Search

Your search keyword '"Kwon, Sang Jik"' showing total 292 results
Start Over Author "Kwon, Sang Jik"
292 results on '"Kwon, Sang Jik"'

12. Analyses of All Small Molecule-Based Pentacene/C 60 Organic Photodiodes Using Vacuum Evaporation Method.

Author

Kim, Young Woo, Lee, Dongwoon, Jeon, Yongmin, Yoo, Hocheon, Cho, Eou-Sik, Darici, Ezgi, Park, Young-Jun, Seo, Kang-Il, and Kwon, Sang-Jik

Subjects
PENTACENE, PHOTODIODES, MOLECULAR structure, ELECTRON donors, QUANTUM efficiency, SMALL molecules, COMPLEMENTARY metal oxide semiconductors
Abstract

The vacuum process using small molecule-based organic materials to make organic photodiodes (OPDIs) will provide many promising features, such as well-defined molecular structure, large scalability, process repeatability, and good compatibility for CMOS integration, compared to the widely used Solution process. We present the performance of planar heterojunction OPDIs based on pentacene as the electron donor and C60 as the electron acceptor. In these devices, MoO3 and BCP interfacial layers were interlaced between the electrodes and the active layer as the electron- and hole-blocking layer, respectively. Typically, BCP played a good role in suppressing the dark current by two orders higher than that without that layer. These devices showed a significant dependence of the performance on the thickness of the pentacene. In particular, with the pentacene thickness of 25 nm, an external quantum efficiency at the 360 nm wavelength according to the peak absorption of C60 was enhanced by 1.5 times due to a cavity effect, compared to that of the non-cavity device. This work shows the importance of a vacuum processing approach based on small molecules for OPDIs, and the possibility of improving the performance via the optimization of the device architecture. [ABSTRACT FROM AUTHOR]

Published
2023
Full Text
View/download PDF

16. Argon and Oxygen Gas Flow Rate Dependency of Sputtering-Based Indium-Gallium-Zinc Oxide Thin-Film Transistors.

Author

Han, Youngmin, Lee, Dong Hyun, Cho, Eou-Sik, Kwon, Sang Jik, and Yoo, Hocheon

Subjects
INDIUM gallium zinc oxide, THIN film transistors, GAS flow, X-ray photoelectron spectroscopy, ATOMIC force microscopy, TRANSISTORS, OXYGEN
Abstract

Oxygen vacancies are a major factor that controls the electrical characteristics of the amorphous indium-gallium-zinc oxide transistor (a-IGZO TFT). Oxygen vacancies are affected by the composition ratio of the a-IGZO target and the injected oxygen flow rate. In this study, we fabricated three types of a-IGZO TFTs with different oxygen flow rates and then investigated changes in electrical characteristics. Atomic force microscopy (AFM) was performed to analyze the surface morphology of the a-IGZO films according to the oxygen gas rate. Furthermore, X-ray photoelectron spectroscopy (XPS) analysis was performed to confirm changes in oxygen vacancies of a-IGZO films. The optimized a-IGZO TFT has enhanced electrical characteristics such as carrier mobility (μ) of 12.3 cm2/V·s, on/off ratio of 1.25 × 1010 A/A, subthreshold swing (S.S.) of 3.7 V/dec, and turn-on voltage (Vto) of −3 V. As a result, the optimized a-IGZO TFT has improved electrical characteristics with oxygen vacancies having the highest conductivity. [ABSTRACT FROM AUTHOR]

Published
2023
Full Text
View/download PDF

Catalog

Books, media, physical & digital resources
See catalog results