1. First test beam measurement of the 4D resolution of an RSD pixel matrix connected to a FAST2 ASIC.
- Author
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Menzio, L., Siviero, F., Arcidiacono, R., Cartiglia, N., Costa, M., Croci, T., Ferrero, M., Hanna, C., Lanteri, L., Mazza, S., Mulargia, R., Sadrozinski, H-F.W., Seiden, A., Sola, V., White, R., and Wilder, M.
- Subjects
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PIXELS , *SILICON detectors , *SPATIAL resolution , *TESTING laboratories , *ELECTRON beams - Abstract
This paper presents the measurement of the spatial and temporal resolutions of a Resistive Silicon Detector (RSD) pixel matrix read out by the FAST2 ASIC, a 16-channel fully custom amplifier developed by INFN Torino using a 110 nm CMOS technology. The test was performed at the DESY test beam facility with a 5 GeV/c electron beam. The RSD matrix is composed of seven 450 μ m pitch pixels with cross-shaped electrodes for a total area of about 1.5 mm 2. The position resolution reached is σ x = 14 ± 1 μ m , approximately 3.5% of the pitch, and the temporal resolution is σ t = 49 ± 6 ps. The work demonstrates that RSD sensors with cross-shaped electrodes achieve 100% fill factor and homogeneous resolutions over the whole matrix surface, making them a suitable choice for 4D tracking applications. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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