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Your search keyword '"Mercère, Pascal"' showing total 29 results
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29 results on '"Mercère, Pascal"'

1. Characterization of the focal plane of the microchannel X-ray telescope at the metrology beamline of SOLEIL synchrotron for the space astronomy mission SVOM

Author

Meuris, Aline, Schneider, Benjamin, Allaire, Hugo, Baudin, David, Cojocari, Ion, Da Silva, Paulo, Doumayrou, Eric, Götz, Diego, Ferrando, Philippe, Laurent, Philippe, Lortholary, Michel, Mercère, Pascal, Pinsard, Frédéric, Prieur, Marin, Pichon, Thibault, Provost, Léna, Renaud, Diana, Renault-Tinacci, Nicolas, Tollet, Timothée, and Visticot, François

Published
2023
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6. Backside-illuminated scientific CMOS detector for soft X-ray resonant scattering and ptychography

Author

Desjardins, Kewin, primary, Medjoubi, Kadda, additional, Sacchi, Maurizio, additional, Popescu, Horia, additional, Gaudemer, Roland, additional, Belkhou, Rachid, additional, Stanescu, Stefan, additional, Swaraj, Sufal, additional, Besson, Adrien, additional, Vijayakumar, Jaianth, additional, Pautard, Stéphanie, additional, Noureddine, Arafat, additional, Mercère, Pascal, additional, Da Silva, Paulo, additional, Orsini, Fabienne, additional, Menneglier, Claude, additional, and Jaouen, Nicolas, additional

Published
2020
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9. Characterization of a back-illuminated CMOS Camera for soft x-ray coherent scattering.

Author

Desjardins, Kewin, Popescu, Horia, Mercère, Pascal, Menneglier, Claude, Gaudemer, Roland, Thånell, Karina, and Jaouen, Nicolas

Subjects
COMPLEMENTARY metal oxide semiconductors, CAMERAS, SOFT X rays, X-ray scattering, QUANTUM efficiency
Abstract

A commercial scientific camera has been adapted and characterized at the SOLEIL Synchrotron with the aim to improve the acquisition capabilities on the soft X-ray coherent scattering experimental station at SEXTANTS beamline. This device is equipped by the last generation of back side illuminated scientific CMOS (BSI-sCMOS) of 2048 by 2048 pixels of 11 μm² able to acquire low noise images with a frame rate up to 48 Hz. The camera’s performance measurements have been done and shows a good level of readout noise, a large full-well capacity, a medium dark current and a good homogeneity, respectively, 1.6 e- rms (in High Gain mode), 80 000 e- (in Low Gain mode), < 5 e-/pixel/s and ∼ 1%. The quantum efficiency (QE) measurement has been performed at the soft x-ray branch of the METROLOGIE beamline and gives a relatively good agreement with the expected theoretical values. Finally, the demonstration of the camera’s efficiency and of the gain in useful time measurement related to the high frame rate have been performed with a series of Airy patterns images compared with an image recorded using the standard BSI-CDD already in operation at the SEXTANTS beamline. [ABSTRACT FROM AUTHOR]

Published
2018
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26. Hartmann wave-front measurement at 134 nm with λ_EUV/120 accuracy

Author

Mercère, Pascal, primary, Zeitoun, Philippe, additional, Idir, Mourad, additional, Le Pape, Sébastien, additional, Douillet, Denis, additional, Levecq, Xavier, additional, Dovillaire, Guillaume, additional, Bucourt, Samuel, additional, Goldberg, Kenneth A., additional, Naulleau, Patrick P., additional, and Rekawa, Senajith, additional

Published
2003
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28. Optimization of Cr/Sc-based multilayer mirrors for water window soft x-rays.

Author

Meltchakov E, Capitanio B, de Rossi S, Papagiannouli I, Mercère P, and Delmotte F

Abstract

The development of efficient multilayer mirrors for the water window (a spectral region between absorption edges of carbon and oxygen, from 284 to 543 eV) remains a challenge. As the best candidate, the Cr/Sc multilayer provides maximum theoretical reflectivity of about 60% at near-normal incidence around the Sc L 2,3 absorption edge (397 eV). However, the maximum measured peak reflectance published so far just slightly exceeds 20%. We report on a new (to the best of our knowledge) approach to design more efficient Cr/Sc-based multilayer coatings using the process of nitridation of chromium during deposition and adding boron carbide as a third material in the multilayer structure. We discuss our strategy of optimization of the CrN/B 4 C/Sc multilayer system based on experimental studies. The peak reflectance as high as 32% at 396 eV was measured with this type of coating, which is of main interest for various water window applications such as x-ray microscopy.

Published
2024
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29. Hartmann wave-front measurement at 13.4 nm with lambdaEUV/120 accuracy.

Author

Mercère P, Zeitoun P, Idir M, Le Pape S, Douillet D, Levecq X, Dovillaire G, Bucourt S, Goldberg KA, Naulleau PP, and Rekawa S

Abstract

We report, for the first time to our knowledge, experimental demonstration of wave-front analysis via the Hartmann technique in the extreme ultraviolet range. The reference wave front needed to calibrate the sensor was generated by spatially filtering a focused undulator beam with 1.7- and 0.6-microm-diameter pinholes. To fully characterize the sensor, accuracy and sensitivity measurements were performed. The incident beam's wavelength was varied from 7 to 25 nm. Measurements of accuracy better than lambdaEUV/120 (0.11 nm) were obtained at lambdaEUV = 13.4 nm. The aberrations introduced by an additional thin mirror, as well as wave front of the spatially unfiltered incident beam, were also measured.

Published
2003
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