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Originally published in 1952, The Government of British Trade Unions analyses the government, in theory and in practice, of one of Britain's most important labour organizations – The Transport and General Works Union in the first half of the 20th Century. It is an appraisal of the role of the rank and file within this union of over one million members, to determine both the opportunity for, and the extent of their participation in, this State within a State. Original sources and materials, which had not previously been made public in relation to any major British or American Trade Union, were used to ascertain member turnover, participation in elections, attendance at Branch meetings and the effect of the repeal of the Trade Disputes Act on Labour Party membership. The study is of great interest both for the light it throws on the general question of Trade Unions in the modern State, and for its analysis of the Transport and General Works Union itself.

Eines der Standardwerke der Vipassana-Meditation. Jack Kornfield und Joseph Goldstein - weltweit bekannte und geachtete Meister der Einsichts-Meditation - geben uns in diesem Buch eine klare, für jedermann zugängliche Einführung in die meditative Vipassana-Praxis, die durch Übung der Achtsamkeit zu tieferer Einsicht führt. In diesem Buch beleuchten sie die theoretischen und praktischen Aspekte der meditativen Praxis, kombiniert mit Anleitungen, die zu einer unmittelbaren Erfahrung dieser Aspekte führen. Stimmen zum Buch:'Eine überaus gekonnte Mischung praktischer Anleitungen, psychologischer Einsichten und unsterblicher Weisheit. Dieses ist eines der nützlichsten Handbücher für jene, die den Weg der Einsichts-Meditation gehen und daraus Gewinn für ihr alltägliches Leben ziehen möchten.'Daniel Goleman

This modern classic on Buddhist meditation will help you further your practice and understanding of foundational Buddhist teachings This modern spiritual classic, presented as a thirty-day meditation retreat taught by Joseph Goldstein, offers timeless practical instructions and real-world advice for practicing meditation—whether walking or sitting in formal practice or engaging in everyday life. Goldstein—a beloved and respected meditation teacher who studied for many years under the guidance of eminent Buddhist teachers from India, Tibet, and Burma—uses the retreat format to explain various basic Buddhist teachings including karma, selflessness, and the four noble truths, while also drawing connections to many different spiritual traditions. Full of clear and practical instruction, The Experience of Insight is the perfect companion for both experienced practitioners and those looking to get into meditation for the first time.

La mente contiene en sí misma las semillas de su propio despertar, semillas que hemos de cultivar para poder obtener los frutos de una vida vivida conscientemente. Joseph Goldstein comparte en este libro la sabiduría de sus cuatro décadas de práctica y de enseñanza. Su fuente es el Satipatthana Sutta, el legendario discurso del Buda sobre los cuatro fundamentos de la atención plena que se convirtió en la base de los diferentes tipos de meditación Vipassana existentes en la actualidad. Exquisito en los detalles y al mismo tiempo totalmente accesible para el estudiante moderno, el presente texto será un valioso tesoro para toda persona interesada en vivir conscientemente y en la realización de su libertad interior.

This book has its origins in the intensive short courses on scanning elec­ tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con­ tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro­ ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan­ ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol­ ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol­ ume, including those on magnetic contrast and electron channeling con­ trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel­ opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.

Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the'physics of the processes'and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter­ actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru­ ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High­ resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop­ ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the'phi rho z'[Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of'dot mapping'to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.

From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter of the 1950s to the advanced semiconductor detectors and programmable spectrometersoftoday. Becauseofthesedevelopments, thecapabilities and relative merits of EDS and WDS techniques have been a recurring feature of microprobeconferences for nearly40 years, and this volume bringstogetherthepapers presented at the Chuck Fiori Memorial Symposium, held at the Microbeam Analysis Society Meeting of 1993. Several themes are apparent in this rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension. Light element analysis has long been a goal of microprobe analysts since Ray Dolby first detected K radiation with a gas proportional counter in 1960. WDS techniques (using carbon lead stearate films) were not used for this purpose until four years later. Now synthetic multilayers provide the best dispersive elements for quantitative light element analy­ sis-still used in conjunction with a gas counter.

During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in'hands-on'learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.

In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and “through-the-lens” detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.

One of America's foremost Buddhist teachers shares a “wise and mature vision of Buddhism [that is] destined to be a classic”—preface by the Dalai Lama (Jack Kornfield).Buddhism has evolved in various ways across time and geography. Now, as a genuine Western Buddhism takes root on American soil, Buddhist teacher Joseph Goldstein explores its unique traditions as well as its essential adherence to the universal principles of mindfulness, loving-kindness, and nonattachment. In One Dharma, Goldstein distills a lifetime of practice and teaching, including his years at the renowned Insight Meditation Society, to present a groundbreaking, contemporary vision of Buddhism.

Love, compassion, and peace - these words are at the heart of all spiritual endeavors. Although we intuitively resonate with their meaning and value, for most of us, the challenge is how to embody what we know: how to transform these words into a vibrant, living practice. In these times of conflict and uncertainty, this transformation is far more than an abstract ideal; it is an urgent necessity. Peace in the world begins with us. This wonderfully appealing offering from one the most trusted elders of Buddhism in the West is a warm and engaging exploration of the ways we can cultivate and manifest peace as wise and skillful action in the world. This charming book is illuminated throughout with lively, joyous, and sometimes even funny citations from a host of contemporary and ancient sources - from the poetry of W.S. Merwin and Galway Kinnell to the haiku of Issa and the great poet-monk Ryokan, from the luminous aspirations of Saint Francis of Assisi to the sage advice of Thich Nhat Hanh and the Dalai Lama.

Two popular American Buddhist teachers provide an overview of insight meditation, offering a “skillful blend of pragmatic instruction, psychological insight, and perennial wisdom” (Daniel Goleman, author of Emotional Intelligence)In Seeking the Heart of Wisdom, Joseph Goldstein and Jack Kornfield present the central teachings and practices of insight meditation in a clear and personal language. The path of insight meditation is a journey of understanding our bodies, our minds, and our lives, of seeing clearly the true nature of experience. The authors guide the reader in developing the openness and compassion that are at the heart of this spiritual practice. For those already treading the path, as well as those just starting out, this book will be a welcome companion along the way. Among the topics covered are: • The hindrances to meditation—ranging from doubt and fear to painful knees—and skillful means of overcoming them • How compassion can arise in response to the suffering we see in our own lives and in the world • How to integrate a life of responsible action and service with a meditative life based on non-attachmentUseful exercises are presented alongside the teachings to help readers deepen their understanding of the subjects.