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In this paper, tungsten oxide thin films were synthesized successfully by the laser pulse deposition (PLD) method using a pulsed laser (ND-YAG) and wavelength (1064 nm) on a glass substrate at different laser fluencies. The effect of increasing laser fluency on the optical and structural properties of WO3 nanoparticle thin films were investigated by UV-Visible spectrophotometer, X-Ray diffraction (XRD), atomic force microscope (AFM) and Scanning Electron Microscope (SEM). X-Ray measurements for all samples of WO3 NPs thin films have shown that by increasing the laser fluencies from 5.175 to 6.369 J/cm², the intensity of the (2 01) diffraction peak increases due to the film continuing to grow with increased crystallization. [ABSTRACT FROM AUTHOR]

ZnTe nanoparticles thin films were prepared at different substrate temperature (325, 425,525,625K) on a glass substrate by using Pulsed Laser deposition technique (PLD) under vacuum about 10-5 Torr. The NdYag Q-Switch laser with wave length (1064 nm), frequency (5 Hz), and fluency (0.477 J / cm2 ) were employed to deposit ZnTe thin films. The as deposited of ZnTe nanoparticles thin films were investigated by X-ray diffraction (XRD), Scanning electron microscopy (SEM), Electron dispersion X-ray (EDX), Atomic force microscopy (AFM) and UV-VIS Spectrophotometer. XRD investigations confirmed the increasing in the crystallite size about (42.64, 44.02, 82.66 and 86.64nm) with increase substrate temperature in the range (325K, 425K, 525K and 625K), respectively. [ABSTRACT FROM AUTHOR]

We reported in this work the growth of ZnSe nanoparticles thin films deposited on glass substrates were synthesized by a pulsed laser deposition (PLD) method. The as obtained films were characterized by X-ray diffraction (XRD), Scanning electron microscopy (SEM), Transmission electron microscopy (TEM), UV-VIS Spectrophotometer, and Photoluminescence (PL) spectra. X-ray diffraction study confirmed the transformation the cubic phase of ZnSe nanoparticles into hexagonal phase by increase the laser fluence from (4.77-5.97) J/cm2. The particle size variations were achieved by varying the laser fluence of prepared films. XRD studies and TEM images confirmed the nanometer size was found to lie in the range of 12-80 nm. A UV-VIS study was carried out to measure the band gap of the ZnSe nanoparicles thin films and it showed a blue shift with respect to the bulk value. The PL spectra at room temperature (300K) of the films showed the decrease of maximum values at at 522 nm( 2.379), 521 nm (2.3838) and 520 nm (2.3882 eV) for the laser fluences (4.77, 5.57 and 5.97 J/cm2), respectively. We assigned the variation due a larger number of non-radiative recombination centers appears in the films. [ABSTRACT FROM AUTHOR]