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2. High-accuracy experimental determination of photon mass attenuation coefficients of transition metals and lithium fluoride in the ultra-soft energy range.

Author

Schweizer, Pia, Ménesguen, Yves, Lépy, Marie-Christine, Brackx, Emmanuelle, Duchateau, Maxime, and Jonnard, Philippe

Abstract

In the field of quantitative X-ray analysis techniques, such as electron probe microanalysis, precise knowledge of fundamental parameters is crucial. Especially, the accurate determination of photon mass attenuation coefficients is essential to perform correct elemental quantification. While the widely used databases offer agreement for the hard X-ray range, significant differences arise for lower photon energies. Furthermore, addressing the uncertainties of the tabulated data, which can be of several hundreds of percent, is of urgent need. Driven by recent advances in analytical techniques in the low energy range including investigation of materials containing lithium, the interest in a reliable set of photon mass attenuation coefficients is steadily increasing. In this study, we experimentally determine photon mass attenuation coefficients for lithium fluoride, aluminium, and different transition metals in the extreme low energy range from 40 eV to a several hundreds of eV. This high-precision experimental determination allows a comparison with the existing data tables. We observe differences that turn out to be significant, especially around the absorption edges. [ABSTRACT FROM AUTHOR]

Published
2024
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3. L'eutrophisation: Manifestations, causes, conséquences et prédictibilité

Author

Gilles Pinay, Chantal Gascuel, Alain Ménesguen, Yves Souchon, Morgane Le Moal, Alix Levain, Claire Etrillard, Florentina Moatar, Alexandrine Pannard, Philippe Souchu and Gilles Pinay, Chantal Gascuel, Alain Ménesguen, Yves Souchon, Morgane Le Moal, Alix Levain, Claire Etrillard, Florentina Moatar, Alexandrine Pannard, Philippe Souchu

Published
2018

4. A step toward calculating the uncertainties in combined GIXRF‐XRR.

Author

Melhem, Stephanie, Ménesguen, Yves, Nolot, Emmanuel, and Lépy, Marie‐Christine

Subjects
*MULTILAYERED thin films, *MONTE Carlo method, *X-ray fluorescence, *STATISTICAL bootstrapping, *TELLURIUM, *GRAZING incidence
Abstract

The combination of X‐ray reflectivity (XRR) and grazing incidence X‐ray fluorescence (GIXRF) is a surface sensitive analytical method, which can be used for the characterization of thin films and multilayered materials. Both of these techniques are implemented on the same experimental setup and make use of similar mechanical processes and the same fundamental physical concept required for a combined data analysis. The combination of these techniques removes ambiguous results for the characterization of nanometer layers, as well as nanometer depth profiles, resulting in more accurate characterization of thickness, roughness, density, and elemental composition. Due to the vast number of fitting parameters, the estimation of the thin film sample structure is a challenging task. In this paper, we propose a recursive method for estimating the uncertainties of data from GIXRF‐XRR analysis, based on a Bootstrap statistical method. This approach relies on re‐sampling a dataset to estimate statistics on a population by applying random weights. We applied this method on an as‐deposited chalcogenide germanium, antimony, and tellurium (GST) thin film with a carbon‐capping layer. We found good agreement between the experimental and the theoretical XRR‐GIXRF values for a sample structure model, of which the parameters were determined within a confidence interval using the bootstrap method. We also propose an approach for calculating the uncertainty on the solid angle of detection based on Monte Carlo simulations. [ABSTRACT FROM AUTHOR]

Published
2023
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5. Primary calibration of photodiodes with monochromatic X‐ray beams using an electrical‐substitution radiometer.

Author

Elvira, Víctor H., Lépy, Marie‐Christine, and Ménesguen, Yves

Subjects
PHOTODIODES, SEMICONDUCTOR detectors, PHOTON flux, CALIBRATION, SILICON detectors
Abstract

