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13. Investigating the Arc-Shaped Kink Drain Voltage of Drain Current With Capacitance-Voltage Measurement Method in GaN HEMTs

14. The Reliability and Noise Investigation of Boron Diffusion Under Positive Bias Temperature Instability in 16 nm Node High Voltage FinFETs

17. An Extensive Negative Gate Bias Stress Degradation Mechanism in GaN MIS-HEMTs for Aerospace Applications

23. Endocan as a Potential Marker for Predicting All-Cause Mortality in Hemodialysis Patients.

25. Investigation of Threshold Voltage and Drain Current Degradations in Si$_{\text{3}}$N$_{\text{4}}$/AlGaN/GaN MIS-HEMTs Under X-Ray Irradiation

27. Abnormal On Current Tendency in Saturation Region between High and Light Carbon Doped buffer layer in p-GaN HEMT

29. Analysis of Abnormal C–V Hump on Si3N4 MIS-HEMT With Mesa Isolation Under Negative Gate Bias Stress

34. Influence of blood group and von Willebrand factor on population pharmacokinetics and dose individualization of recombinant factor VIII in Taiwanese patients with haemophilia A

35. A tuned vibration absorber constituted of shape memory alloy wires for vibration reduction of platform structures: design and implementation

36. Comparison of the Hot Carrier Degradation of N- and P-Type Fin Field-Effect Transistors in 14-nm Technology Nodes

40. Abnormal Threshold Voltage Degradation Under Semi-On State Stress in Si 3 N 4 /AlGaN/GaN-HEMT.

42. Investigation of Threshold Voltage and Drain Current Degradations in Si3N4/AlGaN/GaN MIS-HEMTs Under X-Ray Irradiation

43. Fostering ecosystem understanding: The synergistic impact of inquiry-based instruction and information literacy.

44. Electricity Generation with the Novel 3D Electrode from Swim Wastewater in a Dual-chamber Microbial Fuel Cell

48. Effect of deposition temperature on electrical properties of one-transistor-one-capacitor (1T1C) FeRAM devices

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