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Your search keyword '"L. V. KUKHARENKO"' showing total 15 results
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15 results on '"L. V. KUKHARENKO"'

1. USE OF AFM FOR MORPHO-FUNCTIONAL STATE DIAGNOSTICS OF PLATELETS OF PATIENTS WITH ISCHEMIC HEART DISEASE

Author

L. V. Kukharenko, S. A. Chizhik, E. S. Drozd, L. G. Gelis, I. V. Lazareva, and E. A. Medvedeva

Subjects
atomic force microscopy, platelets, ischemic heart disease, Electronics, TK7800-8360
Abstract

Atomic force microscopy was used to identify the early stages of intravascular platelet activation in patients with stable angina and in patients with unstable ischemic heart disease to characterize hemostasiological status of the patients. A comparative analysis of morpho-functional platelet parameters has shown the increase of intravascular platelet activation and the formation of spontaneous platelet aggregates in bloodstream in patients with unstable angina.

Published
2019

2. Atomic force microscopy method in the study of platelets of patients with end-stage of chronic heart failure

Author

L. V. Kukharenko, S. A. Chizhik, E. S. Drozd, M. V. Goltsev, and N. N. Maroz-Vadalazhskaya

Subjects
atomic force microscopy, platelets, end-stage of chronic heart failure, Electronics, TK7800-8360
Abstract

Atomic force microscopy was used to estimate the intravascular platelet activation and determine local elastic modulus, adhesion and stiffness of the platelets membrane in patients with end-stage of chronic heart failure with heart ventricle implantation before surgery and intrasurgical: before the heparin injection, after the heparin injection and after neutralization of heparin with protamine.

Published
2019

4. The influence of a probe on topographical images in atomic force microscopy

Author

M. V. Gol’tsev, L. V. Kukharenko, S. A. Chizhik, V. E. Borisenko, and N. G. Tsirkunova

Subjects
Kelvin probe force microscope, Chemistry, business.industry, technology, industry, and agriculture, Analytical chemistry, Atomic force acoustic microscopy, Conductive atomic force microscopy, Scanning capacitance microscopy, Surfaces, Coatings and Films, Scanning probe microscopy, Optics, Scanning ion-conductance microscopy, Magnetic force microscope, business, Non-contact atomic force microscopy
Abstract

Examples of the errors that arose under the studies of metric characteristics of micro- and nanoobjects with atomic force microscopy (AFM) are presented. Degradation of the tip of the probe both under successive scanning of the same part of a sample surface and in the course of a single scan is revealed. AFM images acquired with the probe having twin apexes located at different levels are demonstrated.

Published
2009
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11. STRUCTURE AND MORPHOLOGY OF NANOSIZED COATING FORMED ON SILICON BY COMPRESSION PLASMA FLOWS

Author

N. N. Cherenda, E. A. Kostukevich, A. A. Kukharenko, A. M. Kuzmitski, N. T. Kvasov, Vladimir V. Uglov, V.M. Anishchik, L. V. Kukharenko, Yu. V. Sveshnikov, and V. M. Astashynski

Subjects
Morphology (linguistics), Materials science, Coating, Silicon, chemistry, engineering, chemistry.chemical_element, Plasma, Composite material, engineering.material, Compression (physics)
Published
2005
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