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In multiple Compton scattering, the incident gamma photon is scattered more than once due to finite dimensions of the sample. It serves as a noise for the exact evaluation of electron momentum distribution in Compton profile, Compton cross section and non-destructive testing of in-assessable large samples. To overcome these difficulties, there is a need to characterise the contribution of multiple scattering as a function of atomic number, scattering angle and incident gamma photon energy. In the present work, measurements are carried out to investigate the multiple scattering of 662 keV photons with tin sample of different thickness in the forward and backward hemispheres. The scattered photon flux is recorded by a NaI(Tl) scintillation detector and with an HPGe solid-state detector to check for the trend of saturation thickness as a function of resolution of the detector. The number of multiply scattered photons is found to be increasing with the sample thickness up to a particular thickness value called saturation thickness beyond which it remains constant with increase in target thickness. The effect of detector collimator size on multiply scattered photons is also studied. Both the detectors show the same trend of saturation thickness as a function of thickness. Angular distribution of multiply scattered photons shows symmetry around 90° scattering angle. The low energy side of multiple scattered photon spectrums is also characterised as a function of sample thickness and order of scattering. Monte Carlo calculations support the present experimental results. [ABSTRACT FROM AUTHOR]

The angular distribution of multiple Compton scatterings from BGO and LYSO single crystal scintillators was studied at various scattering angles. Gamma photons with 662 keV energy, acquired from a 137Cs source, were used. The scattered photons were detected by a 51mm × 51mm NaI(Tl) scintillation detector. The overall energy correlated to the total number of scattered incidents was analytically reconstructed. The research found that the multiply scattered incidents had the same energy as received from the singly scattered distribution, as the attribution of multiply scattered incidents near the 90° scattering angle revealed. The research results were in agreement with the theoretical calculations.

The angular distribution of multiple Compton scatterings from BGO and LYSO single crystal scintillators was studied at various scattering angles. Gamma photons with 662 keV energy, acquired from a 137Cs source, were used. The scattered photons were detected by a 51mm × 51mm NaI(Tl) scintillation detector. The overall energy correlated to the total number of scattered incidents was analytically reconstructed. The research found that the multiply scattered incidents had the same energy as received from the singly scattered distribution, as the attribution of multiply scattered incidents near the 90° scattering angle revealed. The research results were in agreement with the theoretical calculations. [ABSTRACT FROM AUTHOR]

In this paper, multiple scattering of 137 Cs gamma photons from composite materials is studied experimentally. Photons scattered in backward direction of 90° to the incident beam are detected by a NaI (Tl) detector. Single scattered events are reconstructed analytically to extract multiple scattered photons from the measured spectrum. We observe that for an increase in target thickness, there is an increase in multiple backscattered photons. After a particular thickness called as saturation thickness, multiple backscattered photons becomes almost a constant. The saturation thickness of the multiple scattered photons is used to assign effective atomic number for HDPE, UHMW, Nylon, Bakelite, Glass-epoxy, local wood ( Hopea parviflora ) and Portland Cement (grade 43). Experimental results are compared with Monte Carlo simulation. The ratio of single scattering events to multiple scattering events decreases for an increase in target thickness. [ABSTRACT FROM AUTHOR]

Saturation thickness for multiple scattering gamma rays from multiple sources has been measured experimentally and simulated using the Monte Carlo N-Particle (MCNP) Code. Experimental measurements were performed using a collimated beam of gamma-rays from Co, Hg, Ba, Na, Cs, Zn and Co sources. The gamma rays were directed at rectangular aluminium targets of varying thickness. A NaI (Tl) scintillation detector placed at a backscattering angle of 180° was used to detect the scattered photons. The measured and calculated saturation thickness increases with increasing energy of incident gamma-rays. Experimental and simulated values are compared and are in good agreement. [ABSTRACT FROM AUTHOR]

Abstract: Multiple back-scattering of gamma photons from carbon and aluminium targets is studied with a view to estimate energy dependence on saturation thickness. The number of multiple backscattered photons increases with an increase in the target thickness and then saturates at a particular thickness called the saturation thickness. An intense collimated beam, obtained from 241Am, 57Co, 203Hg, 133Ba, 22Na, 137Cs, 65Zn and 60Co sources, is allowed to impinge on rectangular carbon and aluminium targets of varying thickness. The scattered photons from the samples are detected by a 76mm×76mm NaI (Tl) scintillation detector placed at a backscattering angle of 135°. The measured saturation thickness for multiple backscattering of gamma photons is found to be increasing with an increase in the energy of incident gamma photons. The experimental results are compared with Monte Carlo calculations carried out using the Monte Carlo N-Particle (MCNP) simulation code. [Copyright &y& Elsevier]

