19 results on '"Markus Jech"'
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2. Metastability of Negatively Charged Hydroxyl-E' Centers and their Potential Role in Positive Bias Temperature Instabilities.
3. Multiscale Modeling Study of Native Oxide Growth on a Si(100) Surface.
4. Machine Learning Prediction of Defect Structures in Amorphous Silicon Dioxide.
5. Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network.
6. A Compact Physics Analytical Model for Hot-Carrier Degradation.
7. Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants.
8. Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors.
9. Physical modeling of the hysteresis in M0S2 transistors.
10. Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence.
11. Comphy - A compact-physics framework for unified modeling of BTI.
12. TCAD Modeling of Temperature Activation of the Hysteresis Characteristics of Lateral 4H-SiC MOSFETs
13. Structure, electronic properties, and energetics of oxygen vacancies in varying concentrations of SixGe1−xO2
14. Macroscopic Transport Models for Classical Device Simulation
15. Dynamic modeling of Si(100) thermal oxidation: Oxidation mechanisms and realistic amorphous interface generation
16. Building robust machine learning force fields by composite Gaussian approximation potentials
17. Ab initio investigations in amorphous silicon dioxide: Proposing a multi-state defect model for electron and hole capture
18. First Principles Evaluation of Topologically Protected Edge States in MoS2 1T′ Nanoribbons with Realistic Terminations
19. On the limits of applicability of drift-diffusion based hot carrier degradation modeling.
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