173 results on '"Kagoshima Y"'
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2. X-Ray Magnetic Microspectroscopy Using the Circularly Polarized Undulator Radiation at the TRISTAN Accumulation Ring
3. The Development of Synchrotron Radiation Sources and X-Ray Microscopy at the Photon Factory
4. New Version Soft X-Ray Microscope at the Photon Factory
5. Real-time measurement of rocking curves during MOVPE growth of Ga xIn 1−xP/GaAs
6. In situ observation of step-terrace structures on MOVPE grown InP(0 0 1) by using grazing X-ray scattering
7. Estimation of bonded silicon-on-insulator wafers by means of diffractometry using a parallel X-ray microbeam
8. Measurement of minute local strain in semiconductor materials and electronic devices by using a highly parallel X-ray microbeam
9. Unusual photoelectron angular distribution of Kish graphite
10. Two-dimensional angular distribution of photoemission spectra from the valence band of 1T-TaS2
11. The Development of Synchrotron Radiation Sources and X-Ray Microscopy at the Photon Factory
12. New Version Soft X-Ray Microscope at the Photon Factory
13. Microscopic strain analysis of semiconductor crystals using a synchrotron X-ray microbeam
14. Real-time observation of surface morphology of indium phosphide MOVPE growth with using X-ray reflectivity technique
15. Study of local strain distribution in semiconductor devices using high-resolution X-ray microbeam diffractometry
16. Rocking curve measurements of infrared LEDs using highly parallel X-ray microbeam
17. Scanning hard X-ray microscope with tantalum phase zone plate at the Hyogo-BL (BL24XU) of SPring-8
18. Hyogo beamline at SPring-8: multiple station beamline with the TROIKA concept
19. Constant-pitch microprism-array optical device for beam condensers in hard x-ray synchrotron radiation beamlines.
20. In situ observation of superstructures on InP(0 0 1) surface under hydrogen atmospheric environment with using grazing incidence X-ray diffraction
21. Magnetic domain-specific microspectroscopy with a scanning X-ray microscope using circularly polarized undulator radiation
22. High-resolution x-ray diffraction analysis of epitaxially grown indium phosphide nanowires.
23. X-Ray Contact Microscopy of Human Chromosomes and Human Fibroblasts
24. A Zone Plate Soft X-Ray Microscope Using Undulator Radiation at the Photon Factory
25. Hard X-ray multilayer zone plate with 25-nm outermost zone width
26. Preclinical characterization and antitumor efficacy of DS-6051b, a novel, orally available small molecule tyrosine kinase inhibitor of ROS1 and NTRKs
27. X-ray topography using the forward transmitted beam under multiple-beam diffraction conditions
28. 87 - Preclinical characterization and antitumor efficacy of DS-6051b, a novel, orally available small molecule tyrosine kinase inhibitor of ROS1 and NTRKs
29. Development of real-time x-ray microtomography system
30. New x-ray nanofocusing devices based on total-reflection zone plates
31. Development of Multilayer Laue Lenses; (2) Circular Type
32. Development of Multilayer Laue Lenses; (1) Linear Type
33. New Nanoscale Imaging with a Simple Hard X-Ray Nanoslit
34. Investigation of minute strain in silicon on insulator and strained-silicon/silicon–germanium/silicon-substrate semiconductor materials using a synchrotron radiation X-ray microbeam
35. Crystallinity estimation of area-selective Ge epitaxial layer grown on Si substrate by means of high-resolution X-ray microdiffraction
36. Real-time synchrotron radiation X-ray diffraction and abnormal temperature dependence of photoluminescence from erbium silicates on SiO2/Si substrates
37. Fast X-ray micro-CT for real-time 4D observation
38. Development of a total reflection double-slit for evaluation of spatial coherence in hard X-ray region
39. Mo/Si and MoSi2/Si nanostructures for multilayer Laue lens
40. Performance test of Mo/Si and MoSi2/Si multilayer Laue lenses
41. Real-time observation of formation of indium phosphide nanowires by means of GISAXS
42. Inhomogeneous strain in thin silicon films analyzed by grazing incidence x-ray diffraction
43. Estimation of lattice structure of strained-Si wafers using highly parallel X-ray microbeam (II)
44. Estimation of lattice structure of strained-Si wafers using highly parallel X-ray microbeam (I)
45. In situ observation of step-terrace structures on MOVPE grown InP(001) by using grazing X-ray scattering
46. Hard X-ray phase-contrast microscope for observing transparent specimens
47. Real-time observation of surface morphology at nanometer scale using x-ray specular reflection
48. High-resolution hard X-ray phase-contrast microscope for observing transparent biological specimens
49. A New Apparatus for Hard X-Ray Micro-Imaging and Microdiffraction Experiments at BL24XU of SPring-8.
50. Real-time phase-contrast x-ray imaging using two-dimensionally expanded synchrotron radiation x-rays at the BL24XU (Hyogo-BL) of the SPring-8.
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