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Few-shot classification aims at leveraging knowledge learned in a deep learning model, in order to obtain good classification performance on new problems, where only a few labeled samples per class are available. Recent years have seen a fair number of works in the field, each one introducing their own methodology. A frequent problem, though, is the use of suboptimally trained models as a first building block, leading to doubts about whether proposed approaches bring gains if applied to more sophisticated pretrained models. In this work, we propose a simple way to train such models, with the aim of reaching top performance on multiple standardized benchmarks in the field. This methodology offers a new baseline on which to propose (and fairly compare) new techniques or adapt existing ones.