

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

We present results of atomic-force-microscopy-based friction measurements on Re-doped molybdenum disulfide (MoS2). In stark contrast to the widespread observation of decreasing friction with increasing number of layers on two-dimensional (2D) materials, friction on Re-doped MoS2 exhibits an anomalous, i.e., inverse dependence on the number of layers. Raman spectroscopy measurements combined with ab initio calculations reveal signatures of Re intercalation. Calculations suggest an increase in out-of-plane stiffness that inversely correlates with the number of layers as the physical mechanism behind this remarkable observation, revealing a distinctive regime of puckering for 2D materials., Comment: 26 pages incl. Supplemental Material, 5 figures

Nanoimprinting by thermoplastic forming has attracted significant attention due to its promise of low-cost fabrication of functionalized surfaces and nanostructured devices, and metallic glasses have been identified as a material class ideally suited for nanoimprinting. In particular, their featureless atomic structure suggests that there may not be an intrinsic size limit to the material’s ability to replicate a mould. Here we demonstrate atomic-scale imprinting into a platinum-based metallic glass alloy under ambient conditions using atomic step edges of a strontium titanate single crystal as a mould. The moulded metallic glass replicates the ‘atomic smoothness’ of the strontium titanate, with identical roughness to the one measured on the mould even after multiple usages and with replicas exhibiting an exceptional long-term stability of years. By providing a practical, reusable, and potentially high-throughput approach for atomic imprinting, our findings may open novel applications in surface functionalization through topographical structuring. Nanoimprinting is a technique where the surface features of a mould can be transferred onto a replica and is relevant to the production of nanostructured devices. The authors report a method that enables the imprinting of structural features of SrTiO3 single crystals at the atomic level into a replica made from bulk metallic glass.

Bulk metallic glasses (BMGs) exhibit unique mechanical properties; however, a detailed understanding of nanotribological properties of BMGs is still lacking. In this article, alloy composition, surface disorder, normal load, and velocity dependence of friction between a single asperity contact and the BMG surface is explored with two-dimensional Prandtl-Tomlinson (PT) model. Our numerical results reveal distinct regimes for load and velocity dependence of friction at small length scales. The friction is inert to alloy composition and surface roughness for small loads in wearless regime. Surface corrugation increases with the number of alloy elements and dominates the friction for normal loads that may lead wear. Calculations for the effect of sliding velocity on friction between a single-atom contact and different BMGs show that velocity dependence of friction is inert to alloy composition and surface structure for sliding velocities smaller than 1.3 μm/s. Besides, the friction evolves non-monotonically with alloy composition and surface disorder for larger sliding velocities. Our numerical results show that tracking the minimum energy path and slip-stick motion determine the nanotribological properties of BMGs. The single asperity can trace the minimum energy path at small loads and sliding velocities while increasing load and sliding velocities impede following the minimum energy path with inflation in slip-stick motion. Our analyses disclose that BMGs unveil two unique frictional properties at small length scales: (I) friction is inert to alloy composition and surface disorder in wearless friction regime, (II) velocity dependence of friction does not depend on composition and disorder for small sliding speeds. These results promote BMGs as ideal materials for applications that require high durability and low friction in quasi-dynamic operating conditions.

The ability to affect the surface properties of non-polar Cr2O3 films through polar ZnO(0001) and (0001[combining macron]) supports was investigated by characterizing the polarity of ZnO films grown on top of the Cr2O3 surfaces. The growth and geometric and electronic structures of the ZnO films were characterized with X-ray photoelectron spectroscopy, ultra-violet photoelectron spectroscopy, reflection high-energy electron diffraction, low-energy electron diffraction, and X-ray diffraction. The ZnO growth mode was Stranski-Krastanov, which can be attributed to the ZnO layers initially adopting a non-polar structure with a lower surface tension before transitioning to the polar bulk structure with a higher surface energy. A similar result has been reported for ZnO growth on α-Al2O3(0001), which is isostructural with Cr2O3. The polarity of the added ZnO layer was determined by examining the surface morphology following wet chemical etching with atomic force microscopy and by characterizing the surface reactivity via temperature-programmed desorption of alcohols, which strongly depends on the ZnO polarization direction. Consistent with prior work on ZnO growth on bulk Cr2O3(0001), both measurements indicate that thick Cr2O3 layers support ZnO(0001[combining macron]) growth regardless of the underlying ZnO substrate polarization; however, the polarization direction of ZnO films grown on Cr2O3 films less than three repeat units thick follows the direction of the underlying substrate polarization. These findings show that it is possible to manipulate the surface properties of non-polar materials with a polar substrate, but that the effect does not penetrate past just a couple of repeat units.

