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Low power consumption, real-time computing, and high reliability are three key requirements/design objectives of real-time embedded systems. The standby-sparing technique can improve system reliability while it might increase the temperature of the system beyond safe limits. In this paper, we propose a thermal-aware standby-sparing (TASS) technique that aims at maximizing the Quality of Service (QoS) of soft real-time tasks, which is defined as a function of the finishing time of running tasks. The proposed technique tolerates permanent and transient faults for multicore real-time embedded systems while meeting the Thermal Safe Power (TSP) as the core-level power constraint, which avoids thermal emergencies in on-chip systems. Our TASS proposed method provides an opportunity to remove the overlaps of the execution of main and backup tasks to prevent extra power consumption due to applying the fault-tolerant technique. Meanwhile, in order to maximize the QoS, we employ a heterogeneous platform to execute the main tasks as soon as possible on high-performance cores with more power budget. Experiments show that our proposed method improves QoS up to 39.78% (on average by 18.40%) and reduces the peak power consumption and temperature by up to 40.21% and 15.47C (on average 28.31% and 13.60C), respectively, at runtime, while keeping the system reliability at the required level.

Multicore platforms are becoming the dominant trend in designing Mixed-Criticality Systems, which integrate applications of different levels of criticality into the same platform. The availability of multiple cores on a single chip provides opportunities to employ fault-tolerant techniques, to ensure the reliability of MCSs. However, applying fault-tolerant techniques increases the power consumption on the chip, and thereby, on-chip temperatures might increase beyond safe limits. To prevent thermal emergencies, urgent countermeasures, like DVFS or DPM will be triggered to cool down the chip. Such countermeasures, however, might not only lead to suspending low-criticality tasks, but also might lead to violating timing constraints of high-criticality tasks. Therefore, it is indispensable to consider a temperature constraint within the scheduling process of fault-tolerant MCSs. Therefore, this paper presents, for the first time, a thermal-aware scheduling scheme for fault-tolerant MCSs, named TherMa-MiCs, which satisfies the temperature constraint jointly with the timing constraints of the high-criticality tasks, while attempting to maximize the QoS of low-criticality tasks under the predefined constraints. At the same time, a reliability target is satisfied by employing the well-known N-Modular Redundancy fault-tolerant technique. Experimental results show that our proposed scheme meets the temperature and timing constraints, while at the same time, improving the QoS of low-criticality tasks, with an average of 44%.

Printed Electronics (PE) exhibits on-demand, extremely low-cost hardware due to its additive manufacturing process, enabling machine learning (ML) applications for domains that feature ultra-low cost, conformity, and non-toxicity requirements that silicon-based systems cannot deliver. Nevertheless, large feature sizes in PE prohibit the realization of complex printed ML circuits. In this work, we present, for the first time, an automated printed-aware software/hardware co-design framework that exploits approximate computing principles to enable ultra-resource constrained printed multilayer perceptrons (MLPs). Our evaluation demonstrates that, compared to the state-of-the-art baseline, our circuits feature on average 6x (5.7x) lower area (power) and less than 1% accuracy loss., Accepted for publication by IEEE Transactions on Computers, February 2023

FeFET is a promising technology for non-volatile on-chip memories. It is rapidly attracting an ever-increasing attention from industry. The advantage of FeFETs is full compatibility with the existing CMOS process beside their low power consumption. To enable ultra-dense memories, 1-FeFET AND arrays were proposed in which a memory cell is formed from a single FeFET. All access transistors, which are traditionally needed to operate memory cells, are removed. This imposes a new reliability challenge due to indirect write disturbances. In this work, we are the first to investigate the reliability of FeFET memories from device to system level. We develop a unified model capturing the impact of both indirect disturbances and direct writes on the reliability of FeFET cells. We then investigate different array sizes, write voltages, write methods under the effect of a wide range of workloads using CPU cache as an example of on-chip memory. We demonstrate that indirect write disturbances are the dominate effect degrading the reliability of FeFET memories. For most cells, it contributes over 90% to the overall induced degradation. This provides guidelines for researchers at both device and circuit levels to optimize the FeFET reliability further, while considering the hidden impact of workloads.

