1. Improved medical waste plasma gasification modelling based on implicit knowledge-guided interpretable machine learning.
- Author
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Zhou, Jianzhao, Ren, Jingzheng, and He, Chang
- Subjects
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ARTIFICIAL neural networks , *MACHINE learning , *MEDICAL wastes , *STANDARD deviations , *MONTE Carlo method - Abstract
[Display omitted] • An Implicit knowledge-guided machine learning framework is proposed. • The effect is validated by modelling plasma gasification of medical waste. • RMSEs decrease by 36.44% and 2.58% for ANN and SVM. • Knowledge-based errors decrease by 83.22% and 100% for ANN and SVM. • All implicit knowledge-based monotonicity relationships are captured. Ensuring the interpretability of machine learning models in chemical engineering remains challenging due to inherent limitations and data quality issues, hindering their reliable application. In this study, a qualitatively implicit knowledge-guided machine learning framework is proposed to improve plasma gasification modelling. Starting with a pre-trained machine learning model, parameters are further optimized by integrating the heuristic algorithm to minimize the data fitting errors and resolving implicit monotonic inconsistencies. The latter is comprehensively quantified through Monte Carlo simulations. This framework is adaptive to different machine learning techniques, exemplified by artificial neural network (ANN) and support vector machine (SVM) in this study. Validated by a case study on plasma gasification, the results reveal that the improved models achieve better generalizability and scientific interpretability in predicting syngas quality. Specifically, for ANN, the root mean square error (RMSE) and knowledge-based error (KE) reduce by 36.44% and 83.22%, respectively, while SVM displays a decrease of 2.58% in RMSE and a remarkable 100% in KE. Importantly, the improved models successfully capture all desired implicit monotonicity relationships between syngas quality and feedstock characteristics/operating parameters, addressing a limitation that traditional machine learning struggles with. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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