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We developed an ultrafast time-resolved magneto-optical (MO) imaging system with several millidegree resolution of light polarization angle, 100 fs time-resolution, and a micrometer spatial resolution. A CCD camera with about 10(6) pixels is used for detection and MO images with an absolute angle of the light polarization are acquired by the rotating analyzer method. By optimizing the analysis procedure with a least square method and the help of graphical processor units, this novel system significantly improves the speed for MO imaging, allowing to obtain a MO map of a sample within 15 s. To demonstrate the strength of the technique, we applied the method in a pump-and-probe experiment of all-optical switching in a GdFeCo sample in which we were able to detect temporal evolution of the MO images with sub-picosecond resolution.

We report the creation and real-space observation of magnetic structures with well-defined topological properties and a lateral size as low as about 150 nm. They are generated in a thin ferrimagnetic film by ultrashort single optical laser pulses. Thanks to their topological properties, such structures can be classified as Skyrmions of a particular type that does not require an externally applied magnetic field for stabilization. Besides Skyrmions, we are able to generate magnetic features with topological characteristics that can be tuned by changing the laser fluence. The stability of such features is accounted for by an analytical model based on the interplay between the exchange and the magnetic dipole-dipole interactions.

We demonstrate the feasibility of element-specific probing of ultrafast spin dynamics in the multisublattice magnet TbFe in the visible spectral range. In particular, we show that one can selectively study the dynamics of Tb and Fe sublattices choosing the wavelength of light below and above 610 nm, respectively. We observe that, despite their antiferromagnetic coupling in the ground state, the Tb and Fe spins temporarily align ferromagnetically after excitation with an intense 55-fs laser pulse, after which they relax to their initial states due to the strong anisotropy in Tb.

Using magneto-optical microscopy in combination with ellipsometry measurements, we show that all-optical switching with polarized femtosecond laser pulses in ferrimagnetic GdFeCo is subjected to a threshold fluence absorbed in the magnetic layer, independent of either the excitation wavelength or the polarization of the laser pulse. Furthermore, we present a quantitative explanation of the intensity window in which all-optical helicity-dependent switching (AO-HDS) occurs, based on magnetic circular dichroism. This explanation is consistent with all the experimental findings on AO-HDS so far, varying from single- to multiple-shot experiments. The presented results give a solid understanding of the origin of AO-HDS, and give novel insights into the physics of ultrafast, laser controlled magnetism.

We investigated the damage mechanism of MoN/SiN multilayer XUV optics under two extreme conditions: thermal annealing and irradiation with single shot intense XUV pulses from the free-electron laser facility in Hamburg - FLASH. The damage was studied "post-mortem" by means of X-ray diffraction, interference-polarizing optical microscopy, atomic force microscopy, and scanning transmission electron microscopy. Although the timescale of the damage processes and the damage threshold temperatures were different (in the case of annealing it was the dissociation temperature of Mo2N and in the case of XUV irradiation it was the melting temperature of MoN) the main damage mechanism is very similar: molecular dissociation and the formation of N2, leading to bubbles inside the multilayer structure.

We present a new technique for the characterization of non-Gaussian laser beams which cannot be described by an analytical formula. As a generalization of the beam spot area we apply and refine the definition of so called effective area (A(eff)) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which is inappropriate for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft X-ray free-electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination are presented in this work. An F-scan method, newly developed in this paper, appears to be a good candidate for the spatial beam diagnostics applicable to lasers of various kinds.

We investigated single shot damage of Mo/Si multilayer coatings exposed to the intense fs XUV radiation at the Free-electron LASer facility in Hamburg - FLASH. The interaction process was studied in situ by XUV reflectometry, time resolved optical microscopy, and "post-mortem" by interference-polarizing optical microscopy (with Nomarski contrast), atomic force microscopy, and scanning transmission electron microcopy. An ultrafast molybdenum silicide formation due to enhanced atomic diffusion in melted silicon has been determined to be the key process in the damage mechanism. The influence of the energy diffusion on the damage process was estimated. The results are of significance for the design of multilayer optics for a new generation of pulsed (from atto- to nanosecond) XUV sources.

We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 microJ, 5 Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) - PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of < or =1 microm. Observations were correlated with simulations of best focus to provide further relevant information.