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334 results on '"Mastrangelo, A. M."'

4. A semi-empirical Bayesian chart to monitor Weibull percentiles

Author

Erto, Pasquale, Pallotta, Giuliana, and Mastrangelo, Christina M.

Subjects
Statistics - Methodology, 62C12, 62-09, 62N05
Abstract

This paper develops a Bayesian control chart for the percentiles of the Weibull distribution, when both its in-control and out-of-control parameters are unknown. The Bayesian approach enhances parameter estimates for small sample sizes that occur when monitoring rare events as in high-reliability applications or genetic mutations. The chart monitors the parameters of the Weibull distribution directly, instead of transforming the data as most Weibull-based charts do in order to comply with their normality assumption. The chart uses the whole accumulated knowledge resulting from the likelihood of the current sample combined with the information given by both the initial prior knowledge and all the past samples. The chart is adapting since its control limits change (e.g. narrow) during the Phase I. An example is presented and good Average Run Length properties are demonstrated. In addition, the paper gives insights into the nature of monitoring Weibull processes by highlighting the relationship between distribution and process parameters., Comment: 21 pages, 3 figures, 5 tables

Published
2013

5. Characterization of polyploid wheat genomic diversity using a high‐density 90 000 single nucleotide polymorphism array

Author

Wang, Shichen, Wong, Debbie, Forrest, Kerrie, Allen, Alexandra, Chao, Shiaoman, Huang, Bevan E, Maccaferri, Marco, Salvi, Silvio, Milner, Sara G, Cattivelli, Luigi, Mastrangelo, Anna M, Whan, Alex, Stephen, Stuart, Barker, Gary, Wieseke, Ralf, Plieske, Joerg, Consortium, International Wheat Genome Sequencing, Lillemo, Morten, Mather, Diane, Appels, Rudi, Dolferus, Rudy, Brown‐Guedira, Gina, Korol, Abraham, Akhunova, Alina R, Feuillet, Catherine, Salse, Jerome, Morgante, Michele, Pozniak, Curtis, Luo, Ming‐Cheng, Dvorak, Jan, Morell, Matthew, Dubcovsky, Jorge, Ganal, Martin, Tuberosa, Roberto, Lawley, Cindy, Mikoulitch, Ivan, Cavanagh, Colin, Edwards, Keith J, Hayden, Matthew, and Akhunov, Eduard

Subjects
Biological Sciences, Ecology, Genetics, Human Genome, Alleles, Chromosome Mapping, Cluster Analysis, Gene Frequency, Genetic Loci, Genetic Markers, Genetic Variation, Genome, Plant, Genotype, Oligonucleotide Array Sequence Analysis, Polymorphism, Single Nucleotide, Polyploidy, Triticum, single nucleotide polymorphism, polyploid wheat, wheat iSelect array, genotyping, high-density map, genetic diversity, International Wheat Genome Sequencing Consortium, Genetic diversity, Genotyping, High-density map, Polyploid wheat, Single nucleotide polymorphism, Wheat iSelect array, Technology, Medical and Health Sciences, Biotechnology, Agricultural biotechnology, Plant biology
Abstract

High-density single nucleotide polymorphism (SNP) genotyping arrays are a powerful tool for studying genomic patterns of diversity, inferring ancestral relationships between individuals in populations and studying marker-trait associations in mapping experiments. We developed a genotyping array including about 90,000 gene-associated SNPs and used it to characterize genetic variation in allohexaploid and allotetraploid wheat populations. The array includes a significant fraction of common genome-wide distributed SNPs that are represented in populations of diverse geographical origin. We used density-based spatial clustering algorithms to enable high-throughput genotype calling in complex data sets obtained for polyploid wheat. We show that these model-free clustering algorithms provide accurate genotype calling in the presence of multiple clusters including clusters with low signal intensity resulting from significant sequence divergence at the target SNP site or gene deletions. Assays that detect low-intensity clusters can provide insight into the distribution of presence-absence variation (PAV) in wheat populations. A total of 46 977 SNPs from the wheat 90K array were genetically mapped using a combination of eight mapping populations. The developed array and cluster identification algorithms provide an opportunity to infer detailed haplotype structure in polyploid wheat and will serve as an invaluable resource for diversity studies and investigating the genetic basis of trait variation in wheat.

