9 results on '"Keem, Taeho"'
Search Results
2. Removing nonlinearity of a homodyne interferometer by adjusting the gains of its quadrature detector systems
3. Nonlinear and hysteretic influence of piezoelectric actuators in AFMs on lateral dimension measurement
4. Measuring and compensating for 5-DOF parasitic motion errors in translation stages using Twyman–Green interferometry
5. Thermal stabilization for accurate dimensional measurement using gallium
6. Research on pitch analysis methods for calibration of one-dimensional grating standard based on nanometrological AFM
7. The interference effect in an optical beam deflection detection system of a dynamic mode AFM
8. Sub-hundred nanometre pitch measurements using an AFM with differential laser interferometers for designing usable lateral scales
9. Research on pitch analysis methods for calibration of one-dimensional grating standard based on nanometrological AFM.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.