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Monel (R) alloy 400 has excellent corrosion resistance and finds applications in marine industries. The processing of marine components requires high processing efficiency and a quality finish. Hence, this research aims to investigate the effects of the laser processing parameters such as laser fluence, scanning velocity, hatching distance, and the scanning pass on the ablation rates and efficiency, chemistry, and nanomechanical properties of the Monel (R) alloy 400 after pulsed picosecond (ps) laser ablation. From the experimental findings, the ablation depth increases as the laser fluence increases while decreasing as the scanning velocity increases. Surface roughness was noted to increase as the laser fluence increased. The findings demonstrated that the ablation rate increases as laser fluence increases while ablation efficiency decreases. Energy dispersive x-ray spectroscopy (EDX) showed that the elemental composition of laser-ablated zones is almost similar to that of the polished sample. X-ray spectroscopy (XPS) shows that the outer layer on the surface of Monel (R) alloy 400 is composed of NiO and CuO. The hardness and Young's modulus of the laser-processed alloy were found to be less than those of the bulk material. This study can be used to establish optimal processing parameters for the ultrafast ps laser processing of materials to achieve high ablation efficiency with a high-quality surface finish for industrial applications.

This study investigates the crucial process of cleaning cold field emission electron emitters and scanning tunnel microscopy (STM) probes, particularly focusing on tungsten tips. The cleanliness of these tips is essential for maintaining optimal cathode properties, preventing impurities that can significantly affect the emission process. Various cleaning methods, including macroetching, ammonia cleaning, and hydrofluoric acid (HF) cleaning were explored and compared by scanning electron microscopy. The macroetching method, involving a mixture of hydrochloric acid, nitric acid, and hydrogen fluoride, proved to be too reactive, causing significant material removal and altering the tip's structure. Ammonia cleaning did not significantly improve or harm the samples. However, oxide islands appeared in some areas, suggesting the potential formation of ammonium tungsten oxide. HF cleaning, specifically at 20% and 50% concentrations, demonstrated effectiveness in removing tungsten oxides without damaging the tip. Pre-cleaning with water and ethanol proved beneficial for subsequent HF refinement. Results suggest that HF is the most suitable method for oxide removal but a rinse with water is essential for removing residual sodium hydroxide. To maintain optimal properties, it is crucial to apply a less reactive layer quickly or transfer the tips to a water/ethanol bath to prevent oxidation.

The electrical properties and activation energy of epoxy/graphite flakes (GFs) micro-composite with different content of GFs (0.0625-1 wt%) were studied for electrical properties using Novocontrol Alpha Analyser (10-2 Hz-107 Hz). GFs sizes ranged from (100 nm to 10 mu m). The analysis was performed by scanning electron microscopy (SEM), x-ray photoelectron spectroscopy (XPS), visible spectrum reflectance spectra (VIS) spectra, and Fourier Transform Infrared spectra (FTIR) spectroscopy. Increasing GFs content caused multiple changes in electrical characteristics. At 0.0625 wt%, all electrical properties noticeably increased. But at 0.125 to 0.25 wt%, immobilized nanolayers were formed leading to decreased permittivity, dielectric loss (tan(delta)), quality factor (Q-factor), capacitance, conductivity, and figure of merit (F-factor). At 0.25 wt%, the epoxy microcomposite had lower permittivity, tan(delta), conductivity, and capacitance compared with unfilled epoxy. With 0.5 wt% of GFs, signified the percolation threshold, initiating a rise in permittivity, conductivity, capacitance, and tan(delta), accompanied by the closer proximity of grain boundaries, facilitating the formation of conductive channels. At a concentration of 1 wt% of GFs, the establishment of continuous interfacial conductive pathways resulted in a remarkable augmentation of all dielectric properties. The Cole-Cole analysis has been employed to investigate variations in epoxy/GFs microcomposites based on concentration levels.

This paper reports results of analysis of field ion emission mechanism from tungstenepoxy composite emitters that are compared to tungsten nanofield emitters. In this context, the mechanism of emission from this type of emitters is described based on a theory of induced conductive channels. The tungsten emitters were prepared using the electrochemical polishing technique and coated with a layer of the epoxy resin. Field ion microscope (FIM) analyses are reported including the study of the emissionion density distributions from both the uncoated and coated emitters. Two forms of emission patterns have been observed in the ion emission microscopy technique describing the differences in the emission mechanism of both types of emitters. The observed results show: (a) the expected crystalline surface atomic distribution images of the field ion microscopy in the case of uncoated tungsten tips, and (b) randomly distributed emission spots that describe the locations of the induced conductive channels inside the resin coating layer.