Published
2014

6. Characterization of polyploid wheat genomic diversity using a high-density 90,000 single nucleotide polymorphism array.

Author

Wang, Shichen, Wong, Debbie, Forrest, Kerrie, Allen, Alexandra, Chao, Shiaoman, Huang, Bevan E, Maccaferri, Marco, Salvi, Silvio, Milner, Sara G, Cattivelli, Luigi, Mastrangelo, Anna M, Whan, Alex, Stephen, Stuart, Barker, Gary, Wieseke, Ralf, Plieske, Joerg, International Wheat Genome Sequencing Consortium, Lillemo, Morten, Mather, Diane, Appels, Rudi, Dolferus, Rudy, Brown-Guedira, Gina, Korol, Abraham, Akhunova, Alina R, Feuillet, Catherine, Salse, Jerome, Morgante, Michele, Pozniak, Curtis, Luo, Ming-Cheng, Dvorak, Jan, Morell, Matthew, Dubcovsky, Jorge, Ganal, Martin, Tuberosa, Roberto, Lawley, Cindy, Mikoulitch, Ivan, Cavanagh, Colin, Edwards, Keith J, Hayden, Matthew, and Akhunov, Eduard

Subjects
International Wheat Genome Sequencing Consortium, Triticum, Genetic Markers, Oligonucleotide Array Sequence Analysis, Cluster Analysis, Chromosome Mapping, Gene Frequency, Genotype, Polyploidy, Polymorphism, Single Nucleotide, Alleles, Genome, Plant, Genetic Variation, Genetic Loci, genetic diversity, genotyping, high-density map, polyploid wheat, single nucleotide polymorphism, wheat iSelect array, Genetic diversity, Genotyping, High-density map, Polyploid wheat, Single nucleotide polymorphism, Wheat iSelect array, Biotechnology, Technology, Biological Sciences, Medical and Health Sciences
Abstract

High-density single nucleotide polymorphism (SNP) genotyping arrays are a powerful tool for studying genomic patterns of diversity, inferring ancestral relationships between individuals in populations and studying marker-trait associations in mapping experiments. We developed a genotyping array including about 90,000 gene-associated SNPs and used it to characterize genetic variation in allohexaploid and allotetraploid wheat populations. The array includes a significant fraction of common genome-wide distributed SNPs that are represented in populations of diverse geographical origin. We used density-based spatial clustering algorithms to enable high-throughput genotype calling in complex data sets obtained for polyploid wheat. We show that these model-free clustering algorithms provide accurate genotype calling in the presence of multiple clusters including clusters with low signal intensity resulting from significant sequence divergence at the target SNP site or gene deletions. Assays that detect low-intensity clusters can provide insight into the distribution of presence-absence variation (PAV) in wheat populations. A total of 46 977 SNPs from the wheat 90K array were genetically mapped using a combination of eight mapping populations. The developed array and cluster identification algorithms provide an opportunity to infer detailed haplotype structure in polyploid wheat and will serve as an invaluable resource for diversity studies and investigating the genetic basis of trait variation in wheat.