Two-dimensional (2D) silica (SiO2) and aluminosilicate (AlSi3O8) bilayers grown on Pd(111) were fabricated and systematically studied using ultrahigh vacuum surface analysis in combination with theoretical methods, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, low-energy electron diffraction (LEED), scanning tunneling microscopy (STM), and density functional theory. Based on LEED results, both SiO2 and AlSi3O8 bilayers start ordering above 850 K in 2 × 10−6 Torr oxygen. Both bilayers show hexagonal LEED patterns with a periodicity approximately twice that of the Pd(111) surface. Importantly, the SiO2 bilayer forms an incommensurate crystalline structure whereas the AlSi3O8 bilayer crystallizes in a commensurate structure. The incommensurate crystalline SiO2 structure on Pd(111) resulted in a moire pattern observed with LEED and STM. Theoretical results show that straining the pure SiO2 bilayer to match Pd(111) would cost 0.492 eV per unit cell; this strain energy is reduced to just 0.126 eV per unit cell by replacing 25% of the Si with Al which softens the material and expands the unstrained lattice. Furthermore, the missing electron created by substituting Al3+ for Si4+ is supplied by Pd creating a chemical bond to the AlSi3O8 bilayer, whereas van der Waals interactions predominate for the SiO2 bilayer. The results reveal how the interplay between strain, doping, and charge transfer determine the structure of metal-supported 2D silicate bilayers and how these variables may potentially be exploited to manipulate 2D materials structures.

The quantitative interatomic force measurements open a new pathway to materials characterization, surface science, and chemistry by elucidating the force between 'two' interacting atoms as a function of their separation. Atomic force microscope is the ideal platform to gauge interatomic forces between the tip and the sample. For such quantitative measurements, either the oscillation frequency or the oscillation amplitude and the phase of a vibrating cantilever are recorded as a function of the tip-sample separation. These experimental measures are subsequently converted into the interatomic force laws. Recently, it has been shown that the most commonly applied mathematical conversion techniques may suffer a significant deviation from the actual force laws. To avoid assessment of unphysical interatomic forces, either the use of very small (i.e., a few picometers) or very large oscillation amplitudes (i.e., a few nanometers) has been proposed. However, the use of marginal oscillation amplitudes gives rise to another problem as it lacks the feasibility due to the adverse signal to noise ratios. Here we show a new mathematical conversion principle that confronts interatomic force measurements while preserving the oscillation amplitude within the experimentally achievable and favorable limits, i.e. tens of picometers. We anticipate that our findings will be the nucleus of reliable evaluation of material properties with a more accurate measurement of interatomic force laws., 6 pages, 2 figures

With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample interaction potentials. Such quantitative experiments are based on the accurate measurement of the resonance frequency shift due to the tip-sample interaction. Here, we experimentally show that the resonance frequency of oscillating probes used for SPM experiments change systematically as a function of oscillation amplitude under typical operating conditions. This change in resonance frequency is not due to tip-sample interactions, but rather due to the cantilever strain or geometric effects and thus the resonance frequency being a function of the oscillation amplitude. Our numerical calculations demonstrate that the amplitude dependence of the resonance frequency is an additional yet overlooked systematic error source that can result nonnegligible errors in measured interaction potentials and forces. Our experimental results and complementary numerical calculations reveal that the frequency shift due to this amplitude dependence needs to be corrected even for experiments with active oscillation amplitude control to be able to quantify the tip-sample interaction potentials and forces with milli-electron volt and pico-Newton resolutions., 18 pages, 3 Figures, 1 table, and supplemental material

