135 results on '"Müllerová, Ilona"'
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2. Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy Capabilities for Study of Advanced 2D Materials and Thin Foils.
3. Field emission properties of single crystalline W5O14 and W18O49 nanowires
4. Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy
5. Study of Graphene and Thin Foils by a Time-of-Flight Spectrometer for Low Landing Energies
6. Low Energy Imaging of Nonconductive Surfaces in SEM
7. Very low energy scanning electron microscopy
8. Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors
9. The Scanning Very-Low-Energy Electron Microscope (SVLEEM)
10. Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer
11. Methods of the electron induced cleanning in SEM
12. The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements
13. Imaging Ferroelectric Nanodomains in Strained BiFeO3 Nanoscale Films Using Scanning Low-Energy Electron Microscopy: Implications for Low-Power Devices
14. Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer
15. Enhancement of SEM to scanning LEEM
16. Electron Backscattering from Real and In-Situ Treated Surfaces
17. Very Low Energy Electron Transmission Spectroscopy of 2D Materials
18. Scanning tunneling microscopy in the field-emission regime: Formation of a two-dimensional electron cascade
19. Scanning Low-Energy Electron Microscopy
20. Use of cathode lens in scanning electron microscope for low voltage applications
21. Surface imaging with UHV SLEEM and SEM LEEM
22. Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy
23. Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons
24. Applications of Low and Ultra-low Energy Scanning Electron Microscopy
25. In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM
26. Imaging of the boron doping in silicon using low energy SEM
27. Imaging Ferroelectric Nanodomains in Strained BiFeO3 Nanoscale Films Using Scanning Low-Energy Electron Microscopy: Implications for Low-Power Devices.
28. 2aB_SS2-3Prospects of Scanning Low Energy Electron Microscopy in Material Science
29. The origin of contrast in the imaging of doped areas in silicon by slow electrons.
30. Povědomí veřejnosti o nemoci AIDS
31. Practical Use of Scanning Low Energy Electron Microscope (SLEEM)
32. Simulations and measurements in scanning electron microscopes at low electron energy
33. Optimizing the Recognition of Surface Crystallography
34. Counting graphene layers with very slow electrons
35. Exploitation of Contrasts in Low Energy SEM to Reveal True Microstructure
36. Scanning Electron Microscopy with Samples in an Electric Field
37. A method of imaging ultrathin foils with very low energy electrons
38. Very low energy scanning electron microscopy in nanotechnology
39. FIB Induced Damage Examined with the Low Energy SEM
40. Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films
41. Grain Contrast Imaging in UHV SLEEM
42. The trajectories of secondary electrons in the scanning electron microscope
43. Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons
44. Acquisition of the Angular Distribution of Backscattered Electrons at Low Energies
45. Cathode Lens Mode of the SEM in Materials Science Applications
46. Imaging of specimens at optimized low and very low energies in scanning electron microscopes
47. Scanning electron microscopy of nonconductive specimens at critical energies in a cathode lens system
48. Contrast at very low energies of the gold/carbon specimen for resolution testing
49. The injected-charge contrast mechanism in scanned imaging of doped semiconductors by very slow electrons
50. The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites
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