The electrical‐substitution cryogenic detector BOLometer for Use in the range of X‐rays (BOLUX), which was developed some years ago at CEA/DAM, has been set up and restarted now at LNHB. It has been used for the primary measurement of the intensity (total energy per unit time) of monochromatic synchrotron beams in the energy range from 3 to 30 keV. These well‐determined photon beams have been employed for the efficiency calibration of two photodiodes in terms of current induced per unit optical power at different photon energies. In a final step, we explored the possibility to use these primary‐calibrated photodiodes to determine the efficiency curve of an energy‐dispersive spectrometer based on a semiconductor detector (Silicon Drift Detector) using less intense monochromatic photon fluxes. The characteristics of the radiometer BOLUX and its principle of operation are described, and the measurements carried out at the synchrotron beamline are presented, including the determination of the beams' intensities, the direct calibration of photodiodes with respect to BOLUX and the use of one of those photodiodes as a standard transfer for the calibration of the SDD. [ABSTRACT FROM AUTHOR]

Published
2023
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6. Combined x‐ray reflectivity and grazing incidence x‐ray fluorescence study of Ta/Cr/Pt thin film stacks.

Author

Jonnard, Philippe, Le Guen, Karine, Delaunay, Renaud, Ménesguen, Yves, Lépy, Marie‐Christine, Briand, Emrick, Schmaus, Didier, and Vickridge, Ian

Subjects
X-ray fluorescence, GRAZING incidence, THIN films, X-rays, TANTALUM, OPACITY (Optics), PLANAR waveguides, PERPENDICULAR magnetic anisotropy
Abstract

The Ta/Cr/Pt three‐layer system can be used as a planar x‐ray waveguide, that is to say it can guide an x‐ray beam inside its chromium layer. This property comes from the difference in density and hence in optical index between the two "heavy" or cladding tantalum and platinum layers and the "light" or guiding chromium layer. The waveguide will be efficient provided the layers are a few nanometers thick and that the interfaces are as sharp as possible. To control the quality of the stack, we combine grazing incidence x‐ray fluorescence (GIXRF) and x‐ray reflectivity (XRR) measurements on a series of Ta/Cr/Pt samples, whose only difference is the thickness of the Cr layer. The three considered samples have been deposited by magnetron sputtering and their designed structures are: Ta (8 nm)/Cr (5, 10, and 15 nm)/Pt (14 nm)/Si substrate. The combination of XRR and GIXRF tightens constraints on the parameters used to simulate the stack: thickness, roughness, composition, and density of the layers and their interlayers. For each sample we used six GIXRF curves obtained from three different characteristic x‐ray lines (Ta Lα, Cr Kα, and Pt Lβ2,15) excited at three different incident photons energies (6.25, 10, and 12 keV) as well as one XRR curve obtained at 6.25 keV. The XRR‐GIXRF combined analysis demonstrates that the Ta/Cr/Pt structure is too simplistic and that it is necessary to introduce some interlayers at the top and bottom of the stacks to obtain a reliable agreement between the experimental and simulated GIXRF and XRR curves. [ABSTRACT FROM AUTHOR]

Published
2023
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9. Combien de photons ?

Author

Ménesguen, Yves, Hernandez-Elvira, Victor, Lépy, Marie-Christine, Laboratoire National Henri Becquerel (LNHB), Département Métrologie Instrumentation & Information (DM2I), Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Département d'instrumentation Numérique (DIN (CEA-LIST)), and Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)

Subjects
instrumentation, metrology, dosimetry, detector, radioactivity, X-rays, bolometry, [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], ionizing radiation, calibration, primary activity measurement, nuclear instrumentation
Abstract

International audience; La connaissance du flux de photons X incidents est nécessaire pour les analyses quantitatives. C’est aussi une donnée primordiale quand on souhaite connaître la dose reçue par un échantillon biologique. Le LNE-LNHB, laboratoire primaire français pour la métrologie des rayonnements ionisants, a parmi ses missions celle d’étalonner sources et détecteurs. Le LNE-LNHB étalonne en rendement des détecteurs (photodiodes, SDD) pour ses propres besoins d’analyses quantitatives et sans référence (analyse combinée XRR-GIXRF). Le LNE-LNHB a repris l’activité bolomètre du CEA-DAM en 2020. Ce bolomètre (BOLUX) permet de mesurer la puissance optique reçue.

