12 results on '"Jurczyk, Jerzy"'
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2. XRF Analysis of Microsamples of Semiconductor Type Multielement Materials by the Thin Layer Method. Determination of Cr, Co, Ni, Cu, Zn, Ga, Se, Sb, Yb
3. Anwendung der RFA in der Schwarzmetallurgie
4. Aluminiumbestimmung in der Eisenhüttenindustrie: Benzoatverfahren in Verbindung mit der chelometrischen Titration
5. Beitrag zur chelatometrischen Calcium- und Magnesiumbestimmung in Manganerzen
6. Multielement XRF Semimicroanalysis of Pb(Zr,Ti)O 3 Type Ferroelectric Ceramic Materials Doped with Pb(Nb,Mn)O 3 and Bi 2 O 3 by the Thin Layer Method
7. X-ray fluorescence solution semi-microanalysis of the luminophore type materials using scattered radiation and attenuation coefficients
8. Determination of absorption correction by the ‘two masses’ method for XRF analysis of intermediate samples
9. Beitrag zur Yttriumbestimmung in Stahl und Chrom/Nickel-Legierungen mit Wellendispersiver Röntgenfluorescenz — Abtrennung der Matrix
10. Multielement XRF Semimicroanalysis of Pb(Zr,Ti)O3 Type Ferroelectric Ceramic Materials Doped with Pb(Nb,Mn)O3 and Bi2O3 by the Thin Layer Method.
11. Determination of absorption correction by the two masses method for XRF analysis of intermediate samples
12. Aluminiumbestimmung in der Eisenhüttenindustrie
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