Published
2014

9. Durum wheat genome highlights past domestication signatures and future improvement targets

Author

Maccaferri, Marco, Harris, Neil S., Twardziok, Sven O., Pasam, Raj K., Gundlach, Heidrun, Spannagl, Manuel, Ormanbekova, Danara, Lux, Thomas, Prade, Verena M., Milner, Sara G., Himmelbach, Axel, Mascher, Martin, Bagnaresi, Paolo, Faccioli, Primetta, Cozzi, Paolo, Lauria, Massimiliano, Lazzari, Barbara, Stella, Alessandra, Manconi, Andrea, Gnocchi, Matteo, Moscatelli, Marco, Avni, Raz, Deek, Jasline, Biyiklioglu, Sezgi, Frascaroli, Elisabetta, Corneti, Simona, Salvi, Silvio, Sonnante, Gabriella, Desiderio, Francesca, Marè, Caterina, Crosatti, Cristina, Mica, Erica, Özkan, Hakan, Kilian, Benjamin, De Vita, Pasquale, Marone, Daniela, Joukhadar, Reem, Mazzucotelli, Elisabetta, Nigro, Domenica, Gadaleta, Agata, Chao, Shiaoman, Faris, Justin D., Melo, Arthur T. O., Pumphrey, Mike, Pecchioni, Nicola, Milanesi, Luciano, Wiebe, Krystalee, Ens, Jennifer, MacLachlan, Ron P., Clarke, John M., Sharpe, Andrew G., Koh, Chu Shin, Liang, Kevin Y. H., Taylor, Gregory J., Knox, Ron, Budak, Hikmet, Mastrangelo, Anna M., Xu, Steven S., Stein, Nils, Hale, Iago, Distelfeld, Assaf, Hayden, Matthew J., Tuberosa, Roberto, Walkowiak, Sean, Mayer, Klaus F. X., Ceriotti, Aldo, Pozniak, Curtis J., and Cattivelli, Luigi

Published
2019
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11. MRI log file analysis for workflow improvement.

Author

Petroianu, Larissa P.G., Li, Lun, Mieloszyk, Rebecca J., Mastrangelo, Christina M., Stapleton, Shawn, and Hall, Christopher

Abstract

Magnetic Resonance Imaging (MRI) is an important diagnostic scanning tool for the detection and monitoring of specific diseases and conditions. However, the equipment cost, maintenance and specialty training of the technologists make the examination expensive. Consequently, unnecessary scanner time caused by poor scheduling, repeated sequences, aborted sequences, scanner idleness, or capture of non-diagnostic or low-value sequences is an opportunity to reduce costs and increase efficiency. This paper analyzes data collected from log files on 29 scanners over several years. 'Wasted' time is defined and key performance indicators (KPIs) are identified. A decrease in exam duration results when actively modifying and monitoring the number of sequences that comprise the exam card for a protocol. [ABSTRACT FROM AUTHOR]

Published
2024
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15. Common and durum wheat genetic materials for studying grain quality-related traits

Author

Marone, Daniela, Mastrangelo, Anna M., De Simone, V., Giovanniello, V., Pecchioni, N., Marcotuli, I., Gadaleta, Ágata, Atienza, Sergio G., Mazzucotelli, Elisabetta, Barabaschi, D., Ficco, Donatella B. M., Marone, Daniela, Mastrangelo, Anna M., De Simone, V., Giovanniello, V., Pecchioni, N., Marcotuli, I., Gadaleta, Ágata, Atienza, Sergio G., Mazzucotelli, Elisabetta, Barabaschi, D., and Ficco, Donatella B. M.

Abstract

Wheat is an important food crop worldwide. Climate change, disease and abiotic stresses can decrease yield and reduce grain quality, therefore search for useful alleles in wild accessions and subspecies could improve resilience and sustainability. Two genetic resources useful for studying grain quality-related traits were analyzed and characterized in the frame of the CEREALMED project. An introgression line population obtained by crossing a durum wheat cultivar, PR22D89, and an accession of Triticum dicoccoides, MG2323, was evaluated for protein content, SDS-sedimentation volume, beta-glucans and carotenoids in two different pedoclimatic environments to find genetic loci involved in these traits. Furthermore, a collection of 59 accessions of Triticum aestivum subspecies, including cultivars, breeding materials, landraces and wilds, previously characterized by SNP markers, was evaluated for carotenoid content. The variability present in this panel was partially overlapped with that observed in durum wheat and therefore useful in enlarging the total variation for wheat. Moreover, significant SNP markers putatively associated to this trait in common wheat were identified, providing the chance to identify novel useful alleles to further improve carotenoid content in both durum and bread wheat.

