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In this paper, the Tl1-xHgxSr2Ca2Cu3O8+δ compound with X=(0.0, 0.1, 0.2, 0.3 and 0.4) was prepared by using the method of solid-state. The electrical resistivity was studied using the four probes technique to find the transition temperature at zero resistance Tc(off) and at translation Tc(on). Tc (off) and Tc (on) increased from 103 to 133 K and 112 to 135 K with an increase in mercury concentration from 0 to 0.4, respectively. The sample crystal structure was studied using an X-ray diffraction device. The X-ray diffraction (XRD) study of the crystalline nature confirmed that the sample of the compound has a lattice structure of a mixture of different phases, it has a tetragonal. The traditional Debye-Scherrer method and the methods modified for it were calculated and investigated from the crystal size. It is noted the approximate values of crystal size and crystallinity in percentage between the two modified Scherer methods and the traditional Scherer method change depending on the intensity picks of the XRD diagram. Furthermore, the sample was taken into account to determine the physical and microstructure factors such as strain. [ABSTRACT FROM AUTHOR]