Published
2023

10. Absolute calibration of photodiodes with a monochromatic beam measured with an electrical-substitution radiometer

Author

Hernandez-Elvira, Victor, Lépy, Marie-Christine, Ménesguen, Yves, Laboratoire National Henri Becquerel (LNHB), Département Métrologie Instrumentation & Information (DM2I), Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Département d'instrumentation Numérique (DIN (CEA-LIST)), and Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)

Subjects
instrumentation, thermistor, [PHYS]Physics [physics], detector, calibration, radiometer, electronic architecture, spectrometry, monitoring, metrology, bolometer, radioactivity, X-rays, synchrotron, SOLEIL, photodiode, ionizing radiation, nuclear instrumentation, X-ray spectrometry
Abstract

International audience; Traditional efficiency calibration of spectrometers is based on the measurement of sources of radionuclides calibrated in activity and whose emission probabilities are known beforehand. However, there are regions of the spectrum where there is a lack of reliable tabulated emission probabilities. Furthermore, if one aims to improve the measurement of emission probabilities, this approach implies the use of the same parameters that one intends to measure. The solution to these limitations is the use of photon fluxes whose intensity has been measured in an absolute way by another technique. Photodiodes constitute a very suitable choice for measuring the intensity of these fluxes, but they need to be previously calibrated in terms of amount of current generated per unit power. In this work, we present the calibration of several photodiodes with a monochromatic photon beam whose intensity is previously measured in an absolute way by a cryogenic electrical-substitution radiometer.Cryogenic detectors are based on the measurement of the temperature rise experienced by an absorber when the radiation interacts with it. In electrical-substitution radiometers, the amount of incident energy is determined by finding the electrical power that must be dissipated in the material to get the same temperature rise obtained during the photonic heating. In order to monitor temperature, a thermistor is polarized by a constant current, so the diminution of resistance induced by the temperature rise implies a decrease of its potential.In this work, the intensity of monochromatic beams is measured by means of the radiometer BOLUX (BOLometer for Use in the field of X-rays). This measurement is corrected by transmission, escape and scattering in BOLUX's absorber. Afterwards the current generated in the photodiode is measured when the same beam impinges on it, in order to obtain its efficiency at that photon energy. Measurements were performed at two different beamlines (Métrologie and PUMA) at synchrotron SOLEIL, covering an energy range from 3 keV to 60 keV. Absolute calibration of photodiodes also plays an important role in all those applications that rely on well-characterized photon fluxes, such as reference-free X-ray spectrometry.

Published
2022

11. XRR-GIXRF combined characterization of Mg/Sc multilayer

Author

Verma, Hina, Le Guen, Karine, Ménesguen, Yves, Delaunay, Renaud, Lépy, Marie-Christine, Jonnard, Philippe, Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Institut de Chimie du CNRS (INC)-Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS), Laboratoire National Henri Becquerel (LNHB), Département Métrologie Instrumentation & Information (DM2I), Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Département d'instrumentation Numérique (DIN (CEA-LIST)), and Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)

Subjects
instrumentation, spectrometry, metrology, grazing incidence x-ray fluorescence (GIXRF), radioactivity, x-ray reflectivity (XRR), X-rays, reflectivity, SOLEIL, [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], ionizing radiation, nuclear instrumentation
Abstract

International audience; The water window range, located between the absorption edges of carbon (285 eV) and oxygen (530 eV), along with the presence of nitrogen K absorption edge (395 eV), known for imaging biological samples, is also particularly interesting for spectroscopy in nitrogen K emission band. A crystal spectrometer equipped with suitable periodic multilayer with high reflectance is required for x-ray spectroscopy[1]. We studied the design and characterization of one such multilayer, the Mg/Sc multilayer. Various combinations of bilayer, trilayer, and multilayer systems of Mg/Sc with Cr as a capping layer, were fabricated and characterized. Bilayer and trilayer were prepared to study the interfaces (Cr-Mg, Cr-Sc, Mg-Sc) closely and hence facilitate analysis of the multilayer. The stacks are analysed using CASTOR (Chambre d’Analyse Spectrométrique en Transmission ou en Réflexion), an instrument dedicated for combined measurement of x-ray reflectivity (XRR) and grazing incidence x-ray fluorescence (GIXRF) analysis at SOLEIL, with an incident photon energy of 6.25keV. The combination of XRR, sensitive to the atomic density, and GIXRF, sensitive to element density, allows to obtain structural parameters as wells as elemental composition and depth concentration profiles of each of the element present in the stack. The combined analysis educes the uncertainties presented by each of the methods individually [2]. [Cr/Mg/Sc]x50 multilayer shows the reflectivity of 19% at energy 6.25keV (1st Bragg peak at angle 0.61°) with slight intermixing at Mg-Sc interface, and no interdiffusion at Cr-Mg interface. Hence, such a multilayer could be a good candidate for its application in x-ray spectroscopy

