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104 results on '"Maxion, Roy"'

1. Forensic Camera Identification: Effects of Off-Nominal Exposures

Author

Martin, Abby, Maxion, Roy, and Newman, Jennifer

Subjects
Electrical Engineering and Systems Science - Image and Video Processing
Abstract

Photo response non-uniformity (PRNU) is a technology that can match a digital photograph to the camera that took it. Due to its use in forensic investigations and use by forensic experts in court, it is important that error rates for this technology are reliable for a wide range of evidence image types. In particular, images with off-nominal exposures are not uncommon. This paper presents a preliminary investigation of the impact that images with different exposure types - too dark or too light - have on error rates for PRNU source camera identification. We construct a new dataset comprised of 8400 carefully collected images ranging from under-exposed (too dark) to nominally exposed to over-exposed (too bright). We first establish baseline error rates using only nominally exposed images, resulting in a true-positive rate of 100% and a true-negative rate of 99.92%. When off-nominal images are tested, we find striking results: the true-negative rate for under-exposed images is 99.46% (a false-positive rate of roughly one in two hundred, typically unacceptable in a forensic context), and for over-exposed images the true-positive rate falls to 82.90%. Our results highlight the importance of continued study of error rates for the PRNU source camera identification to assure adherence to the high standards set for admissibility of forensic evidence in court., Comment: This work has been submitted to the IEEE for possible publication. Copyright may be transferred without notice, after which this version may no longer be accessible

Published
2024

4. On User Interaction Behavior as Evidence for Computer Forensic Analysis

Author

Shen, Chao, Cai, Zhongmin, Maxion, Roy A., Guan, Xiaohong, Hutchison, David, Series editor, Kanade, Takeo, Series editor, Kittler, Josef, Series editor, Kleinberg, Jon M., Series editor, Kobsa, Alfred, Series editor, Mattern, Friedemann, Series editor, Mitchell, John C., Series editor, Naor, Moni, Series editor, Nierstrasz, Oscar, Series editor, Pandu Rangan, C., Series editor, Steffen, Bernhard, Series editor, Terzopoulos, Demetri, Series editor, Tygar, Doug, Series editor, Weikum, Gerhard, Series editor, Shi, Yun Qing, editor, Kim, Hyoung-Joong, editor, and Pérez-González, Fernando, editor

Published
2014
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5. A Study of the Consistency in Keystroke Dynamics

Author

Shen, Chao, Maxion, Roy A., Cai, Zhongmin, Hutchison, David, Serieseditor, Kanade, Takeo, Serieseditor, Kittler, Josef, Serieseditor, Kleinberg, Jon M., Serieseditor, Mattern, Friedemann, Serieseditor, Mitchell, John C., Serieseditor, Naor, Moni, Serieseditor, Nierstrasz, Oscar, Serieseditor, Pandu Rangan, C., Serieseditor, Steffen, Bernhard, Serieseditor, Sudan, Madhu, Serieseditor, Terzopoulos, Demetri, Serieseditor, Tygar, Doug, Serieseditor, Vardi, Moshe Y., Serieseditor, Weikum, Gerhard, Serieseditor, Sun, Zhenan, editor, Shan, Shiguan, editor, Yang, Gongping, editor, Zhou, Jie, editor, Wang, Yunhong, editor, and Yin, YiLong, editor

Published
2013
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6. Making Experiments Dependable

Author

Maxion, Roy, Hutchison, David, Series editor, Kanade, Takeo, Series editor, Kittler, Josef, Series editor, Kleinberg, Jon M., Series editor, Mattern, Friedemann, Series editor, Mitchell, John C., Series editor, Naor, Moni, Series editor, Nierstrasz, Oscar, Series editor, Pandu Rangan, C., Series editor, Steffen, Bernhard, Series editor, Sudan, Madhu, Series editor, Terzopoulos, Demetri, Series editor, Tygar, Doug, Series editor, Vardi, Moshe Y., Series editor, Weikum, Gerhard, Series editor, Jones, Cliff B., editor, and Lloyd, John L., editor

Published
2011
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7. Why Did My Detector Do That?! : Predicting Keystroke-Dynamics Error Rates

Author

Killourhy, Kevin, Maxion, Roy, Hutchison, David, editor, Kanade, Takeo, editor, Kittler, Josef, editor, Kleinberg, Jon M., editor, Mattern, Friedemann, editor, Mitchell, John C., editor, Naor, Moni, editor, Nierstrasz, Oscar, editor, Pandu Rangan, C., editor, Steffen, Bernhard, editor, Sudan, Madhu, editor, Terzopoulos, Demetri, editor, Tygar, Doug, editor, Vardi, Moshe Y., editor, Weikum, Gerhard, editor, Jha, Somesh, editor, Sommer, Robin, editor, and Kreibich, Christian, editor

Published
2010
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10. The Effect of Clock Resolution on Keystroke Dynamics

Author

Killourhy, Kevin, Maxion, Roy, Hutchison, David, editor, Kanade, Takeo, editor, Kittler, Josef, editor, Kleinberg, Jon M., editor, Mattern, Friedemann, editor, Mitchell, John C., editor, Naor, Moni, editor, Nierstrasz, Oscar, editor, Pandu Rangan, C., editor, Steffen, Bernhard, editor, Sudan, Madhu, editor, Terzopoulos, Demetri, editor, Tygar, Doug, editor, Vardi, Moshe Y., editor, Weikum, Gerhard, editor, Lippmann, Richard, editor, Kirda, Engin, editor, and Trachtenberg, Ari, editor

Published
2008
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11. Anomaly Detector Performance Evaluation Using a Parameterized Environment

Author

Hansen, Jeffery P., Tan, Kymie M. C., Maxion, Roy A., Hutchison, David, editor, Kanade, Takeo, editor, Kittler, Josef, editor, Kleinberg, Jon M., editor, Mattern, Friedemann, editor, Mitchell, John C., editor, Naor, Moni, editor, Nierstrasz, Oscar, editor, Pandu Rangan, C., editor, Steffen, Bernhard, editor, Sudan, Madhu, editor, Terzopoulos, Demetri, editor, Tygar, Dough, editor, Vardi, Moshe Y., editor, Weikum, Gerhard, editor, Zamboni, Diego, editor, and Kruegel, Christopher, editor

Published
2006
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17. Masquerade detection augmented with error analysis

Author

Maxion, Roy A. and Townsend, Tahlia N.

Subjects
Masquerades -- Analysis, Error-correcting codes -- Analysis, Data security -- Analysis, Data security issue, Business, Electronics, Electronics and electrical industries
Abstract

The data provided by Schonlau et al. is used to demonstrate the new technique for masquerade detection, which yields 56 per cent improvement in correct detection at the lowest false alarm rate. A masquerade attack, in which one user impersonates another, is one of the most serious forms of computer abuse.

Published
2004

19. Anomaly detection in embedded systems

Author

Maxion, Roy A. and Tan, Kymie M.C.

Subjects
Embedded system, Fault tolerance, Embedded systems -- Research, Fault tolerance (Computers) -- Research, Computer industry -- Research
Published
2002

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