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Level set estimation (LSE), the problem of identifying the set of input points where a function takes value above (or below) a given threshold, is important in practical applications. When the function is expensive-to-evaluate and black-box, the \textit{straddle} algorithm, which is a representative heuristic for LSE based on Gaussian process models, and its extensions having theoretical guarantees have been developed. However, many of existing methods include a confidence parameter $\beta^{1/2}_t$ that must be specified by the user, and methods that choose $\beta^{1/2}_t$ heuristically do not provide theoretical guarantees. In contrast, theoretically guaranteed values of $\beta^{1/2}_t$ need to be increased depending on the number of iterations and candidate points, and are conservative and not good for practical performance. In this study, we propose a novel method, the \textit{randomized straddle} algorithm, in which $\beta_t$ in the straddle algorithm is replaced by a random sample from the chi-squared distribution with two degrees of freedom. The confidence parameter in the proposed method has the advantages of not needing adjustment, not depending on the number of iterations and candidate points, and not being conservative. Furthermore, we show that the proposed method has theoretical guarantees that depend on the sample complexity and the number of iterations. Finally, we confirm the usefulness of the proposed method through numerical experiments using synthetic and real data., Comment: 21 pages, 4 figures

In material characterization, identifying defective areas on a material surface is fundamental. The conventional approach involves measuring the relevant physical properties point-by-point at the predetermined mesh grid points on the surface and determining the area at which the property does not reach the desired level. To identify defective areas more efficiently, we propose adaptive mapping methods in which measurement resources are used preferentially to detect the boundaries of defective areas. We interpret this problem as an active-learning (AL) of the level set estimation (LSE) problem. The goal of AL-based LSE is to determine the level set of the physical property function defined on the surface with as small number of measurements as possible. Furthermore, to handle the situations in which materials with similar specifications are repeatedly produced, we introduce a transfer learning approach so that the information of previously produced materials can be effectively utilized. As a proof-of-concept, we applied the proposed methods to the red-zone estimation problem of silicon wafers and demonstrated that we could identify the defective areas with significantly lower measurement costs than those of conventional methods.

Complex processes in science and engineering are often formulated as multistage decision-making problems. In this paper, we consider a type of multistage decision-making process called a cascade process. A cascade process is a multistage process in which the output of one stage is used as an input for the subsequent stage. When the cost of each stage is expensive, it is difficult to search for the optimal controllable parameters for each stage exhaustively. To address this problem, we formulate the optimization of the cascade process as an extension of the Bayesian optimization framework and propose two types of acquisition functions based on credible intervals and expected improvement. We investigate the theoretical properties of the proposed acquisition functions and demonstrate their effectiveness through numerical experiments. In addition, we consider an extension called suspension setting in which we are allowed to suspend the cascade process at the middle of the multistage decision-making process that often arises in practical problems. We apply the proposed method in a test problem involving a solar cell simulator, which was the motivation for this study., Comment: 70pages, 7 figures

In this paper, we propose an active learning method for an inverse problem that aims to find an input that achieves a desired structured-output. The proposed method provides new acquisition functions for minimizing the error between the desired structured-output and the prediction of a Gaussian process model, by effectively incorporating the correlation between multiple outputs of the underlying multi-valued black box output functions. The effectiveness of the proposed method is verified by applying it to two synthetic shape search problem and real data. In the real data experiment, we tackle the input parameter search which achieves the desired crystal growth rate in silicon carbide (SiC) crystal growth modeling, that is a problem of materials informatics.