1. Ferromagnetism of MnxSi1-x(x ∼ 0.5) films grown in the shadow geometry by pulsed laser deposition method
- Author
-
S. N. Nikolaev, A. S. Semisalova, V. V. Rylkov, V. V. Tugushev, A. V. Zenkevich, A. L. Vasiliev, E. M. Pashaev, K. Yu. Chernoglazov, Yu. M. Chesnokov, I. A. Likhachev, N. S. Perov, Yu. A. Matveyev, O. A. Novodvorskii, E. T. Kulatov, A. S. Bugaev, Y. Wang, and S. Zhou
- Subjects
Physics ,QC1-999 - Abstract
The results of a comprehensive study of magnetic, magneto-transport and structural properties of nonstoichiometric MnxSi1-x (x ≈ 0.51-0.52) films grown by the Pulsed Laser Deposition (PLD) technique onto Al2O3(0001) single crystal substrates at T = 340°C are present. A highlight of used PLD method is the non-conventional (“shadow”) geometry with Kr as a scattering gas during the sample growth. It is found that the films exhibit high-temperature (HT) ferromagnetism (FM) with the Curie temperature TC ∼ 370 K accompanied by positive sign anomalous Hall effect (AHE); they also reveal the polycrystalline structure with unusual distribution of grains in size and shape. It is established that HT FM order is originated from the bottom interfacial self-organizing nanocrystalline layer. The upper layer adopted columnar structure with the lateral grain size ≥50 nm, possesses low temperature (LT) type of FM order with Tc ≈ 46 K and contributes essentially to the magnetization at T ≤ 50 K. Under these conditions, AHE changes its sign from positive to negative at T ≤ 30K. We attribute observed properties to the synergy of distribution of MnxSi1-x crystallites in size and shape as well as peculiarities of defect-induced FM order in shadow geometry grown polycrystalline MnxSi1-x (x ∼ 0.5) films.
- Published
- 2016
- Full Text
- View/download PDF