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11 results on '"Lu, Lingyan"'

1. The Factors Influencing Consumer Satisfaction on the 'J' Home E-commerce Platform

Author

Lu, Lingyan, Sattabut, Tatchapong, Meekaewkunchorn, Nusanee, Appolloni, Andrea, Series Editor, Caracciolo, Francesco, Series Editor, Ding, Zhuoqi, Series Editor, Gogas, Periklis, Series Editor, Huang, Gordon, Series Editor, Nartea, Gilbert, Series Editor, Ngo, Thanh, Series Editor, Striełkowski, Wadim, Series Editor, Zhang, Kun, editor, Luo, Hang, editor, Li, Hongbo, editor, and Yassin, Azlina Binti Md, editor

Published
2024
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7. Thermal Characterization of Multi-chip Light Emitting Diodes With Thermal Resistance Matrix

Author

Zou, Huayong, Lu, Lingyan, Wang, Jiaqi, Shieh, Brian, Lee, Shi-wei, Zou, Huayong, Lu, Lingyan, Wang, Jiaqi, Shieh, Brian, and Lee, Shi-wei

Abstract

The junction temperature of LEDs is important for its life, reliability and efficacy. The thermal resistance measurement can be implemented to obtain the junction temperature of a single-chip LED in different power consumptions and different environment temperatures. However, for the multichip applications such as Chip-on-Board (COB), multi-color and high-voltage LED packaging etc., only the average junction temperature can be obtained by the traditional steady thermal resistance measurement. In this paper, a thermal resistance matrix with thermal coupling factor is proposed to obtain the junction temperature of each chip in a multi-chip LED with different chip powers. In the case study, each element of the 4×4 thermal resistance matrix of a Red-Green-Blue-White (RGBW) four-chip LED is tested by a transient thermal tester (T3ster) to investigate the thermal coupling of chips one another. In addition, the thermal distribution of the LED package was analyzed by finite element analysis (FEA) simulation for comparison. It is shown that the thermal resistance matrix is effective for evaluation of junction temperature of each chip in the multi-chip LED package with a discrepancy less than 2.5% from measurement.

Published
2018

11. [Survey of quality of life in the patients with revision endoscopic sinus surgery].

Author

Zhou X, Tao Q, Zhang F, Wang Y, Gao Z, and Lu L

Subjects
Adolescent, Adult, Case-Control Studies, Female, Humans, Male, Middle Aged, Otorhinolaryngologic Surgical Procedures methods, Paranasal Sinuses surgery, Reoperation, Young Adult, Endoscopy, Nasal Polyps surgery, Quality of Life, Sinusitis surgery
Abstract

Objective: To explore the effect of revision endoscopic sinus surgery (RESS) on quality of life in the patients with chronic rhinosinusitis with nasal polyposis (CRSwNP)., Method: To survey and evaluate 60 cases of RESS patients (treatment group) and 120 normal ones with physical examination (Control group) through the medical outcomes survey short form questions (MOS SF-36) and the Sino-Nasal Outcome Test-20 (SNOT-20), and comparison and analysis of the two groups results which we got were carried out., Result: With SF-36 scales for evaluation of quality of life, the results show that: the scores of CRSwNP patients (treatment group) without surgical treatments with RESS were significantly lower than that of the control group(P < 0.05); while use of SNOT-20 scales in evaluation of the preoperative treatment group patients, the results were significantly higher than that of the control group (P < 0.05). While the CRSwNP patients with surgical treatments with RESS for 6 months, not only with SF-36 scales but also with SNOT-20 scales, there was no significant difference between the two groups (P > 0.05)., Conclusion: RESS may obviously improve the clinical symptom of CRSNP patients. The SF-36 and SNOT-20 assessment scales could reflect the patient's QoL change.

Published
2010

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