Search

Your search keyword '"Lin, Ching Shun"' showing total 12 results
Start Over Author "Lin, Ching Shun"
12 results on '"Lin, Ching Shun"'

4. Smooth trajectory tracking of three-link robot: a self-organizing CMAC approach

Author

Hwang, Kao-Shing and Lin, Ching-Shun

Subjects
Fuzzy systems -- Models, Neural networks -- Models, Artificial intelligence -- Models, Machine learning -- Models, Robots -- Models, Self-organizing systems -- Models
Abstract

A neuro-fuzzy system which is embedded in the conventional control theory is proposed to tackle physical learning control problems in this paper. The control scheme is composed of two elements. The first element, the fuzzy sliding mode controller (FSMC), is used to drive the state variables to a specific switching hyperplane or a desired trajectory. The second one is developed based on the concept of the self-organizing fuzzy cerebellar model articulation controller (FCMAC) and adaptive heuristic critic (AHC). Both compose a forward compensator to reduce the chattering effect or cancel the influence of system uncertainties. A geometrical explanation on how the FCMAC algorithm works is provided and some refined procedures of the AHC are presented as well. Simulations on smooth motion of three-link robot is given to illustrate the performance and applicability of the proposed control scheme.

Published
1998

12. AC Gate-Drain-Bias Stress Study of amorphous Indium Gallium Zinc Oxide Thin Film Transistors for GOA Applications.

Author

Yang, Chao-Yu, Huang, Shih-Che, Chiu, Hao-Lin, Hsieh, Ting, Yeh, Bo-Liang, Lin, Ching Shun, Liao, Ta-Wen, Tseng, Hsien-Kai, Lin, Chun Nan, and Tsai, Wen Ching

Subjects
THIN film transistors, INDIUM gallium zinc oxide, ELECTRIC currents, ELECTRIC potential, ANALOG circuits
Abstract

This paper investigates the reliability behavior of IGZO TFT with different widths under AC gate and drain stress. Device of larger width suffers from worse current degradation. By comparing the contact resistance after stress such behavior can be attributed to the damaged contact region by large current during stress. [ABSTRACT FROM AUTHOR]

Published
2012
Full Text
View/download PDF

Catalog

Books, media, physical & digital resources
See catalog results