With recent advances in dynamic scanning probe microscopy techniques, it is now a routine to image the sub-molecular structure of molecules with atomically-engineered tips which are prepared via controlled modification of the tip termination and are chemically well-defined. The enhanced spatial resolution is possible as atomically-engineered tips can preserve their integrity in the repulsive interaction regime. Although the mechanism of improved spatial resolution has been investigated both experimentally and theoretically, the ultimate temporal resolution while preserving picometer scale spatial resolution still remains an open question. Here, we computationally analyze the temporal resolution of atomic force microscopy imaging with atomically-engineered tips. Our computational results reveal that non-metal terminated tips, e.g. oxygen-terminated copper, are well-suited for enhanced temporal resolution up to video rate imaging velocities while preserving picometer range spatial resolution. Contrarily, the highest-attainable spatial resolution of atomically-engineered tips with low-stiffness, e.g. CO-terminated, deteriorate with increasing imaging velocity. Our results reveal that when atomically-engineered tips terminated with molecules are in use, imaging velocities in the order of nanometers per second at most are inevitable even for atomically flat surfaces to retain atomic resolution and avoid slip-stick motion. In addition to shedding light on the temporal resolution of atomic force microscopy imaging with atomically-engineered tips, our numerical results provide an outlook to the scalability of atom-by-atom fabrication using scanning probe microscopy techniques., 11 pages, 4 figures

Ever since their dawn in 2009 1, hybrid organic–inorganic perovskite materials have been experiencing an ever increase in research investment to finally emerge as a strong alternative for high power conversion efficiency (PCE) photovoltaic devices at low costs. One of the main challenges that is currently impeding the upscaling of these solar cells is the phenomenon of hysteresis on their j–V response that has been correlated with slow ion migration which, in turn, affects their photovoltaic properties. Although hysteresis has been described to some extent of detail, the precise role of the external contacts remains under debate. Furthermore, there has been a great deal of focus on materials and interface design while less attention has been given to optical aspects of these cells. Our work highlights the role of electron transport layer (ETL) of different compositions and synthesized through various routes on the hysteresis response of these systems. We show that there’s a clear correlation between thickness, morphology and composition of the ETL on the photovoltaic response these systems. To better elucidate such a response, we have utilized photoluminescence, electroluminescence, absorption and kelvin probe force microscopy to get a substantial grasp of the optoelectronic phenomena occurring at the interfaces in perovskite solar cells. Acknowledgments: This research was supported by a Hydro-Quebec/NSERC CRD grant and the McGill Sustainability Systems Initiative (MSSI). 1- Kojima, A., Teshima, K., Shirai, Y. and Miyasaka, T., 2009. Organometal halide perovskites as visible-light sensitizers for photovoltaic cells. Journal of the American Chemical Society, 131(17), pp.6050-6051.

A common use of atomic force microscopy is quantifying local forces through tip-sample interactions between the probe tip and a sample surface. The accuracy of these measurements depends on the accuracy to which the cantilever spring constant is known. Recent work has demonstrated that the measured spring constant of a cantilever can vary up to a factor of five, even for the exact same cantilever measured by different users on different microscopes. Here, we demonstrate that a standard method for calibrating the spring constant (using oscillations due to thermal energy) is susceptible to ambient acoustic noise, which can alter the result significantly. We demonstrate a step-by-step method to measure the spring constant by actively driving the cantilever to measure the resonance frequency and the quality factor, giving results that are unaffected by acoustic noise. Our method can be performed rapidly on any atomic force microscope without any expensive additional hardware.A common use of atomic force microscopy is quantifying local forces through tip-sample interactions between the probe tip and a sample surface. The accuracy of these measurements depends on the accuracy to which the cantilever spring constant is known. Recent work has demonstrated that the measured spring constant of a cantilever can vary up to a factor of five, even for the exact same cantilever measured by different users on different microscopes. Here, we demonstrate that a standard method for calibrating the spring constant (using oscillations due to thermal energy) is susceptible to ambient acoustic noise, which can alter the result significantly. We demonstrate a step-by-step method to measure the spring constant by actively driving the cantilever to measure the resonance frequency and the quality factor, giving results that are unaffected by acoustic noise. Our method can be performed rapidly on any atomic force microscope without any expensive additional hardware.

