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46 results on '"Ju Young-Chul"'

17. The Monitoring System of Photovoltaic Module using Fault Diagnosis Sensor

Author

Ju Young-Chul, Park Yuna, Jang， Gilsoo, Ko Suk-Whan, Kang Gi-Hwan, and Kim， Soo-Hyun

Subjects
060102 archaeology, business.industry, Computer science, 020209 energy, Embedded system, Photovoltaic system, 0202 electrical engineering, electronic engineering, information engineering, 0601 history and archaeology, Monitoring system, 06 humanities and the arts, 02 engineering and technology, business, Fault (power engineering)
Published
2016
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18. Estimation of Output Power for PV Module with Damaged Bypass Diode using MATLAB

Author

Chang Hyo-Sik, Ju Young-Chul, Kang Gi-Hwan, Go Seokhwan, and Shin Woo-Gyun

Subjects
Engineering, business.industry, 020209 energy, P v curve, 02 engineering and technology, 021001 nanoscience & nanotechnology, Power (physics), 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Matlab simulation, 0210 nano-technology, business, MATLAB, computer, Diode, computer.programming_language
Published
2016
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44. Genetic Diversity and Phylogenetic Relationship in Korean Strains of Lentinus lepideus Based on PCR Polymorphism

Author

Lee, Jae-Seong, primary, Cho, Hae-Jin, additional, Yoon, Ki-Nam, additional, Alam, Nuhu, additional, Lee, Kyung-Lim, additional, Shim, Mi-Ja, additional, Lee, Min-Woong, additional, Lee, Yun-Hae, additional, Jang, Myoung-Jun, additional, Ju, Young-Chul, additional, Cheong, Jong-Chun, additional, Shin, Pyung-Gyun, additional, Yoo, Young-Bok, additional, Lee, U-Youn, additional, and Lee, Tae-Soo, additional

Published
2010
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45. A Study of the Electrical Output and Reliability Characteristics of the Crystalline Photovoltaic Module According to the Front Materials.

Author

Lim, Jong Rok, Shin, Woo Gyun, Lee, Chung Geun, Lee, Yong Gyu, Ju, Young Chul, Ko, Suk Whan, Kim, Jung Dong, Kang, Gi Hwan, and Hwang, Hyemi

Subjects
BUILDING-integrated photovoltaic systems, MATERIALS testing, RELIABILITY in engineering, MATERIALS
Abstract

In recent years, various types of installations such as floating photovoltaic (PV) and agri-voltaic systems, and BIPV (building integrated photovoltaic system) have been implemented in PV systems and, accordingly, there is a growing demand for new PV designs and materials. In particular, in order to install a PV module in a building, it is important to reduce the weight of the module. The PV module in which low-iron, tempered glass is applied to the front surface, which is generally used, has excellent electrical output and reliability characteristics; however, it is heavy. In order to reduce the weight of the PV module, it is necessary to use a film or plastic-based material, as opposed to low-iron, tempered glass, on the front surface. However, if a material other than glass is used on the front of the PV module, various problems such as reduced electrical output and reduced reliability may occur. Therefore, in this paper, a PV module using a film instead of glass as the front surface was fabricated, and a characteristic analysis and reliability test were conducted. First, the transmittance and UV characteristics of each material were tested, and one-cell and 24-cell PV modules were fabricated and tested for electrical output and reliability. From the results, it was found that the transmittance and UV characteristics of the front material were excellent. In addition, the electrical output and reliability test results confirmed that the front-surface film was appropriate for use in a PV module. [ABSTRACT FROM AUTHOR]

Published
2021
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46. Origin of Bypass Diode Fault in c-Si Photovoltaic Modules: Leakage Current under High Surrounding Temperature.

Author

Shin, Woo Gyun, Ko, Suk Whan, Song, Hyung Jun, Ju, Young Chul, Hwang, Hye Mi, and Kang, Gi Hwan

Subjects
PHOTOVOLTAIC power generation, SCHOTTKY barrier diodes, ELECTRIC potential, HIGH temperatures, SEMICONDUCTORS
Abstract

Bypass diodes have been widely utilized in crystalline silicon (c-Si) photovoltaic (PV) modules to maximize the output of a PV module array under partially shaded conditions. A Schottky diode is used as the bypass diode in c-Si PV modules due to its low operating voltage. In this work, we systematically investigated the origin of bypass diode faults in c-Si PV modules operated outdoors. The temperature of the inner junction box where the bypass diode is installed increases as the ambient temperature increases. Its temperature rises to over 70 °C on sunny days in summer. As the temperature of the junction box increases from 25 to 70 °C, the leakage current increases up to 35 times under a reverse voltage of 15 V. As a result of the high leakage current of the bypass diode at high temperature, melt down of the junction barrier between the metal and semiconductor has been observed in damaged diodes collected from abnormally functioning PV modules. Thus, it is believed that the constant leakage current applied to the junction caused the melting of the junction, thereby resulting in a failure of both the bypass diode and the c-Si PV module. [ABSTRACT FROM AUTHOR]

Published
2018
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