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28 results on '"Manfred Wiessner"'

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1. Extended Regression Analysis for Debye–Einstein Models Describing Low Temperature Heat Capacity Data of Solids

2. Solutions of Critical Raw Materials Issues Regarding Iron-Based Alloys

3. Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis

4. Low temperature heat capacities and thermodynamic functions described by Debye–Einstein integrals

5. Curvature determination of embedded silicon chips byin siturocking curve X-ray diffraction measurements at elevated temperatures

6. Analysis of the mobility of migrating austenite–ferrite interfaces

7. Effects Of The Combined Heat And Cryogenic Treatment On The Stability Of Austenite In A High Co-Ni Steel

8. Correlative characterization of primary Al3(Sc,Zr) phase in an Al–Zn–Mg based alloy

9. Influence of Heat Treatment on the Microstructure of a High Co-Ni Secondary Hardening Steel

10. Bayesian approach applied to the Rietveld method

11. Advanced X-ray Diffraction Techniques for Quantitative Phase Content and Lattice Defect Characterization during Heat Treatment of High Speed Steels

12. Thermal behaviour of chromium nitride/titanium–titanium carbonitride multilayers

14. Chromium/chromium nitride multilayers during thermal treatment: An X-ray diffraction study

15. Investigation of Retained Strains and Microstructures for a Hot Deformed Stainless Steel

16. Investigation of Retained Strains during Multipass Deformation

17. Physical Simulation of Thermo Mechanical Phenomena to Obtain an Optimal Micro Structure for a Soft Magnetic Fe-Co-Alloy

18. The roles of Eu during the growth of eutectic Si in Al-Si alloys

19. C-AFM and KPFM approach to investigate the electrical properties of single grain boundaries in ZnO varistor devices

22. Leistungsstufen/Verbleiben in der bisherigen Stufe

24. Führungspositionen auf Zeit

25. Einleitung

26. Leistungsprämien und -zulagen

28. Influence of deposited metal structures on the failure mechanisms of silicon-based components

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