In topological crystalline insulators the topological conducting surface states are protected by crystal symmetry, in principle making it possible to pattern nanoscale insulating and conductive motifs solely by breaking local symmetries on an otherwise homogeneous, single-phase material. We show, using scanning tunneling microscopy/spectroscopy, that defects that break local symmetry of SnTe suppress electron tunneling over an energy range as large as the bulk band gap, an order of magnitude larger than that produced globally via magnetic fields or uniform structural perturbations. Complementary ab initio calculations show how local symmetry breaking obstructs topological surface states as shown by a threefold reduction of the spectral weight of the topological surface states. The finding highlights the potential benefits of manipulating the surface morphology to create devices that take advantage of the unique properties of topological surface states and can operate at practical temperatures.

Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties with high-resolution has gained much popularity in recent years with advances in dynamic AFM methodologies. A calibration factor is required to convert the electrical readout to a mechanical oscillation amplitude in order to extract quantitative information about the surface. We propose a new calibration technique for the oscillation amplitude of electrically driven probes, which is based on measuring the electrical energy input to maintain the oscillation amplitude constant. We demonstrate the application of the new technique with quartz tuning fork including the qPlus configuration, while the same principle can be applied to other piezoelectric resonators such as length extension resonators, or piezoelectric cantilevers. The calibration factor obtained by this technique is found to be in agreement with using thermal noise spectrum method for capsulated, decapsulated tuning forks and tuning forks in the qPlus configuration., Comment: Main Text 10 pages (3 Figures and 1 Table), Supplemental Information (7 pages)

The ability to affect the surface properties of non-polar Cr

SnTe is a topological crystalline insulator that exhibits crystal symmetry protected topological surface states (SS), which are useful for the development of novel devices, such as low-dissipation transistors. However, major obstacles remain to probe the SS and realize the application of SnTe and other topological insulators. Due to unintentional doping by Sn vacancies, bulk conduction may overwhelm the transport through SS in SnTe. Synthesis of SnTe films thin enough to suppress bulk conduction has proven difficult due to the formation of discontinuous domain structures. By introducing a novel deposition method that builds upon molecular beam epitaxy, we achieve ultrathin continuous films of single-orientation SnTe (001) on SrTiO3 (STO) (001) substrates. We separate the carrier concentrations in the bulk and in the SS and discover that conduction through the SS dominates (a majority of hole carriers occupy the SS) in films thinner than 40 unit cells, with a large temperature independent hole density of SS nS = 5 × 1014 cm−2. Unlike the depletion of SS carriers observed at the vacuum/SnTe interface that inhibits topological behavior, we show that SS carriers are buried and protected from depletion at the SnTe/STO interface, which is enabled by the relatively large bandgap of STO and its favorable band alignment with SnTe. This work provides an important pathway for probing and realizing SS transport in SnTe and other TIs even when bulk conduction coexists.

Atomic force microscopy (AFM) is a versatile surface characterization method that can map a sample's topography with high spatial resolution while simultaneously interrogating its surface chemistry through the site-specific high-resolution quantification of the forces acting between the sample and the probe tip. Thanks to considerable advances in AFM measurement technology, such local measurements of chemical properties have gained much popularity in recent years. To this end, dynamic AFM methodologies are implemented where either the oscillation frequency or the oscillation amplitude and phase of the vibrating cantilever are recorded as a function of tip-sample distance and subsequently converted to reflect tip-sample forces or interaction potentials. Such conversion has, however, been shown to produce non-negligible errors when applying the most commonly used mathematical conversion procedures if oscillation amplitudes are of the order of the decay length of the interaction. Extending on these earlier findings, the computational study presented in this paper reveals that the degree of divergence from actual values may also critically depend on both the overall strength of tip-sample interaction and the distance at which the interaction is obtained. These systematic errors can, however, be effectively eliminated by using oscillation amplitudes that are sufficiently larger than the decay length of the interaction potential.