Published
2023

16. Hexaploid wheat diversity for carotenoid biofortification

Author

Ministerio de Ciencia e Innovación (España), Agencia Estatal de Investigación (España), European Commission, Rodríguez-Suárez, Cristina, Requena-Ramírez, María Dolores, Hornero-Méndez, Dámaso, Mazzucotelli, Elisabetta, Barabaschi, D., Mastrangelo, Anna M., Marone, Daniela, Atienza, Sergio G., Ministerio de Ciencia e Innovación (España), Agencia Estatal de Investigación (España), European Commission, Rodríguez-Suárez, Cristina, Requena-Ramírez, María Dolores, Hornero-Méndez, Dámaso, Mazzucotelli, Elisabetta, Barabaschi, D., Mastrangelo, Anna M., Marone, Daniela, and Atienza, Sergio G.

Published
2023

17. A reliability approach for prediction and management of part obsolescence for improved system health.

Author

Mastrangelo, Christina M. and Olson, Kara A.

Subjects
OBSOLESCENCE, RELIABILITY in engineering, CONDITIONAL probability, DATA scrubbing, CENSORING (Statistics), DATA binning, DISTRIBUTION (Probability theory)
Abstract

Accurate prediction of part obsolescence is critical to maintaining system health, especially for the long-lived systems typical in aerospace and naval domains. While there are methods that predict an expected date of obsolescence, a numerical likelihood of obsolescence can be useful. This work describes a Weibull-based conditional probability method for the prediction of part-level obsolescence risk. Several considerations inherent to the problem environment and using a probabilistic method to estimate risk are discussed and addressed, including accounting for changing product life, using dynamic binning and Weibull regression; sample bias, through data cleaning; and small datasets with potentially highly censored data, using a modified synthetic minority oversampling technique (SMOTE) that can sample both the minority and majority classes. Development of an approximate measure of uncertainty of obsolescence is also presented. Use of the method is demonstrated with a multiplexer dataset and shows the feasibility of the approach. [ABSTRACT FROM AUTHOR]

Published
2024
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19. Time Series Analysis

Author

Mastrangelo, Christina M., Simpson, James R., Montgomery, Douglas C., Gass, Saul I., editor, and Fu, Michael C., editor

Published
2013
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28. Identification of new set of genotypes of tritordeum for cultivation

Author

Atienza, Sergio G. [0000-0001-5175-8303], Rodríguez-Suárez, Cristina [0000-0002-5409-1839], Martín Jiménez, Ángela, Rodríguez-Suárez, Cristina, Mazzucotelli, Elisabetta, Mastrangelo, Anna M., Marcotuli, I., Gadaleta, Ágata, Atienza, Sergio G., Atienza, Sergio G. [0000-0001-5175-8303], Rodríguez-Suárez, Cristina [0000-0002-5409-1839], Martín Jiménez, Ángela, Rodríguez-Suárez, Cristina, Mazzucotelli, Elisabetta, Mastrangelo, Anna M., Marcotuli, I., Gadaleta, Ágata, and Atienza, Sergio G.

Published
2022

32. List of contributors

Author

Abeledo, L. Gabriela, primary, Aguirrezábal, Luis, additional, Andrade, Fernando H., additional, Appendino, Maria L., additional, Asseng, Senthold, additional, Barabaschi, Delfina, additional, Borrás, Lucas, additional, Borrelli, Grazia M., additional, Bramley, Helen, additional, Brodribb, Timothy J., additional, Calderini, Daniel F., additional, Cassman, Kenneth G., additional, Castro, Sebastián, additional, Cattivelli, Luigi, additional, Chenu, Karine, additional, Ciampitti, Ignacio, additional, Cossani, C. Mariano, additional, De Vita, Pasquale, additional, Debaeke, Philippe, additional, Deng, Aixing, additional, Denison, R. Ford, additional, Dimes, John, additional, Durand, Jean-Louis, additional, Echarte, María Mercedes, additional, Foulkes, M.J., additional, Gastal, François, additional, Grassini, Patricio, additional, Hakala, Kaija, additional, He, Zhonghu, additional, Holloway-Phillips, Meisha-Marika, additional, Izquierdo, Natalia, additional, Känkänen, Hannu, additional, Kantolic, Adriana G., additional, Lemaire, Gilles, additional, León, Alberto, additional, Lizana, X. Carolina, additional, Louarn, Gaëtan, additional, Luquet, Delphine, additional, Maddonni, Gustavo A., additional, Martre, Pierre, additional, Mastrangelo, Anna M., additional, Mera, Mario, additional, Miralles, Daniel J., additional, Orrù, Luigi, additional, Otegui, Maria E., additional, Ougham, Helen, additional, Ould-Sidi Memmah, Mohammed-Mahmoud, additional, Peltonen-Sainio, Pirjo, additional, Pereyra-Irujo, Gustavo, additional, Pontaroli, Ana C., additional, Potgieter, Andries, additional, Quilot-Turion, Bénédicte, additional, Rajala, Ari, additional, Reynolds, M.P., additional, Rodriguez, Daniel, additional, Sadras, Victor O., additional, Sala, Rodrigo G., additional, Savin, Roxana, additional, Slafer, Gustavo A., additional, Song, Zhenwei, additional, Specht, James E., additional, Thomas, Howard, additional, Tollenaar, Matthijs, additional, Tranquilli, Gabriela, additional, Wang, Enli, additional, Zhang, Weijian, additional, Zheng, Chengyan, additional, and Zhu, Yan, additional

