7 results on '"Levant, J.-L."'
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2. RFIP method: Towards a better characterization of integrated circuits immunity
3. Automated extraction of the passive distribution network of an integrated circuit for the assessment of conducted electromagnetic emission.
4. Efficiency of Embedded On-Chip EMI Protections to Continuous Harmonic and Fast Transient Pulses with Respect to Substrate Injection.
5. ICEM model extraction: a case study.
6. EMC evaluation in integrated circuits using VHDL-AMS.
7. ICEM: a new standard for EMC of IC definition and examples.
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