A material's ability to interact with approaching matter is governed by the structural and chemical nature of its surfaces. Tailoring surfaces to meet specific needs requires developing an understanding of the underlying fundamental principles that determine a surface's reactivity. A particularly insightful case occurs when the surface site exhibiting the strongest attraction changes with distance. To study this issue, combined noncontact atomic force microscopy and scanning tunneling microscopy experiments have been carried out, where the evolution of the local chemical interaction with distance leads to a contrast reversal in the force channel. Using highly ordered pyrolytic graphite surfaces and metallic probe tips as a model system, we find that at larger tip-sample distances, carbon atoms exhibit stronger attractions than hollow sites while upon further approach, hollow sites become energetically more favorable. For the tunneling current that is recorded at large tip-sample separations during acquisition of a constant-force image, the contrast is dominated by the changes in tip-sample distance required to hold the force constant ('cross-talk'); at smaller separations the contrast turns into a convolution of this cross-talk and the local density of states. Analysis shows that the basic factors influencing the force channel contrast reversal are locally varying decay lengths and an onset of repulsive forces that occurs for distinct surface sites at different tip-sample distances. These findings highlight the importance of tip-sample distance when comparing the relative strength of site-specific chemical interactions.

We determine the surface reconstruction of $\mathrm{SrTi}{\mathrm{O}}_{3}$ used to achieve superconducting FeSe films in experiments, which is different from the $1\ifmmode\times\else\texttimes\fi{}1\mathrm{Ti}{\mathrm{O}}_{2}$-terminated $\mathrm{SrTi}{\mathrm{O}}_{3}$ assumed by most previous theoretical studies. In particular, we identify the existence of a double $\mathrm{Ti}{\mathrm{O}}_{2}$ layer at the FeSe/$\mathrm{SrTi}{\mathrm{O}}_{3}$ interface that plays two important roles. First, it facilitates the epitaxial growth of FeSe. Second, ab initio calculations reveal a strong tendency for electrons to transfer from an oxygen deficient $\mathrm{SrTi}{\mathrm{O}}_{3}$ surface to FeSe when the double $\mathrm{Ti}{\mathrm{O}}_{2}$ layer is present. The double layer helps to remove the hole pocket in the FeSe at the \ensuremath{\Gamma} point of the Brillouin zone and leads to a band structure characteristic of superconducting samples. The characterization of the interface structure presented here is a key step towards the resolution of many open questions about this superconductor.

The surface structures of $\mathrm{SrTi}{\mathrm{O}}_{3}$ (100) single crystals were examined as a function of annealing time and temperature in either oxygen atmosphere or ultrahigh vacuum (UHV) using noncontact atomic force microscopy (NC-AFM), Auger electron spectroscopy (AES), and low-energy electron diffraction (LEED). Samples were subsequently analyzed for the effect the modulation of their charge distribution had on their surface potential. It was found that the evolution of the $\mathrm{SrTi}{\mathrm{O}}_{3}$ surface roughness, stoichiometry, and reconstruction depends on the preparation scheme. LEED revealed phase transitions from a $(1\ifmmode\times\else\texttimes\fi{}1)$ termination to an intermediate $c(4\ifmmode\times\else\texttimes\fi{}2)$ reconstruction to ultimately a $(\ensuremath{\surd}13\ifmmode\times\else\texttimes\fi{}\ensuremath{\surd}13)\ensuremath{-}R33.{7}^{\ensuremath{\circ}}$ surface phase when the surface was annealed in an oxygen flux, while the reverse transition from $(\ensuremath{\surd}13\ifmmode\times\else\texttimes\fi{}\ensuremath{\surd}13)\ensuremath{-}R33.{7}^{\ensuremath{\circ}}$ to $c(4\ifmmode\times\else\texttimes\fi{}2)$ was observed when samples were annealed in UHV. When the surface reverted to $c(4\ifmmode\times\else\texttimes\fi{}2)$, AES data indicated decreases in both the surface Ti and O concentrations. These findings were corroborated by NC-AFM imaging, where initially $\mathrm{Ti}{\mathrm{O}}_{2}$-terminated crystals developed half-unit cell high steps following UHV annealing, which is typically attributed to a mix of SrO and $\mathrm{Ti}{\mathrm{O}}_{2}$ terminations. Surface roughness evolved nonmonotonically with UHV annealing temperature, which is explained by electrostatic modulations of the surface potential caused by increasing oxygen depletion. This was further corroborated by experiments in which the apparent roughness tracked in NC-AFM could be correlated with changes in the surface charge distribution that were controlled by applying a bias voltage to the sample. Based on these findings, it is suggested that careful selection of preparation procedures combined with application of an electric field may be used to tune the properties of thin films grown on $\mathrm{SrTi}{\mathrm{O}}_{3}$.

