Search

Your search keyword '"Molva, E."' showing total 124 results
Start Over Author "Molva, E."
124 results on '"Molva, E."'

4. Growth, structural, and optical properties of II-VI layers: (001) CdMnTe grown by molecular-beam epitaxy

Author

Bodin, C., Cibert, J., Grieshaber, W., Dang, Le Si, Marcenat, F., Wasiela, A., Jouneau, P.H., Feuillet, G., Herve, D., and Molva, E.

Subjects
Thin films -- Research, Molecular beams -- Research, Epitaxy -- Research, Physics
Abstract

The growth of CdMnTe epilayers is described with emphasis on the misfit strain relaxation and the effect of this strain on the quality and structure of the epilayers. The description is obtained by using transmission electron microscopy, cathodoluminescence imaging and X-ray diffraction methods. The description reveals the correlation between the structural and optical properties of the elastically relaxed layers.

Published
1995

5. List of contributors

Author

Accomo, R., primary, Achtziger, N., additional, Adams, S.J.A., additional, Akasaki, I., additional, Albert, J.P., additional, Amano, H., additional, André, R., additional, Antonelli, A., additional, Asif Khan, M., additional, Aulombard, R.L., additional, Austin, R.F., additional, Balestrino, G., additional, Baltramiejūnas, R., additional, Bechstedt, F., additional, Bécourt, N., additional, Bergman, L., additional, Bernholc, J., additional, Bertho, D., additional, Bertoni, CM., additional, Billat, S., additional, Boćkowski, M., additional, Bodin, C., additional, Bodin-Deshayes, C., additional, Boiko, E.B., additional, Boring, P., additional, Bouhelal, A., additional, Bratina, G., additional, Brennan, K.F., additional, Briddon, P.R., additional, Briot, O., additional, Broser, I., additional, Bsiesy, A., additional, Bucher, E., additional, Burchard, A., additional, Cantwell, G., additional, Carter, C.H., additional, Castro, T., additional, Cavenett, B.C., additional, Chadi, D.J., additional, Chen, K.M., additional, Chen, X., additional, Cheng, H., additional, Choyke, W.J., additional, Christensen, N.E., additional, Cibert, J., additional, Cingolani, R., additional, Cloitre, T., additional, Cohen, P.I., additional, Collins, A.T., additional, Cotal, H.L., additional, Cricenti, A., additional, Dabbicco, M., additional, Dang, L.S., additional, Davis, R.F., additional, Deicher, M., additional, DePuydt, J.M., additional, Dischler, B., additional, Dmitriev, V.A., additional, Donegan, J.F., additional, Doran, J.P., additional, Dubowski, J.J., additional, Eckey, L., additional, Edmond, J.A., additional, Efros, A.L., additional, Egan, R.J., additional, Engelbrecht, F., additional, Evstropov, W., additional, Fanciulli, M., additional, Feldman, R.D., additional, Felici, A.C., additional, Ferrara, M., additional, Ferrari, L., additional, Ferry, D.K., additional, Feuillet, G., additional, Fiedler, M., additional, Finocchi, F., additional, Fischer, R., additional, Fishman, G., additional, Franciosi, A., additional, Fricke, Ch., additional, Frolov, S.I., additional, Fuchs, D., additional, Galli, G., additional, Gaponenko, S.V., additional, Gaspard, F., additional, Gavrilenko, V.I., additional, Gavryushin, V., additional, Gebhardt, W., additional, Germanenko, I.N., additional, Geurts, J., additional, Geyzers, K.P., additional, Gil, B., additional, Gladfelter, W., additional, Gleitsman, G., additional, Göbel, E.O., additional, Godet, C., additional, Goede, O., additional, Gorczyca, I., additional, Gribkovskii, V.P., additional, Grzegory, I., additional, Gumlich, H.-E., additional, Gunshor, R.L., additional, Gurskii, A.L., additional, Gutowski, J., additional, Gygi, F., additional, Haase, M.A., additional, Haberstroh, C, additional, Harsch, W.C., additional, Hauksson, I., additional, Hayashi, S., additional, Hegarty, J., additional, Heimbrodt, W., additional, Heime, K., additional, Heine, V., additional, Heitz, R., additional, Helbig, R., additional, Henderson, B., additional, Henneberger, F., additional, Hérino, R., additional, Hermans, J., additional, Heuken, M., additional, Hoffmann, A., additional, Hoffmann, H., additional, Hoffmann, N., additional, Hofsäss, H., additional, Humphreys, T.P., additional, Hunt, R.W., additional, Iarlori, S., additional, Iida, S., additional, Ikoma, K., additional, Itie, J.P., additional, Jacobs, K., additional, Jahn, S.G., additional, Jancu, J.M., additional, Jaussaud, C., additional, Jentzsch, T., additional, Johnson, R.L., additional, Jones, R., additional, Jouanin, C., additional, Jouneau, P.H., additional, Jun, J., additional, Jungnickel, V., additional, Juodžbalis, D., additional, Kajihara, S.A., additional, Kanicki, J., additional, Karmann, S., additional, Katayama-Yoshida, H., additional, Kawakami, Y., additional, Kazlauskas, A., additional, Kean, A., additional, Khan, M.R.H., additional, King-Smith, R.D., additional, Kinto, H., additional, Kißmann, U., additional, Klimakow, A., additional, Klyui, N.I., additional, Koide, N., additional, Koidl, P., additional, Kong, H.