Surface structuring by ultrafast lasers is a promising technique to modify surface-related properties of materials to tailor them for specific applications. In the present study, we experimentally investigated the laser structuring of commercially pure titanium (CP Ti) using ultrafast pulses to understand the role of the laser input parameters on the development of surface morphology, optical properties, surface chemistry, and wettability behaviour. The processed surfaces were characterized by a scanning electron microscope, energy-dispersive X-ray spectroscopy (EDX), Raman microscope, optical microscope, and sessile drop method. Laser-induced periodic surface structures decorated with nanodroplets were noted to be formed on the surface of the laser-structured CP Ti. The surface roughness measurements showed that the laser-structured surfaces had nanoscale roughness values. The EDX and the Raman analyses show that laser-structured surfaces of CP Ti have a thin oxide film. Different colours on different surfaces processed by different laser parameters were observed. The wettability assessment shows that CP Ti can transition from hydrophilic-hydrophobic and vice versa depending on the environmental conditions. This study shows that laser structuring can be utilized to modify CP Ti surfaces to obtain desirable surface properties that can find potential applications in different fields.

The absorption coefficient is an important optical property in characterizing semiconducting materials. It plays a significant role in studying optical characteristics, electrical structure, energy band structure, and the creation/annihilation of excitons when a semiconducting material absorbs electromagnetic radiation. In this study, an enhanced theoretical model will be introduced and applied to characterize thin films prepared from UPR4 (unsaturated polyester resin) single-component epoxy resin, which is important to study the charge flow at the interface of tungsten-UPR4 composite field emission cathodes.

The absorption coefficient plays an important role in studying and characterizing semiconducting materials. It is an important parameter to study the mechanism of photons absorption within the structure of the studied material. Thus, it helps to study the several types of charge carrier transport along with the energy band structure and its defects. In literature, a formula was reported to precisely calculate the absorption coefficient from raw data of transmittance and reflectance of electromagnetic radiation. However, the reported formula has several issues limiting its validity in the literature. In this paper, we provide a more mathematically accurate form of this equation to precisely obtain the absorption coefficient from the raw data, by considering the total internal reflection at the different interfaces. Moreover, the equation is tested by simulated data and is applied to study the optical characteristics of a single-component epoxy resin from its transmittance and reflectance raw data.

In this study, modified epoxy nanocomposite was produced by incorporating SiO2 nanoparticles of 15–30 nm in size, with different concentrations ranging from 1 to 20 wt%. The electrical properties of the epoxy nanocomposite were measured at room temperature in the frequency range of 102–107 Hz. To determine the impact of nanoparticles on the epoxy composition, scanning electron microscopy-energy dispersive x-ray spectroscopy (SEM-EDS), Fourier transform infrared spectra (FTIR) spectroscopy, and Raman spectroscopy were conducted. With an increase in filler (SiO2 nanoparticles) content, the electrical characteristics of the epoxy nanocomposite exhibited multiple changes. At low concentrations, all electrical properties experienced a notable increase. The epoxy with 15 wt% of SiO2 nanoparticles samples had a lower permittivity, loss number, conductivity, and capacitance than the unfilled epoxy. At medium concentrations (5 to 15 wt%), the formation of immobilized nanolayers has an impact on permittivity, loss number, conductivity, and capacitance, which have decreased; impedance and modulus increased. The initiation of contact between the nanofillers at a concentration of 20 wt% leads to the formation of continuous interfacial conductive pathways, resulting in a dramatic increase in the permittivity, conductivity, and capacitance of the composites, while concurrently reducing impedance.

This paper studies the performance of differenttypes of graphite cathodes when operated as field emissionelectron sources. The tested cathodes were prepared in theform of bulk polymer graphite, bulk pure graphite, and polymergraphite coated with thin layer of insulating material(epoxy resin). The obtained results include X-Ray photoelectronspectroscopy analysis, scanning electron micrographs, the fieldemission microscope patterns and current-voltage characteristics,and the orthodoxy test analysis results. The importance of thisstudy is summarized in following the pursuit of finding cheapand green electron sources. Moreover, to present a new exoticfield emission behavior in the form of emission pulses.

In the presented work, we report the dielectricbehavior of epoxy–silicon oxide composites in the temperaturerange 240– 300 K, over the frequency range 10-2 Hz – 107 Hz. Themeasuring apparatus was based on the Novocontrol AlphaAnalyser and the measured data were analyzed and interpretedusing the Havriliak – Negami equation. The master curves of thereal part of permittivity and the dielectric loss number wereobtained by time–temperature superposition principle, and theresults showed that the nano-composite had a much higher lossfactor. Through the analysis of the origin of the dielectric responsein epoxy/silica composite, the reason for the different dielectricrelaxation behaviors of the nano-composite, and the pure epoxywas discussed.

