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The conditions that lead to specific domain configurations and the associated switching characteristics of small permalloy islands were studied by using magnetic force microscopy. The studies involving, in situ applied field similarly revealed the mechanisms of the reversal processes for each of the configurations, which correlated quite well with the values of the switching fields.

A study was conducted to analyze the magnetization distributions of an array of small NiFe elements. Lorentz transmission electron microscopy and magnetic force microscopy were utilized to carry out the analysis. The samples were made using electron beam lithography and lift-off patterning on electron transparent Si3Ni4 membrane substrates. Experimental results indicated different facets of the magnetization distributions on soft magnetic thin films.

A study was conducted to analyze the magnetization reversal process in an array micron sized NiFe patters using magnetic force microscopy during the presence of external fields. The behavior of the magnetization distribution correlated with the aspect ratio and the direction of the applied fields. In addition, magnetic behavior was characterized as an external field applied along the hard axis.