-S., additional, Kong, H.S., additional, König, Th., additional, Kono, J., additional, Kononenko, V.K., additional, Kotaki, M., additional, Kreß, C., additional, Krings, T., additional, Krukowski, St., additional, Kubertavicius, V., additional, Kudlek, G.H., additional, Kuhn, W., additional, Kunc, K., additional, Kuroda, Y., additional, Kuznia, J.N., additional, Kwak, K.W., additional, Labrunie, G., additional, Laks, D.B., additional, Lambrecht, W.R.L., additional, Lankes, S., additional, Lebed, V. Yu., additional, Lei, T., additional, Leibenzeder, S., additional, Lepore, M., additional, Licht, T., additional, Ligeon, M., additional, Linkov, I. Yu., additional, Litwin-Staszewska, E., additional, Logothetidis, S., additional, Luce, G., additional, Lutsenko, E.V., additional, Lux-Steiner, M. Ch., additional, Madéore, F., additional, Magerle, R., additional, Mahnke, H.-E., additional, Maier, K., additional, Malinovskii, I.E., additional, Manabe, K., additional, Marinelli, M., additional, Markey, B.G., additional, Markwitz, A., additional, Marshall, T., additional, Mathieu, H., additional, Matsunami, H., additional, McCaldin, J.O., additional, McGill, T.C., additional, McKeever, S.W.S., additional, Meier, J., additional, Mihalcescu, I., additional, Milani, E., additional, Mitcovets, A.I., additional, Mitsuyu, T., additional, Miura, N., additional, Molnar, R.J., additional, Molva, E., additional, Morohashi, M., additional, Morozenko, Ya.V., additional, Moustakas, T.D., additional, Mujica, A., additional, Mula, G., additional, Muller, F., additional, Müller-Sebert, W., additional, Muñoz, A., additional, Mura, A., additional, Naumov, A., additional, Needs, R.J., additional, Nemanich, R.J., additional, Nicolini, R., additional, Nurmikko, A.V, additional, O'Donnell, K.P., additional, Oguchi, T., additional, Ohkawa, K., additional, Okamoto, S., additional, Okazaki, N., additional, Okumura, H., additional, Osman, M.A., additional, Palmour, J.W., additional, Paloura, E.C., additional, Palummo, M., additional, Paoletti, A., additional, Papon, A.M., additional, Paroli, P., additional, Parrinello, M., additional, Pensl, G., additional, Pereira, E., additional, Perlin, P., additional, Petalas, J., additional, Pfeiffer, W., additional, Phillips, M.C., additional, Pikus, F.G, additional, Pinter, I., additional, Pirzer, M., additional, Pohl, U., additional, Pohl, U.W., additional, Polatoglou, H.M., additional, Polian, A., additional, Polini, R., additional, Ponga, B.E., additional, Ponthenier, J.L., additional, Porowski, S., additional, Prins, J.F., additional, Prior, K.A., additional, Puls, J., additional, Qiu, J., additional, Qteish, A., additional, Raciukaitis, G., additional, Reining, L., additional, Reisinger, T., additional, Restle, M., additional, Righini, M., additional, Rodríguez-Hernández, P., additional, Rolfe, S.J., additional, Romestain, R., additional, Ryzhikov, VD., additional, Sailer, B., additional, Sander, D., additional, Santos, L., additional, Sasaki, T., additional, Sawada, M., additional, Scamarcio, G., additional, Scarselli, M.A., additional, Schadt, M., additional, Schneider, A., additional, Schneider, J., additional, Schöner, A., additional, Schülzgen, A., additional, Selci, S., additional, Shinohara, M., additional, Simpson, J., additional, Sorba, L., additional, Spellmeyer, B., additional, Stanley, R.P., additional, Stanzl, H., additional, Stein, R.A., additional, Stewart, H., additional, Suemune, I., additional, Sulzer, G., additional, Suski, T., additional, Suttrop, W., additional, Swenberg, J.F., additional, Taghizadeh, M.R., additional, Takeyama, S., additional, Tansley, T.L., additional, Tebano, A., additional, Thurian, P., additional, Tosatti, E., additional, Trager-Cowan, C., additional, Troullier, N., additional, Tschentscher, I., additional, Tsuboi, N., additional, Tsujimura, A., additional, Tsukioka, K., additional, Tupenevich, P.A., additional, Turner, K.F., additional, Uchiki, H., additional, Uhrmacher, M., additional, Ullrich, B., additional, Uttamchandani, D., additional, Van de Walle, C.G., additional, van der Weide, J., additional, Van Hove, J.M., additional, Vanderbilt, D., additional, Vanzetti, L., additional, Vasileska, D., additional, Vial, J.C., additional, Wagner, H.P., additional, Wahl, U., additional, Waldmann, H., additional, Walker, CT., additional, Wang, E.G., additional, Wang, M.W., additional, Wang, S.Y., additional, Wang, Y., additional, Weinhold, V., additional, Wiehert, T., additional, Wild, C., additional, Witthuhn, W., additional, Wolf, H., additional, Wolf, K., additional, Wörz, M., additional, Yablonskii, G.P., additional, Yagi, M., additional, Yamaga, S., additional, Yamanaka, M., additional, Yang, F., additional, Yoshii, S., additional, Yoshikawa, A., additional, Yu, X., additional, Zeitz, W., additional, and Zimin, L.G., additional