In field electron emission (FE) studies, interpretation of measured current–voltage characteristics and extraction of emitter characterization parameters are usually carried out within the framework of “smooth planar metal-like emitter (SPME) methodology”, using a data-analysis plot. This methodology was originally introduced in the 1920s. Three main data-plot types now exist: Millikan–Lauritsen (ML) plots, Fowler–Nordheim (FN) plots, and Murphy–Good (MG) plots. ML plots were commonly used in early FE studies, but most modern analysis uses FN plots. MG plots are a recent introduction. Theoretically, it is now known that ML and FN plots are predicted to be slightly curved in SPME methodology, but a Murphy–Good plot will be very nearly straight. Hence (because 1956 Murphy–Good emission theory is “better physics” than 1928 Fowler–Nordheim emission theory as corrected in 1929), expectation is that parameter extraction using a MG plot will be more precise than extraction using either ML plots or FN plots. In technological FE studies, current–voltage characteristics are often converted into other forms. Thus, measured voltage may be converted to (apparent) macroscopic field, and/or current values may be converted to macroscopic current densities. Thus, four data-input forms can be found in the context of analysing FE current–voltage results. It is also the case that over-simplified models of measurement-system behaviour are very widely assumed, and the question of whether simple use of a data-analysis plot is a valid data-interpretation procedure for the particular system under investigation has often been neglected. Past published studies on field emitter materials development appear to contain a high incidence of spurious values for the emitter characterization parameter “characteristic field enhancement factor”. A procedure (the so-called “Orthodoxy Test”) was described in 2013 that allows a validity check on measurement-system behaviour, and found that around 40% of a

This research aims to obtain a more in-depth understanding of the field emission properties of tungsten single-tip field emitters (STFEs) coated with a several tens of nanometer thin barrier of Al2O3. The introduction of an additional barrier into the metal-vacuum interface system of the emitter can be beneficial to improve its performance. The tungsten emitters were prepared using a two-step electrochemical drop-off etching technique. Thin oxide barrier coatings were prepared by using low-temperature atomic layer deposition (ALD), a chemical vapor deposition technique. Field emission was studied in an internally developed field emission microscope (FEM) working in UHV vacuum (< 1·10−7 Pa), and the experimental field emission data were analyzed by the so-called Murphy-Good plotsThe value of the local work function of the grown oxide layer were investigated using Ultra-violet photoelectron spectroscopy (UPS).

This paper focuses on the research and development of a suitable method for creating a selective emitter for the visible and near-infrared region to be able to work optimally together with silicon photovoltaic cells in a thermophotovoltaic system. The aim was to develop a new method to create very fine structures beyond the conventional standard (nanostructures), which will increase the emissivity of the base material for it to match the needs of a selective emitter for the VIS and NIR region. Available methods were used to create the nanostructures, from which we eliminated all unsuitable methods; for the selected method, we established the optimal procedure and parameters for their creation. The development of the emitter nanostructures included the necessary substrate pretreatments, where great emphasis was placed on material purity and surface roughness. Tungsten was purposely chosen as the main material for the formation of the nanostructures; we verified the effect of the formed structure on the resulting emissivity. This work presents a new method for the formation of nanostructures, which are not commonly formed in such fineness; by this, it opens the way to new possibilities for achieving the desired selectivity of the thermophotovoltaic emitter.

Modern material science often makes use of polyvinylidene fluoride thin films because of various properties, like a high thermal and chemical stability, or a ferroelectric, pyroelectric and piezoelectric activity. Fibers of this polymer material are, on the other hand, much less explored due to various issues presented by the fibrous form. By introducing carbon nanotubes via electrospinning, it is possible to affect the chemical and electrical properties of the resulting composite. In the case of this paper, the focus was on the further improvement of interesting polyvinylidene fluoride properties by incorporating carbon nanotubes, such as changing the concentration of crystalline phases and the resulting increase of the dielectric constant and conductivity. These changes in properties have been explored by several methods that focused on a structural, chemical and electrical point of view. The resulting obtained data have been documented to create a basis for further research and to increase the overall understanding of the properties and usability of polyvinylidene fluoride fiber composites.

The method of inclusion of various additives into a polymer depends highly on the material in question and the desired effect. In the case of this paper, nitride salts were introduced into polyvinylidene fluoride fibers prepared by electrospinning. The resulting changes in the structural, chemical and electrical properties of the samples were observed and compared using SEM-EDX, DSC, XPS, FTIR, Raman spectroscopy and electrical measurements. The observed results displayed a grouping of parameters by electronegativity and possibly the molecular mass of the additive salts. We virtually demonstrated elimination of the presence of the -phase by addition of Mg(NO3)2, Ca(NO3)2, and Zn(NO3)2 salts. The trend of electrical properties to follow the electronegativity of the nitrate salt cation is demonstrated. The performed measurements of nitrate salt inclusions into PVDF offer a new insight into effects of previously unstudied structures of PVDF composites, opening new potential possibilities of crystalline phase control of the composite and use in further research and component design.