Recent breakthroughs in Neural Networks (NNs) led to significant accuracy improvements. This accuracy improvement comes at the cost of immense increase in computation demands. NNs became one of the most common and computationally intensive workloads in today's datacenters. To address these computational demands, Google announced in 2016 the Tensor Processing Unit (TPU), an advanced custom ASIC accelerator for NN inference. Two new TPU versions (v2 and v3) followed that support also training. Google TPUv3 packs immense processing power in a tiny and condensed area, leading to very high on-chip power densities and thus excessive temperature. In this work, superlattice thermoelectric cooling, which is one of the emerging on-chip cooling, is considered as an advanced cooling example for Google TPU and we investigate the impact of Negative Capacitance FET (NCFET) on the cooling and efficiency of TPU. Our results demonstrate that NCFET can significantly minimize the required cooling-cost. We explore all NCFET configurations including the thickness of the ferroelectric layer of NCFET, the operating voltage, cooling, and the operating frequency, in addition to all possible FinFET's configurations. Moreover, our experimental evaluation shows that by eliminating the cooling cost, NCFET delivers 2.8x higher efficiency compared to the conventional FinFET baseline.

Temperature rising is an unavoidable effect on VLSI and has always been a critical issue in any system-on-chip – especially when targeting compute-intensive applications. This effect increases the delay in hardware accelerators, resulting in timing errors due to unsustainable clock frequency, whose impact must be carefully evaluated on design time to measure the performance degradation of the hardware accelerator. Many algorithms, such as in multimedia and machine learning applications, are capable of tolerating hardware errors. Yet, these algorithms have a dynamic behavior (i.e., closed-loop) where a timing error can be propagated, affecting subsequent steps. Measuring the degradation-induced errors in these applications is very challenging given that an accurate gate-level simulation to investigate degradation-induced timing errors needs to be coupled dynamically with a system-level simulator to unveil how induced errors in the underlying hardware ultimately impact the algorithm execution in the hardware accelerator. This is the first work to achieve this goal. State-of-the-art works have studied accelerators under timing-errors when removing (or narrowing) guardbands. However, their approach was suitable only for open-loop hardware accelerators which are entirely agnostic of complex interactions of the algorithms. This paper investigates temperature- and aging-induced timing-errors in the joint accelerator-algorithm interactions and their runtime impacts. Our framework investigates aging effects across the different layers starting from transistor physics all the way up to the algorithm layer. The hardware accelerator employed as a case study in this work is the sum of absolute differences (SAD), which is the most compute-intensive accelerator on commercial video encoder for mobile applications. Our results demonstrate the runtime behavior impacts of three advanced block-matching algorithms of the video encoder in a joint operation by a SAD accelerator under timing-errors induced by temperature and aging effects considering a 14nm FinFET technology.

Voltage over-scaling (VOS) optimizes energy while causing timing errors due to an unsustainable clock frequency. Many algorithms, such as in multimedia and machine learning applications, are capable of tolerating such errors. VOS has never been investigated in hardware accelerators running closed-loop algorithms. As the errors impact most decisions and actions in the subsequent steps, closed-loops dynamically change the execution flow. Timing errors should be evaluated by an accurate gate-level simulation, but a large gap still remains: how these timing errors propagate from the underlying hardware all the way up to the entire algorithm run, where they just may degrade the performance and quality of service of the application at stake? This paper tackles this issue showing a framework for VOS investigation, embracing any kind of application. Our framework simulates the VOS-induced timing errors at gate-level, dynamically linking the hardware result with the algorithm and vice versa during the evolution of the runtime of the application. The state-of-the-art VOS literature for video encoding application fails to assess the ultimate impacts of VOS-induced timing errors, as current works open the encoding loops. Unlike those, our work investigates the ultimate impact of a hardware accelerator dynamically carrying through to the video encoder all VOS-induced timing errors and preserving the full compliance to the standard. We employ a parallel sum of absolute differences (SAD) hardware accelerator as a case study. We assess the performance of the overall encoder under varying timing guardbands. Next, it is demonstrated that, under VOS, the ultimate impact in compression efficiency is related to the video’s motion intensity. Additionally, the advantages of timing guardband controlled reduction are clearly quantified in our results by virtue of the framework. Reducing at maximum 9.5% the clock frequency, energy savings (up to 16.5% in energy/operation) are achieved in SAD for video compression.