Published
1993
Full Text
View/download PDF

18. Degradation of microgun-pumped blue lasers

Author

Hervé, D., primary, Bonard, J.M., additional, Vanzetti, L., additional, Paggel, J.J., additional, Sorba, L., additional, Ganière, J.D., additional, Molva, E., additional, and Franciosi, A., additional

Published
1996
Full Text
View/download PDF

20. Microgun‐pumped blue lasers

Author

Hervé, D., primary, Accomo, R., additional, Molva, E., additional, Vanzetti, L., additional, Paggel, J. J., additional, Sorba, L., additional, and Franciosi, A., additional

Published
1995
Full Text
View/download PDF

33. Effects of pump fluctuations on intensity noise of Nd:YVO<FORMULA FORM="INLINE">$\mathsf{_{4}}$</FORMULA> microchip lasers

Author

Bramati, A., Hermier, J.P., Jost, V., Giacobino, E., Fulbert, L., Molva, E., and Aubert, J.J.

Abstract

The principle of pump noise suppression is applied to a Nd:YVO4 microchip laser, optically pumped by laser diodes. The noise of the microchip laser at low frequency (below the relaxation oscillation frequency) is compared for noisy and amplitude squeezed laser diodes. The minimum intensity noise of the microchip laser is 7 dB above SNL at a frequency of 40 kHz. Very good agreement between experimental results and theoretical predictions of a model based on quantum Langevin equations is found.

Published
1999
Full Text
View/download PDF

35. Spectral resolution in low temperature cathodoluminescence. Application to CdTe

Author

Chamonal, J.P., Molva, E., Dupuy, M., Accomo, R., and Pautrat, J.L.

Abstract

Spectrally resolved cathodoluminescence (CL) studies made on Li and Cu doped CdTe are reported. The CL was performed in a scanning electron microscope (SEM), at low temperature (10 K). High resolution spectral analysis of the SEM-CL pictures revealed the inhomogeneous distribution of the impurities into the crystal. A preferential diffusion of Li and Cu along the crystal defects is observed. Some black dots in Cu diffused CdTe, have been related to Cu complexes due to a supersaturation. This work illustrates the interest of coupling SEM and photoluminescence studies for semiconductor characterization.