Published
2022

12. Combined x-ray reflectivity and grazing incidence x-ray fluorescence analysis of a Ta/Cr/Pt trilayer stack

Author

Jonnard, Philippe, Ménesguen, Yves, Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Institut de Chimie du CNRS (INC)-Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS), Laboratoire National Henri Becquerel (LNHB), Département Métrologie Instrumentation & Information (DM2I), Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Département d'instrumentation Numérique (DIN (CEA-LIST)), and Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)

Subjects
metrology, radioactivity, X-rays, Grazing incidence x-ray fluorescence, X-ray reflectivity, [PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex], ionizing radiation
Abstract

International audience; Measurements of X-ray reflectivity (XRR) and Grazing incidence x-ray fluorescence (GIXRF) were performed at the Métrologie beamline of SOLEIL synchrotron with the CASTOR setup with 6.25 keV incident photons.

Published
2022

13. Combined XRR-GIXRF analysis at LNHB: technical and analytical developments

Author

Ménesguen, Yves, Melhem, Stéphanie, Nolot, E., Jonnard, P., Lépy, Marie-Christine, Laboratoire National Henri Becquerel (LNHB), Département Métrologie Instrumentation & Information (DM2I), Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Département d'instrumentation Numérique (DIN (CEA-LIST)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Laboratoire de Chimie Physique Macromoléculaire (LCPM), and Institut de Chimie du CNRS (INC)-Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS)

Subjects
instrumentation, thin film, X-rays, X-Ray Reflectivity, [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], goniometer, Grazing Incidence X-Ray Fluorescence, nuclear instrumentation
Abstract

International audience; The XRR (“X-Ray Reflectivity”) and GIXRF (“Grazing Incidence X-Ray Fluorescence”) techniques make it possible to characterize the properties at the interfaces and in depth of materials deposited in very thin layers (thickness, roughness, composition, densities), CASTOR is a goniometer dedicated to these techniques. At LNE-LNHB we are developing the combined XRR-GIXRF analysis in a reference-free mode using calibrated instrumentation (SDD, photodiodes) and a user-friendly software dedicated to the complete analysis.

Published
2022

14. Reference‐Free Combined X‐Ray Reflectometry−Grazing Incidence X‐Ray Fluorescence at the French Synchrotron SOLEIL.

Author

Ménesguen, Yves and Lépy, Marie-Christine

Subjects
*X-rays, *HARD X-rays, *X-ray reflectometry, *SPECTROMETRY, *SYNCHROTRONS, *METROLOGY
Abstract

Chambre d'Analyse Spectrométrique en Transmission ou en Réflexion (Analysis Chamber for Transmission or Reflection Spectrometry) (CASTOR) is a new instrument, operated at the SOLEIL synchrotron facility, dedicated to the metrological characterization of thin films with thicknesses in the nanometer range. The instrument can combine two X‐ray techniques, namely, the reflectivity (XRR) measurements with fluorescence (XRF) acquisitions and especially total‐reflection X‐ray fluorescence (TXRF)‐related techniques such as grazing‐incidence XRF (GIXRF). The instrument is most often installed on the hard X‐ray branch of the Metrology beamline. Geometrical characterization is presented, reproducibility of measurements is studied, and the reference‐free GIXRF analysis is described. Some representative examples are given to illustrate the capabilities of the setup and the combined analysis procedure. [ABSTRACT FROM AUTHOR]

Published
2022
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15. Characterization of a multilayer x-ray waveguide by x-ray diffuse scattering and grazing incidence x-ray fluorescence

Author

Jonnard, Philippe, André, Jean-Michel, Le Guen, Karine, Ménesguen, Yves, Novikova, Anastasia, Lépy, Marie-Christine, Modi, Mohammed H., Sinha, Mitali, Singh, Amol, Jonnard, Philippe, Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Institut de Chimie du CNRS (INC)-Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS), Laboratoire National Henri Becquerel (LNHB), Département Métrologie Instrumentation & Information (DM2I), Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Département d'instrumentation Numérique (DIN (CEA-LIST)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Raja Ramanna Centre for Advanced Technology, and National Synchrotron Radiation Research Center (NSRRC)