Published
2015
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34. A high-density consensus map of A and B wheat genomes

Author

Marone, Daniela, Laidò, Giovanni, Gadaleta, Agata, Colasuonno, Pasqualina, Ficco, Donatella B. M., Giancaspro, Angelica, Giove, Stefania, Panio, Giosué, Russo, Maria A., De Vita, Pasquale, Cattivelli, Luigi, Papa, Roberto, Blanco, Antonio, and Mastrangelo, Anna M.

Published
2012
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41. Mapping adaptation of barley to droughted environments

Author

Comadran, J., Russell, J. R., van Eeuwijk, F. A., Ceccarelli, S., Grando, S., Baum, M., Stanca, A. M., Pecchioni, N., Mastrangelo, A. M., Akar, T., Al-Yassin, A., Benbelkacem, A., Choumane, W., Ouabbou, H., Dahan, R., Bort, J., Araus, J.-L., Pswarayi, A., Romagosa, I., Hackett, C. A., and Thomas, W. T. B.

Published
2008
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42. Classification of defect clusters on semiconductor wafers via the Hough transformation

Author

White, K. Preston,. Jr., Kundu, Bijoy, and Mastrangelo, Christina M.

Subjects
Image processing -- Technology application, Semiconductor wafers -- Design and construction, Semiconductor preparation -- Research, Transformations (Mathematics) -- Evaluation, Reliability (Engineering) -- Evaluation, Technology application, Business, Computers, Electronics, Electronics and electrical industries
Abstract

The Hough transformation employing a normal line-to-point parameterization is widely applied in digital image processing for feature detection. In this paper, we demonstrate how this same transformation can be adapted to classify defect signatures on semiconductor wafers as an aid to visual defect metrology. Given a rectilinear grid of die centers on a wafer, we demonstrate an efficient and effective procedure for classifying defect clusters composed of lines at angles of 0[degrees], 45[degrees], 90[degrees], and 135[degrees] from the horizontal, as well as adjacent compositions of such lines. Included are defect clusters representing stripes, scratches at arbitrary angles, and center and edge defects. The principle advantage of the procedure over current industrial practice is that it can be fully automated to screen wafers for further engineering analysis. Index Terms--Defect metrology, Hough transformation, image processing, process control, spatial defect analysis and classification, wafer maps.

Published
2008

48. Use and abuse of topical corticosteroids in infections of the skin and related structures

Author

Wong, Vicky Kwan, Croce, Christine Della, Schonfeld, Sara, Mastrangelo, Anthony M., and Lebwohl, Mark

Subjects
Skin diseases -- Care and treatment, Corticosteroids -- Usage, Health, Pharmaceuticals and cosmetics industries
Abstract

Abstract Topical corticosteroids have improved the management of many inflammatory skin diseases, such as psoriasis and atopic dermatitis. However, these medications are associated with certain adverse effects that are potentially [...]

Published
2003

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