Published
1983
Full Text
View/download PDF

38. Indium exodiffusion in annealed GaAs:In crystals.

Author

Krawczyk, S. K., Khoukh, A., Olier, R., Chabli, A., and Molva, E.

Subjects
INDIUM, GALLIUM arsenide, CRYSTALS
Abstract

In this work, we report on the effect of annealing on the distribution of indium in the surface region of In-alloyed GaAs crystals. Auger, secondary ion mass spectroscopy, and photoluminescence were used as the analytical tools. It is shown that In migrates and piles up over a depth of several tens or a few hundreds of angstroms from the surface leaving behind an In-depleted region. The In redistribution results in modifications of the band gap in the surface region of annealed GaAs:In substrates; these modifications take place even at temperatures as low as 400 °C. [ABSTRACT FROM AUTHOR]

Published
1986
Full Text
View/download PDF

39. Degradation and defects in electron-beam-pumped Zn1-xCdxSe/ZnSe GRINSCH blue-green lasers

Author

Bonard, J. M., Herve, D., Ganiere, J. D., Vanzetti, L., Paggel, J. J., Sorba, L., Molva, E., and Franciosi, A.

Abstract

We explore the defect distribution and the degradation in electron beam pumped Zn1-xCdxSe/ZnSe laser structures by combining cathodoluminescence measurements in a scanning electron microscope with transmission electron microscopy. We found that degradation occurs via the formation of [100]-oriented dark line defects, and that it involves the formation of a characteristic type of defect, namely dislocation loops within the ZnCdSe quantum well, which grow to form a characteristic network as degradation processes.

42. Degradation defects in electron-beam-pumped Zn1-xCdxSe/ZnSe graded-index separate-confinement heterostructure (GRINSCH) blue and blue-green lasers

Author

Bonard, J. M., Ganiere, J. D., Vanzetti, L., Paggel, J. J., Sorba, L., Franciosi, A., Herve, D., and Molva, E.

Subjects
DARK LINE DEFECTS, GAALAS-GAAS LASERS, LIGHT EMITTERS, MICROSCOPY, DIODE
Abstract

Degradation defects induced by electron-beam bombardment in Zn1-xCdxSe/ZnSe (001) graded-index separate-confinement blue-green laser structures have been characterized by transmission electron microscopy. Most defects appear as tree-like arrangements of small extrinsic and intrinsic dislocation loops opening in +/-[100] or +/-[010] directions and are located within the quantum well or at its boundaries. The Burgers vectors of the loops were identified as b = 1/2[01(1) over bar] and b = 1/2[10(1) over bar] for defects opening in the +/-[100] and +/-[010] directions respectively.

43. Degradation of electron-beam-pumped Zn1-xCdxSe/ZnSe GRINSCH blue-green lasers

Author

Bonard, J. M., Ganiere, J. D., Herve, D., Vanzetti, L., Paggel, J. J., Sorba, L., Molva, E., and Franciosi, A.

Subjects
LIGHT EMITTERS
Abstract

We explored the degradation in electron beam pumped Zn1-xCdxSe/ZnSe laser structures by combining cathodoluminescence measurements in a scanning electron microscope with transmission electron microscopy. We found that degradation occurred via the formation of dark spot and dark line defects, and that it involved the formation of a characteristic type of defect, namely dislocation loops within the ZnCdSe quantum well, which grew to form a characteristic network as degradation progressed.

44. Cathodoluminescence and transmission electron microscopy investigation of ZnCdSe/ZnSe electron-beam-pumped laser structures

Author

Bonard, J. M., Ganiere, J. D., Vanzetti, L., Sorba, L., Franciosi, A., Herve, D., and Molva, E.

Abstract

We present results obtained both with scanning electron microscopy (SEM) in the cathodoluminescence (CL) mode and transmission electron microscopy (TEM) on ZnCdSe/ZnSe electron-beam-pumped laser structures. This investigation aims at establishing a relationship between different parameters measurable in electron microscopy and the lasing activity of the structures.

Catalog

Books, media, physical & digital resources
See catalog results