Subjects
[PHYS.NEXP] Physics [physics]/Nuclear Experiment [nucl-ex], multilayer x-ray waveguide, X-rays, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Grazing incidence x-ray fluorescence, [PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex], ionizing radiation, [PHYS.COND.CM-MS] Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], diffuse scattering
Abstract

International audience; Presentation of the diffuse scattering curves induced by an incident radiation of 10.25 keV. Comparison of the experimental and simulated GIXRF curves of W and Zr

Published
2018

16. Experimental determination of X-ray atomic fundamental parameters of nickel

Author

Ménesguen, Yves, Lepy, Marie-Christine, Hönicke, Philipp, Müller, Matthias, Unterumsberger, Rainer, Beckhoff, Burkhard, Hoszowska, Joanna, Dousse, Jean-Claude, Blachucki, W, Ito, Y, Yamashita, M, and Fukushima, S

Abstract

X-ray atomic properties of Nickel were investigated in a singular approach that combines different experimental techniques to obtain new and useful reliable values of atomic fundamental parameters for X-ray spectrometric purposes and for comparison to theoretical predictions. We determined the mass attenuation coefficients in an energy range covering the L- and K- absorption edges, the K-shell fluorescence yield and the Kb/Ka and Kb1,3/Ka1,2 transition probability ratios. The obtained line profiles and linewidths of the Ka and Kb transitions in Ni can be considered as the contribution of the satellite lines arising from the [KM] shake processes suggested by Deutsch et al. [1] and Ito et al. [2]. Comparison of the new data with several databases showed a good agreement but also discrepancies were found with existing tabulated values.

Published
2017

17. CASTOR, a new instrument for combined XRR-GIXRF analysis at SOLEIL

Author

Ménesguen, Yves, Boyer, Bruno, Rotella, H., Lubeck, J., Weser, J., Beckhoff, B., Grötzsch, D., Kanngiesser, B., Novikova, A., Nolot, E., Lépy, Marie-Christine, Laboratoire National Henri Becquerel (LNHB), Département Métrologie Instrumentation & Information (DM2I), Laboratoire d'Intégration des Systèmes et des Technologies (LIST), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Laboratoire d'Intégration des Systèmes et des Technologies (LIST), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay, Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Physikalisch-Technische Bundesanstalt [Berlin] (PTB), Institut fur Atomare Physik und Fachdidaktik, TU Berlin, Institut fur Atomare Physik und Fachdidaktik, European Project: ENG53,ThinErgy, European Project: TReND,NEW01, Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), and Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Département d'instrumentation Numérique (DIN (CEA-LIST))

Subjects
instrumentation, Characterization of thin films, [PHYS.PHYS.PHYS-ATOM-PH]Physics [physics]/Physics [physics]/Atomic Physics [physics.atom-ph], thin film, X-RAY-FLUORESCENCE, grazing incidence XRF, SOLEIL synchrotron, [PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex], metrology, radioactivity, X-rays, REFLECTIVITY, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, photons, [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], ionizing radiation, MESH: Special Issue
Abstract

Proceedings of the 17th European Conference on X-Ray Spectrometry (EXRS), 19-24 June 2016, Gothenburg, Germany.; International audience; A new instrument called CASTOR is operated at the SOLEIL synchrotron facility and is dedicated to the characterization of thin films with thicknesses in the nanometer range. The instrument can combine X-ray reflectivity measurements with fluorescence (XRF) acquisitions and especially total reflection X-ray fluorescence-related techniques such as grazing incidence XRF. The instrument was successfully installed and operated on the two branches of the metrology beamline making possible experiments over a wide range of photon energies (45 eV to 40 keV). A heating sample holder was developed to allow the sample temperature to be controlled up to 300° C. Some examples of the first studies are given to illustrate the capabilities of the setup

Published
2017

18. Experimental determination of L fluorescence yields of gadolinium.

Author

Ménesguen, Yves and Lépy, Marie‐Christine

Subjects
*FLUORESCENCE yield, *GADOLINIUM, *PHOTON beams, *X-rays
Abstract

The fluorescence yields are useful X‐ray atomic fundamental parameters for X‐ray spectrometric purposes but suffer from large tabulated uncertainties, and this is the first time to our knowledge that all three subshell parameters are measured together. We determined the three L partial fluorescence yields and the associated Coster‐Kronig transition probabilities of gadolinium, by selectively ionizing the three L subshells with a tunable monochromatic photon beam. We found ω1 = 0.099(3), ω2 = 0.162(4), and ω3 = 0.159(3) that are in good agreement with tabulated values, but our derived uncertainties are significantly reduced. [ABSTRACT FROM AUTHOR]

Published
2020
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19. Advances in the measurements of the mass attenuation coefficients.