In this paper the energy, intensity and angular distributions of multiple scattering of 662 keV gamma photons, emerging from targets of aluminium, copper, iron and glass samples are studied as a function of target thickness. An intense collimated beam obtained from a Cs source of 5.8 mCi is allowed to impinge on samples of varying thickness. The scattered photons are detected by a properly shielded 76 mm × 76 mm NaI (Tl) scintillation detector. In Compton scattering experiments, it is observed that the number of multiple backscattered photons increase with an increase in target thickness and become almost constant for particular target thickness called saturation thickness. The saturation thickness decreases with increasing atomic number. The multiple scattering, an interfering background noise in Compton profile, has been successfully used to assign effective atomic number (Z) to composite materials. The experimental results are compared with the Monte Carlo calculations using Monte Carlo nuclear particle code. [ABSTRACT FROM AUTHOR]

Abstract: The gamma photons continue to soften in energy as the number of scatterings increases in the target having finite dimensions both in depth and lateral dimensions. The number of multiply scattered photons increases with an increase in target thickness, and saturates at a particular value of the target thickness known as saturation thickness (depth). The present measurements are carried out to study the energy dependence of saturation thickness of multiply scattered gamma photons from targets of various thicknesses. The scattered photons are detected by a properly shielded NaI(Tl) gamma ray detector placed at 90° to the incident beam. We observe that the saturation thickness increases with increasing incident gamma photon energy. Monte Carlo calculations based upon the package developed by Bauer and Pattison [Compton scattering experiments at the HMI (1981), HMI-B 364, pp. 1–106] support the present experimental results. [Copyright &y& Elsevier]

Abstract: The energy, intensity and angular distributions of multiple scattering of 662keV gamma photons, emerging from targets of pure elements and binary alloys, are observed as a function of target thickness in reflection and transmission geometries. The observed spectra recorded by a properly shielded NaI (Tl) scintillation detector, in addition to singly scattered events, consist of photons scattered more than once for thick targets. To extract the contribution of multiply scattered photons from the measured spectra, a singly scattered distribution is reconstructed analytically. We observe that the numbers of multiply scattered events increase with increase in target thickness, and saturate for a particular thickness called saturation thickness. The saturation thickness decreases with increasing atomic number. The multiple scattering, an interfering background noise in Compton profiles and Compton cross-section measurements, has been successfully used as a new technique to assign the “effective atomic number” to binary alloys. Monte Carlo calculations support the present experimental results. [Copyright &y& Elsevier]

An inverse response matrix converts the observed pulse-height distribution of a NaI(Tl) scintillation detector to a true photon spectrum. This also results in extraction of intensity and energy distributions of multiply scattered events originating from interactions of 279 keV photons with thick targets of bronze. The observed pulse-height distributions are a composite of singly and multiply scattered events in addition to bremmstrahlung originating from slowing down of Compton and photo-electrons in thick targets. To evaluate the contribution of multiply scattered events, the spectrum of singly scattered events contributing to inelastic Compton peak is reconstructed analytically. The optimum thickness (saturation depth), at which the number of multiply scattered events saturate, has been evaluated in different energy bin meshes chosen for scintillation detector response unfolding. Monte Carlo calculations based upon the package developed by Bauer and Pattison (Compton scattering experiments at the HMI (1981), HMI-B 364, pp. 1-106) supports the present experimental results. [ABSTRACT FROM AUTHOR]

Abstract: An inverse response matrix converts the observed pulse-height distribution of a NaI(Tl) scintillation detector to a photon spectrum. This also results in extraction of intensity distribution of multiply scattered events originating from interactions of 0.279MeV photons with thick targets of soldering material. The observed pulse-height distributions are a composite of singly and multiply scattered events in addition to bremmstrahlung-and Rayleigh-scattered events. To evaluate the contribution of multiply scattered events, the spectrum of singly scattered events contributing to inelastic Compton peak is reconstructed analytically. The optimum thickness (saturation depth), at which the number of multiply scattered events saturates, has been measured. Monte Carlo calculations also support the present results. [Copyright &y& Elsevier]

Abstract: The gamma photons continue to soften in energy as the number of scatterings increases in the sample having finite dimensions both in depth and lateral dimensions. The number of multiply scattered photons increases with an increase in target thickness and saturates at a particular value of the target thickness known as saturation depth. The present experiment is undertaken to study the effect of atomic number of the target on saturation depth of 0.662MeV incident gamma photons multiply scattered from targets of various thicknesses. The scattered photons are detected by an HPGe gamma detector placed at 90° to the incident beam direction. We observe that with an increase in target thickness, the number of multiply scattered photons also increases and saturates at a particular value of the target thickness. The saturation depth decreases with increasing atomic number. The double Compton scattered peak is also observed in the experimental spectra. [Copyright &y& Elsevier]