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Background: The search for biomarkers of bipolar disorder (BD), including epigenetic alterations, has heavily relied on peripheral investigations that do not necessarily reflect brain-specific mechanisms. In this study we aimed to assess peripheral extracellular vesicles (EVs)' microRNAs and determine their use as a novel source of biomarkers in BD.Methods: We assessed peripheral blood EVs' microRNAs from 20 patients with BD type I and 21 age- and sex-matched healthy controls by microarray, and further explored the predicted biological functions of significantly differentially expressed microRNAs.Results: Our results identified 33 nominally significant microRNAs (p < 0.05 and fold-change >1.5) altered in BD patients, including miRNAs previously reported to be altered in post-mortem tissues of patients. Pathway analyses identified some brain-relevant mechanisms enriched in these miRNAs, including axon guidance by netrin and the serotonin receptor pathway.Limitations: Relatively small sample size, potential confounding effects of mood states, medication use, and comorbidities, analysis of total rather than brain-specific EVs, and lack of validation of significant miRNAs by other methods.Conclusions: This study provides important preliminary evidence of the potential use of EVs as a novel source of biomarkers in BD. Overall, our findings of brain-relevant mechanisms in these vesicles suggest their potential use in living patients as a peripheral window to the brain. [ABSTRACT FROM AUTHOR]

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Fabrication of nanostructured ZnO thin films is a critical process for many applications based on semiconductor devices. So on understanding of the electrochemical deposition mechanism is also fundamental for knowing the optimal conditions on growth of ZnO nanorods by electrodeposition.In this paper the electrochemical mechanism for ZnO nanorods formation is studied. Results are based on the evolution of the diffusion coefficient using the Cotrell equation, and different growth models proposed by Scharifcker and Hills for nucleation and growth. [ABSTRACT FROM AUTHOR]

The several mathematical formulations of X-ray diffraction theory facilitate its understanding and use as a materials characterization technique, since one can opt for the simplest formulation that adequately describes the case being studied. As synchrotrons advance, new techniques are developed and there is a need for simple formulations to describe them. One of these techniques is soft resonant X-ray diffraction, in which the X-rays suffer large attenuation due to absorption. In this work, an expression is derived for the X-ray diffraction profiles of reflections where the linear absorption is far greater than primary extinction; in other words, the crystal is superabsorbing. The case is considered of a parallel plate crystal, for which the diffraction profile of the superabsorbing crystal is computed as a function of crystal size normal to the diffraction planes. For thin crystals or those with negligible absorption, the diffraction profile of a superabsorbing crystal coincides with the result of the kinematical theory. For thick crystals, the absorption intrinsic profile is obtained, described by a Lorentzian function and characterized by the absorption intrinsic width. This absorption intrinsic width is proportional to the linear absorption coefficient and its expression is similar to that for the Darwin width, while the absorption intrinsic profile is a special case of the Laue dynamical theory, and it is similar to the Ornstein-Zernike Lorentzian. The formulation of X-ray diffraction of superabsorbing crystals is simple and provides new perspectives for the soft resonant X-ray diffraction technique.