Author

Ménesguen, Yves, Dulieu, Christophe, and Lépy, Marie‐Christine

Subjects
*MASS attenuation coefficients, *X-ray spectroscopy, *FLUORESCENCE yield, *MASS measurement, *X-ray fluorescence, *ATTENUATION coefficients, *HARD X-rays, *SYNCHROTRON radiation
Abstract

The knowledge of atomic fundamental parameters, such as mass attenuation coefficients or fluorescence yields with low uncertainties, is of decisive importance in elemental quantification involving X‐ray fluorescence analysis techniques. Several databases providing the mass attenuation coefficients are accessible and frequently used within a large community of users. These compilations are most often in good agreement for photon energies in the hard X‐ray ranges. However, they significantly differ for low photon energies and around the absorption edges of the elements. Mass attenuation coefficients of several elements were determined experimentally in the photon energy range from 100 eV to 35 keV by using monochromatized radiation at the SOLEIL synchrotron (France). The application of high‐accuracy experimental techniques resulted in low uncertainty mass attenuation coefficients. The results are compared with tabulated data. [ABSTRACT FROM AUTHOR]

Published
2019
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20. Motifs transverses et solitons de cavité dans des microrésonateurs à semiconducteurs pompés optiquement

Author

Ménesguen, Yves, Ménesguen, Yves, Laboratoire de photonique et de nanostructures (LPN), Centre National de la Recherche Scientifique (CNRS), Université Pierre et Marie Curie - Paris VI, and Robert Kuszelewicz

Subjects
[PHYS.PHYS]Physics [physics]/Physics [physics], [PHYS.PHYS.PHYS-ATOM-PH]Physics [physics]/Physics [physics]/Atomic Physics [physics.atom-ph], soliton de cavité, [PHYS.PHYS] Physics [physics]/Physics [physics], [PHYS.PHYS.PHYS-ATOM-PH] Physics [physics]/Physics [physics]/Atomic Physics [physics.atom-ph], optique non-linéaire, VCSEL, optique transverse
Abstract

The work presented in this memory relates to the study of Transverse Optics phenomena and cavity solitons in III-V semiconductor microresonators. Those result from the interaction of an external beam injected into the cavity with the non-linearities of the active material and diffraction. The originality of this work is due to the optical pumping of the vertical cavity semiconductor optical amplifier (VCSOA). First of all, we develop the theoretical aspects of physics brought into play, then the practical and technological aspects concerning the design and the realization of VCSOAs presenting characteristics favorable to the emergence of phenomena of transverse optics. Most of work, either theoretical or technological, relates to the management of the residual heating and the attenuation of its inhibiting effects of the observation of cavity solitons. The experiments presented here show for the first time the formation of transverse patterns and the possibility of writing and erasing in either a coherent and anincoherent way cavity solitons under optical pump regime., Le travail présenté dans ce mémoire concerne l'étude dans les microrésonateurs à semiconducteur III-V des phénomènes d'Optique Transverse que sont les solitons de cavité. Ceux-ci résultent de l'interaction d'un faisceauexterne injecté dans la cavité avec les non-linéarités du matériau actif et la diffraction. L'originalité de ce travail tient au pompage optique de l'amplificateur semiconducteur à cavité verticale (VCSOA). On s'est d'abord attaché à développer les aspects théoriques de la physique mise en jeu, puis les aspects pratiques et technologiques concernant la conception et la réalisation des VCSOAs présentant des caractéristiques favorables à l'émergence de phénomènes d'optique transverse. Une grande partie du travail, que ce soit théorique outechnologique, concerne la maitrîse du chauffage résiduel et l'atténuation de ses effets inhibiteurs de l'observation des solitons de cavité. Les expériences présentées ici montrent pour la première fois la formation de motifs transverses et la possibilité d'écrire et d'effacer de manière cohérente et incohérente des solitons de cavité en régime de pompage optique.

