1. Antiferromagnetic Exchange Coupling in RE-TM Films
- Author
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T Shiratori, Yuji Fujiwara, A. Ohshima, T. Kobayashi, S Shiomi, M. Tsuneoka, and A Inagaki
- Subjects
Coupling ,Materials science ,Condensed matter physics ,Double layered ,Sputter deposition ,Condensed Matter Physics ,Electronic, Optical and Magnetic Materials ,Calculated result ,Ferromagnetism ,Antiferromagnetism ,Thermal stability ,Electrical and Electronic Engineering ,Instrumentation ,Layer (electronics) - Abstract
This paper reports the magnetic and magneto-optical properties of antiferromagnetic exchange coupled (AFC) RE-TM double layered films prepared by sputter deposition. The sample structure is glass/underlayer Ru/Gd-Fe-Co/(E-layer Fe-Co)/AFC layer Ru/(E-layer Fe-Co)/Gd-Fe-Co/protectivelayer Ru. The exchange coupling energy J was found to depend on Ru thickness of the AFC layer. The first AFC peak was found at an AFC layer thickness of 3.0 A. Next we inserted a thin Fe-Co layer called the “E-layer,” between the AFC layer and the magnetic layer to improve the J value. In AFC RE-TM double layered films, a complicated Kerr loop was observed when each magnetic layer was thin. Then we compared the calculated result with the experimental result to distinguish the ferromagnetic coupling from the AFC. Next we investigated thermal stability of J. Moreover we calculated the magneto-optical properties with the film structure of DWDD, using AFC RE-TM double layered films for the displacement layer.
- Published
- 2004