This paper introduces a methodology to use the thermal side channel as a proxy for the behavior of embedded processors to detect changes in this behavior in a cyber-physical system. Such changes may be due to software attacks, hardware attacks, and altered processors. Since control system processes are periodic computations, the thermal side channel signals exhibit a temporal pattern. This enables detection of altered code and changed device characteristics. We present a machine learning approach to estimate the activity of the embedded device from the time sequence of thermal images and show the extent that deviations from expected behavior can be detected. The approach is validated on a testbed of a multi-core processor running a periodic computational code. The infrared imager directly collects thermal imagery from the processor, which is cooled from the backside. While an external infrared imager is used in this study, it is desirable to deploy a finite number of on-chip temperature sensors. This paper shows that integrating on-chip temperature sensors allows robust real-time monitoring of the processor behavior. Finally, we also offer a machine learning approach to find the optimal locations of the on-chip sensors to aid detection.

Parallel prefix adder topologies suffer from carry chains forming critical paths, limiting the performance and therefore the efficiency. We study approximation methods that offload the lower-part of calculation to an approximate unit and shorten the carry chain. We derive their accuracy models using probability theory. These models can replace Monte Carlo simulations. Furthermore, they can reveal better accuracy trade-offs without going through the RTL design, synthesis, and simulation of each unit and approximation level individually. Thus, they can eliminate the required design and simulation time and effort. After analyzing area-wise comparisons at varying number of approximated bits, we show that choosing a design that outperforms the others probabilistically also outperforms them in terms of accuracy, power, and performance trade-offs.

Emerging non-volatile memory yields, alongside many advantages, technical shortcomings, such as reduced cell lifetime. Although many wear-leveling approaches exist to extend the lifetime of such memories, usually a trade-off for the granularity of wear-leveling has to be made. Due to iterative write schemes (repeatedly sense and write), wear-out of memory in certain systems is directly dependent on the written bit value and thus can be highly imbalanced, requiring dedicated bit-wise wear-leveling. Such a bit-wise wear-leveling so far has only be proposed together with a special hardware support. However, if no dedicated hardware solutions are available, especially for commercial off-the-shelf systems with non-volatile memories, a software solution can be crucial for the system lifetime. In this work, we propose entirely software-based bit-wise wearleveling, where the position of bits within CPU words in main memory is rotated on a regular basis. We leverage the LLVM intermediate representation to adjust load and store operations of the application with a custom compiler pass. Experimental evaluation shows that the lifetime by applying local rotation within the CPU word can be extended by a factor of up to 21×. We also show that our method can incorporate with coarser-grained wear-leveling, e.g. on block granularity and assist achievement of higher lifetime improvements.

For the first time, we demonstrate an optimization technique to synthesize circuits in the Negative Capacitance FET (NCFET) technology. NCFET is a rapidly emerging technology to replace the currently employed CMOS technology due to its profound ability to overcome the fundamental limit in scaling along with its full compatibility with the existing fabrication process. This is achieved by replacing the traditional transistor gate dielectric with a ferroelectric layer that manifests itself as a Negative Capacitance (NC), which magnifies the electric field. As a result, NCFET-based circuits can operate at a higher clock frequency without the need to increase the operating voltage. NC breaks one of the fundamental laws in physics in which the total capacitance of two capacitors connected in series becomes larger–instead of smaller in ordinary capacitors– than each of them. This could lead to sub-optimal netlists, suffering from significant increase in dynamic power and IR-drops. To suppress that, we employ the relation between delay decrease and capacitance increase of gates w.r.t ferroelectric thickness. Our technique takes an optimized netlist, obtained from commercial EDA tools, and then selectively determines the optimal ferroelectric thickness for each gate in the netlist, so that the maximum performance provided by NCFET is still achieved while the dynamic power is considerably decreased (45% on average), i.e., no trade-offs . Particularly, our technique enables the full exploitation of the performance benefits originating by NCFET, at a significantly lower (power) cost. Compared to state of the art, our technique decreases the energy-delay-product of circuits by 25% on average and reduces the deleterious effects of IR-drop by 56%. Hence, efficiency and reliability of circuits are improved without any loss in the obtained performance from NCFET.