Published
2006

21. Source de photons intriqués en polarisation : travaux pratiques de physique quantique

Author

Ménesguen, Yves, Smirr, Jeanloup, Pillet, Gérard, Alléaume, Romain, Zaquine, Isabelle, Frey, Robert, Jacubowiez, Lionel, Département Traitement du Signal et des Images (TSI), Télécom ParisTech-Centre National de la Recherche Scientifique (CNRS), Laboratoire Traitement et Communication de l'Information (LTCI), Télécom ParisTech-Institut Mines-Télécom [Paris] (IMT)-Centre National de la Recherche Scientifique (CNRS), Télécom ParisTech, Laboratoire Charles Fabry de l'Institut d'Optique / Manolia, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)

Subjects
[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2008

22. Measurement of K fluorescence yields of niobium and rhodium using monochromatic radiation.

Author

Riffaud, Jonathan, Lépy, Marie ‐ Christine, Ménesguen, Yves, and Novikova, Anastasiia

Subjects
RHODIUM isotopes, X-ray fluorescence, MONOCHROMATIC light, RADIOISOTOPES, DOSIMETERS
Abstract

Both reactions Nb-93(n,n′)Nb-93 m and Rh-103(n,n′)Rh-103 m are of particular importance for dosimetry in reactor, and the measurement of the activity of Nb and Rh dosimeters provides the basic data that can be traced back to the reactor operating information. These radionuclides emit only X-rays of which emission intensities in recommended data are determined thanks to the γ-ray transition probabilities and fluorescence yield values. In general, the knowledge of fluorescence yields is rather poor and based on old measurements. Nowadays, the use of tunable monochromatic X-ray sources allows performing optimized measurements. In a first step, accurate values of the attenuation coefficients are measured at the metrology beam line of the SOLEIL synchrotron, using procedures such as optimized for similar measurements. In a second step, the fluorescence yields are determined using experimental approaches in a traditional experimental configuration. For both materials, several incident energies are used to get experimental spectra with energy-dispersive spectrometer. The peaks of interest are processed using the COLEGRAM software, which allows detailed fitting of the peak shape. The K fluorescence yields are derived with about 2% relative uncertainty. Copyright © 2017 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]

Published
2017
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23. Thermal Modeling of Large-Area VCSELs Under Optical Pumping.

Author

Ménesguen, Yves and Kuszelewicz, Robert

Subjects
*LASERS, *LIGHT sources, *THERMAL analysis, *OPTICAL pumping, *ATOMS, *LIGHT
Abstract

An analytical approach is proposed to calculate the stead-state three-dimensional temperature distribution in multi- layered structures, particularly when containing periodic stacks. We apply this model to the case of vertical-cavity surface-emitting lasers under optical pumping and find an excellent agreement with experimental results. [ABSTRACT FROM AUTHOR]

Published
2005
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24. Experimental determination of X-ray atomic fundamental parameters of nickel

Author

Ménesguen, Yves, Lepy, Marie-Christine, Hönicke, Philipp, Müller, Matthias, Unterumsberger, Rainer, Beckhoff, Burkhard, Hoszowska, Joanna, Dousse, Jean-Claude, Blachucki, W, Ito, Y, Yamashita, M, Fukushima, S, Ménesguen, Yves, Lepy, Marie-Christine, Hönicke, Philipp, Müller, Matthias, Unterumsberger, Rainer, Beckhoff, Burkhard, Hoszowska, Joanna, Dousse, Jean-Claude, Blachucki, W, Ito, Y, Yamashita, M, and Fukushima, S

Abstract

X-ray atomic properties of Nickel were investigated in a singular approach that combines different experimental techniques to obtain new and useful reliable values of atomic fundamental parameters for X-ray spectrometric purposes and for comparison to theoretical predictions. We determined the mass attenuation coefficients in an energy range covering the L- and K- absorption edges, the K-shell fluorescence yield and the Kb/Ka and Kb1,3/Ka1,2 transition probability ratios. The obtained line profiles and linewidths of the Ka and Kb transitions in Ni can be considered as the contribution of the satellite lines arising from the [KM] shake processes suggested by Deutsch et al. [1] and Ito et al. [2]. Comparison of the new data with several databases showed a good agreement but also discrepancies were found with existing tabulated values.

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