Atomic force microscopy (AFM) and spectroscopy are based on locally detecting the interactions between a surface and a sharp probe tip. For highest resolution imaging, noncontact modes that avoid tip-sample contact are used; control of the tip's vertical position is accomplished by oscillating the tip and detecting perturbations induced by its interaction with the surface potential. Due to this potential's nonlinear nature, however, achieving reliable control of the tip-sample distance is challenging, so much so that despite its power vacuum-based noncontact AFM has remained a niche technique. Here we introduce a new pathway to distance control that prevents instabilities by externally tuning the oscillator's response characteristics. A major advantage of this operational scheme is that it delivers robust position control in both the attractive and repulsive regimes with only one feedback loop, thereby providing an easy-to-implement route to atomic resolution imaging and quantitative tip-sample interaction force measurement.

Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be affected by piezo nonlinearities, thermal and electronic drift, tip asymmetries, and elastic deformation of the tip apex, these effects need to be considered during image interpretation.In this paper, we analyze their impact on the acquired data, compare different methods to record atomic-resolution surface force fields, and determine the approaches that suffer the least from the associated artifacts. The related discussion underscores the idea that since force fields recorded by using NC-AFM always reflect the properties of both the sample and the probe tip, efforts to reduce unwanted effects of the tip on recorded data are indispensable for the extraction of detailed information about the atomic-scale properties of the surface.

Topological crystalline insulators (TCIs) are new materials with metallic surface states protected by crystal symmetry. The properties of molecular beam epitaxy grown SnTe TCI on SrTiO3(001) are investigated using scanning tunneling microscopy (STM), noncontact atomic force microscopy, low-energy and reflection high-energy electron diffraction, X-ray diffraction, Auger electron spectroscopy, and density functional theory. Initially, SnTe (111) and (001) surfaces are observed; however, the (001) surface dominates with increasing film thickness. The films grow island-by-island with the [011] direction of SnTe (001) islands rotated up to 7.5° from SrTiO3 [010]. Microscopy reveals that this growth mechanism induces defects on different length scales and dimensions that affect the electronic properties, including point defects (0D); step edges (1D); grain boundaries between islands rotated up to several degrees; edge-dislocation arrays (2D out-of-plane) that serve as periodic nucleation sites for pit growth (2D in-plane); and screw dislocations (3D). These features cause variations in the surface electronic structure that appear in STM images as standing wave patterns and a nonuniform background superimposed on atomic features. The results indicate that both the growth process and the scanning probe tip can be used to induce symmetry breaking defects that may disrupt the topological states in a controlled way.

Quartz tuning fork-based force sensors where one prong is immobilized onto a holder while the other one is allowed to oscillate freely ('qPlus' configuration) are in widespread use for high-resolution scanning probe microscopy applications. Due to the small size of the tuning forks (≈3 mm) and the complexity of the sensor assemblies, the reliable and repeatable manufacturing of the sensors has been challenging. In this paper, we investigate the contribution of the amount and location of the epoxy glue used to attach the tuning fork to its holder on the sensor's performance. Towards this end, we use finite element analysis to model the entire sensor assembly and to perform static and dynamic numerical simulations. Our analysis reveals that increasing the thickness of the epoxy layer between prong and holder results in a decrease of the sensor's spring constant, eigenfrequency, and quality factor while showing an increasing deviation from oscillation in its primary modal shape. Adding epoxy at the sides of the tuning fork also leads to a degradation of the quality factor even though in this case, spring constant and eigenfrequency rise in tandem with a lessening of the deviation from its ideal modal shape.