Multi-/many-core, homogeneous or heterogeneous architectures, using the existing CMOS technology are inevitably approaching the limit of attainable power efficiency due to the fundamental limits in scaling. Negative Capacitance Field-Effect Transistor (NCFET) is rapidly emerging as an alternative technology that promises a multi-fold increase in the power efficiency of transistors, yet is compatible with the existing CMOS fabrication process. NCFET incorporates a ferroelectric (FE) layer within the transistor's gate stack, which exhibits a negative capacitance effect amplifying the internal voltage. NCFET has been in detail studied in both physics and devices/circuits communities where its superiority has been demonstrated in semiconductor measurements. However, the full promise of NCFET remains unmodeled and unquantified unless the research is further continued to the microarchitecture and system levels. This article, for the first time, explores system- and application-level benefits of NCFET-based multi-/many-core designs in terms of performance and power-efficiency compared to state-of-the-art FinFET-based designs. This exploration is done first through analytical modeling in which we extend Amdahl's law for NCFET multi-/many-cores, and then through quantitative modeling. The latter is achieved through RTL- and system-level simulations of NCFET-based multi-cores. The analytical modeling shows that a novel type of technology-based heterogeneity in which cores with the same microarchitecture but different FE thickness are combined is highly beneficial. Our exploration shows that this novel heterogeneity increases the power-efficiency by up to 3.5× over homogeneous systems and even achieves 8.3% better performance and 20% higher power-efficiency than conventional heterogeneity in the microarchitecture without having to cope with the complexity of managing different microarchitectures.

With the rise of Approximate Computing as an energy-efficient design paradigm that is amenable to error-tolerant applications, different Approximate Logic Synthesis (ALS) techniques have been reported in the literature to generate approximate circuits from accurate implementations automatically. One ALS technique focuses on performing structural netlist transformations. The gate-level netlist representation of a circuit is simplified to reduce the circuit area and power consumption while producing a defined error level at the output. However, currently, there is no framework or tool available to test and explore existing netlist transformation techniques for ALS. This limits the proposal of novel approaches and their corresponding comparison against state-of-the-art contributions. In this brief, we present AxLS, an open-source framework for ALS techniques based on netlist transformations. We validate our framework’s functionality by implementing a reported ALS technique and one proposed, using open-source circuit synthesis and simulation tools, and generating approximate arithmetic circuits from accurate RTL descriptions.

On-demand cooling is inevitable to maximize the processor’s performance, while fulfilling thermal constraints—this holds more in advanced technologies, where localized hotspots change during runtime. In this work, we propose to adopt an array of thin-film thermoelectric (TE) devices, which is integrated within the chip packaging, for both cooling and energy-harvesting purposes. Each TE device within the array can be during the runtime enabled either for energy harvesting or on-demand cooling. Our approach is implemented and evaluated using a mature finite elements analysis tool in which a commercial multicore mobile chip is modeled after careful calibrations together with state-of-the-art TE devices. Results demonstrate that our approach reduces the peak temperature by up to 24 $^\circ C$∘C and the average temperature by 10 $^\circ C$∘C across various benchmarks with the cost of 67.5 mW. Additionally, the harvested energy from the array of TE devices compensates for 89% of the required cooling energy.

Approximate computing trades off computation accuracy against energy efficiency. The extent of approximation tolerance, however, significantly varies with a change in input characteristics and applications. We propose a novel cross-layer approach for the synthesis of runtime accuracy-configurable hardware that minimizes energy consumption at area expense. To that end, first, we explore instantiating multiple hardware blocks in the architecture with different fixed approximation levels. These blocks can be selected dynamically and thus allow to configure the accuracy during runtime. They benefit from having fewer transistors and also synthesis relaxations in contrast to state-of-the-art gating mechanisms that only switch off a group of paths of the circuit. Our cross-layer approach combines instantiating such blocks in the architecture with area-efficient gating mechanisms that reduce toggling activity, creating a fine-grained design-time knob on energy versus area. We present a systematic methodology to explore this joint design space and find energy–area optimal solutions as a function of required accuracies, their utilization in the workload, together with hardware parameters: dynamic power savings, area of the hardware block, and leakage of the technology. Examining total energy savings for a range of circuits under different workloads and accuracy tolerances shows that our method finds Pareto-optimal solutions providing up to 32% and 60% energy savings compared to state-of-the-art accuracy-configurable gating mechanism and an exact hardware block, respectively, at $2\times $ area cost.

