Search

The knowledge of atomic fundamental parameters, such as the fluorescence yields with low uncertainties, is of decisive importance in elemental quantification involving X-ray fluorescence analysis techniques. However, especially for the low-Z elements, the available literature data are either of poor quality, of unknown or very large uncertainty, or both. For this reason, the K-shell fluorescence yield of carbon was determined in the PTB laboratory at the synchrotron radiation facility BESSY II. In addition, theoretical calculations of the same parameter were performed using the multiconfiguration Dirac-Fock method, including relativistic and quantum electrodynamics (QED) corrections. Both values obtained in this work are compared to the corresponding available literature data., Comment: 10 pages, 5 figures

Grazing-Incidence X-ray fluorescence (GIXRF) analysis, which is closely related to total-reflection XRF, is a very powerful technique for the in-depth analysis of many types of technologically relevant samples, e.g. nanoparticle depositions, shallow dopant profiles, thin layered samples or even well-ordered nanostructures. However, the GIXRF based determination of the depth-dependent information about the sample is usually based on a modelling of the experimental data. This requires profound knowledge of the geometrical parameters of the setup employed, especially the incident beam profile as well as the detector aperture parameters. Together they determine the incident angle dependent so-called effective solid angle of detection which must be known in order to model any experimental data set. In this work, we demonstrate how these instrumental parameters, which are typically not known with sufficient accuracy, can be determined using dedicated experiments with a well-known calibration sample. In addition, this paves the way for a full calibration of the setup, as also information about other parameters, e.g. the incident photon flux is gained. Here, we are using a Bruker S4 T-STAR instrument for this demonstration but the principle can also be applied for other GIXRF setups., Comment: 10 pages, 6 figures

With the advent of both modern X-ray fluorescence (XRF) methods and improved analytical reliability requirements the demand for suitable reference samples has increased. Especially in nanotechnology with the very low areal mass depositions, quantification becomes considerably more difficult. However, the availability of suited reference samples is drastically lower than the demand. Physical vapor deposition (PVD) techniques have been enhanced significantly in the last decade driven by the need for extremely precise film parameters in multilayer production. We have applied those techniques for the development of layer-like reference samples with mass depositions in the ng-range and well below. Several types of reference samples were fabricated: multi-elemental layer and extremely low (sub-monolayer) samples for various applications in XRF and total-reflection XRF (TXRF) analysis. Those samples were characterized and compared at three different synchrotron radiation beamlines at the BESSY II electron storage ring employing the reference-free XRF approach based on physically calibrated instrumentation. In addition, the homogeneity of the multi-elemental coatings was checked at the P04 beamline at DESY. The measurements demonstrate the high precision achieved in the manufacturing process as well as the versatility of application fields for the presented reference samples.

For its physics program with a high-intensity hadron beam of up to 2e7 particles/s, the COMPASS experiment at CERN requires tracking of charged particles scattered by very small angles with respect to the incident beam direction. While good resolution in time and space is mandatory, the challenge is imposed by the high beam intensity, requiring radiation-hard detectors which add very little material to the beam path in order to minimize secondary interactions. To this end, a set of triple-GEM detectors with a hybrid readout structure consisting of pixels in the beam region and 2-D strips in the periphery was designed and built. Successful prototype tests proved the performance of this new detector type, showing both extraordinary high rate capability and detection efficiency. The amplitude information allowed to achieve spatial resolutions about a factor of 10 smaller than the pitch and a time resolution close to the theoretical limit imposed by the layout. The PixelGEM central tracking system consisting of five detectors, slightly improved with respect to the prototype, was completely installed in the COMPASS spectrometer in spring 2008.