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Your search keyword '"Kim, Hoonki"' showing total 32 results

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1. Breakthrough Design Technology Co-optimization using BSPDN and Standard Cell Variants for Maximizing Block-level PPA

5. 24.3 A 3nm Gate-All-Around SRAM Featuring an Adaptive Dual-BL and an Adaptive Cell-Power Assist Circuit

11. A 7nm FinFET SRAM using EUV lithography with dual write-driver-assist circuitry for low-voltage applications

12. An ultra-dense irradiation test structure with a NAND/NOR readout chain for characterizing soft error rates of 14nm combinational logic circuits

13. Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

14. 12.2 A 7nm FinFET SRAM macro using EUV lithography for peripheral repair analysis

15. A 10 nm FinFET 128 Mb SRAM With Assist Adjustment System for Power, Performance, and Area Optimization

16. Bitline Charge-Recycling SRAM Write Assist Circuitry for $V_{\mathrm{MIN}}$ Improvement and Energy Saving.

26. A 0.4-mW, 4.7-ps Resolution Single-Loop $\Delta \Sigma $ TDC Using a Half-Delay Time Integrator.

32. An Energy Efficient VPP Generator With Fast Ramp-Up Time for Mobile DRAM.

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