286 results on '"Menyhard, M"'
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2. Scratching resistance of SiC-rich nano-coatings produced by noble gas ion mixing
3. Anomalous nanoscale diffusion in Pt/Ti: superdiffusive intermixing
4. Novel method for the production of SiC micro and nanopatterns
5. L\'evy-flight intermixing: anomalous nanoscale diffusion in Pt/Ti
6. Asymmetric intermixing in Pt/Ti
7. Fingerprint of super-interdiffusion: anomalous intermixing in Pt/Ti
8. Intermixing in Cu/Co: molecular dynamics simulations and Auger electron spectroscopy depth profiling
9. Simulated ion-sputtering and Auger electron spectroscopy depth profiling study of intermixing in Cu/Co
10. Interface-anisotropy induced asymmetry of intermixing in bilayers
11. Optical properties and excitation energies of iridium derived from reflection electron energy loss spectroscopy spectra
12. Strong mass effect on ion beam mixing in metal bilayers
13. What is the real driving force of ion beam mixing?
14. Cooperative mixing induced surface roughening in bilayer metals: a possible novel surface damage mechanism
15. Does the thermal spike affect low-energy ion-induced interfacial mixing?
16. Wafer-scale SiC rich nano-coating layer by Ar+ and Xe+ ion mixing
17. Determination of the thickness distribution of a graphene layer grown on a 2″ SiC wafer by means of Auger electron spectroscopy depth profiling
18. Texture change of TiN films due to anisotropic incorporation of oxygen
19. Structural, mechanical and biological comparison of TiC and TiCN nanocomposites films
20. Design and production of tungsten-carbide rich coating layers
21. Passivation of GaAs(001) surface by the growth of high quality c-GaN ultra-thin film using low power glow discharge nitrogen plasma source
22. In-depth distribution of ion beam damage in SiC
23. Design and production of tungsten-carbide rich coating layers
24. Evaluation of AES depth profiles with serious artefacts in C/W multilayers
25. The inelastic mean free path of electrons. Past and present research
26. Determination of relative sputtering yield of Cr/Si
27. Stability of ZnO{0 0 0 1} against low energy ion bombardment
28. Unexpectedly high sputtering yield of carbon at grazing angle off incidence ion bombardment
29. Determination of the surface excitation correction in elastic peak electron spectroscopy for selected conducting polymers
30. Electron stimulated thorium adatom enrichment on the surface of thoriated tungsten below 2300 K
31. Surface excitation correction of the inelastic mean free path in selected conducting polymers
32. Determination of the thickness and density of the ion bombardment induced altered layer in SiC by means of reflection electron energy loss study
33. Ion bombardment induced interface broadening in Co/Cu system as a function of layer thickness
34. Cooperative mixing induced surface roughening in bilayer metals: a possible novel surface damage mechanism
35. Hydrogen and surface excitation in electron spectra of polyethylene
36. Experimental determination of electron inelastic scattering cross-sections in Si, Ge and III–V semiconductors
37. Determination of effective electron inelastic mean free paths in SiO 2 and Si 3N 4 using a Si reference
38. Recoil effect in carbon structures and polymers
39. Interdiffusion in amorphous Si/Ge multilayers by Auger depth profiling technique
40. Surface excitation effects in electron spectroscopy
41. Structural effects in the growth of giant magnetoresistance (GMR) spin valves
42. Recoil broadening of the elastic peak in electron spectroscopy
43. Demixing in spin valve structures: an Auger depth profiling study
44. Design of Corrosion Resistive SiC Nanolayers
45. High-depth-resolution Auger depth profiling/atomic mixing
46. TEM sample preparation by ion milling/amorphization
47. Experimental determination of the inelastic mean free path of electrons in GaSb and InSb
48. Determination of the transmission and correction of electron spectrometers, based on backscattering and elastic reflection of electrons
49. Asymmetric transient enhanced intermixing in Pt/Ti
50. Influence of layer microstructure in the double nucleation process in Cu/Mg multilayers
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