1. Resonant Soft X-Ray Scattering on LaPt$_2$Si$_2$
- Author
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Mukkattukavil, Deepak John, Hellsvik, Johan, Ghosh, Anirudha, Chatzigeorgiou, Evanthia, Nocerino, Elisabetta, Wang, Qisi, von Arx, Karin, Huang, Shih-Wen, Ekholm, Victor, Hossain, Zakir, Thamizhavel, Arumugum, Chang, Johan, Mansson, Martin, Nordstrom, Lars, Sathe, Conny, Agaker, Marcus, Rubensson, Jan-Erik, and Sassa, Yasmine
- Subjects
Condensed Matter - Materials Science - Abstract
X-ray absorption (XAS) and Resonant Inelastic X-ray Scattering (RIXS) spectra of LaPt$_2$Si$_2$ single crystal at the Si L and La N edges are presented. The data are interpreted in terms of density functional theory, showing that the Si spectra can be described in terms of Si $s$ and $d$ local partial density of states (LPDOS), and the La spectra are due to quasi-atomic local $4f$ excitations. Calculations show that Pt $d$-LPDOS dominates the occupied states, and a sharp localized La $f$ state is found in the unoccupied states, in line with the observations.
- Published
- 2022