Deep Neural Networks (DNNs) are being heavily utilized in modern applications and are putting energy-constraint devices to the test. To bypass high energy consumption issues, approximate computing has been employed in DNN accelerators to balance out the accuracy-energy reduction trade-off. However, the approximation-induced accuracy loss can be very high and drastically degrade the performance of the DNN. Therefore, there is a need for a fine-grain mechanism that would assign specific DNN operations to approximation in order to maintain acceptable DNN accuracy, while also achieving low energy consumption. In this paper, we present an automated framework for weight-to-approximation mapping enabling formal property exploration for approximate DNN accelerators. At the MAC unit level, our experimental evaluation surpassed already energy-efficient mappings by more than $\times2$ in terms of energy gains, while also supporting significantly more fine-grain control over the introduced approximation., Accepted for publication at the International Conference on Compilers, Architectures, and Synthesis for Embedded Systems (CASES) 2022. Will appear as part of the ESWEEK-TCAD special issue

In this article, we present a novel post-silicon approach to locating the dominant heat sources on commercial multicore processors using heatmaps measured via an infrared (IR) thermal imaging setup. To locate the heat sources, 2-D spatial Laplacian transformation is performed on the heatmaps followed by $K$ -means clustering to find the dominant power/heat-source clusters. This is an exclusively post-silicon approach that does not require any knowledge of the underlying design of the commercial chips other than the information that is publicly available. Since the identified clusters are the thermally vulnerable areas on the die, we then propose a machine-learning-based framework to deriving a thermal model capable of estimating their temperatures during online use. Our approach involves collecting transient temperature data of the aforementioned heat sources and synchronized high-level performance metrics from the chip, and training a long-short-term-memory (LSTM) neural network (NN) that uses the performance metrics as inputs to estimate the temperatures of the identified heat sources in real time. Since the model is meant for real-time use, we explore methods of reducing the performance overhead and inference time of the model. This includes a novel power correlation-based approach to identifying the thermally irrelevant performance metrics and eliminating them in order to reduce the input dimensionality of the model, and an analysis on network sizing to determine the ideal NN configuration for the problem at hand. The model is trained and tested exclusively using measured thermal data from commercial multicore processors. The experimental results from two Intel multicore processors (i5-3337U and i7-8650U) show that the proposed approach achieves very high accuracy (root-mean-square error: 0.55 °C–0.93 °C) in estimating the temperatures of all the identified heat sources on the chip.

Approximate computing is established as a design alternative to improve the energy requirements of a vast number of applications, leveraging their intrinsic error tolerance. Voltage over-scaling (VOS) is one of the most energy-efficient approximation techniques, but its exploitation is still limited due to the large errors it induces. In this work, we investigate, for the first time, the resiliency of negative capacitance transistor (NCFET) technology to VOS in comparison to conventional CMOS technology. Our work reveals that circuits implemented using the NCFET technology exhibit much less timing errors under VOS due to the inherent voltage amplification provided by the ferroelectric layer. NCFET is one of the very promising emerging technologies that is rapidly evolving for low-power circuit as it enables the transistors to switch faster without the need to increase the voltage. We demonstrate how NCFET technology allows circuit designers to effectively employ VOS to boost the efficiency of their approximate circuits, while still keeping the induced errors marginal. Our analysis shows that the VOS-resilience of NCFET circuits enables maximizing the voltage decrease and thus, NCFET based VOS approximate circuits achieve from $1.83\times$ up to $2.78\times$ higher energy reduction compared to the corresponding FinFET circuits for the same error bounds.

This is the first work to investigate the impact that Negative Capacitance Field-Effect Transistor (NCFET) brings on the efficiency and accuracy of future Neural Networks (NN). NCFET is at the forefront of emerging technologies, especially after it has become compatible with the existing fabrication process of CMOS. Neural Network inference accelerators are becoming ubiquitous in modern SoCs and there is an ever-increasing demand for tighter and tighter throughput constraints and lower energy consumption. To explore the benefits that NCFET brings to NN inference regarding frequency, energy, and accuracy, we investigate different configurations of the multiply-add (MADD) circuit, which is the core computational unit in any NN accelerator. We demonstrate that, compared to the baseline 7nm FinFET technology, its negative capacitance counterpart reduces the energy by 55%, without any frequency reduction. In addition, it enables leveraging higher computational precision, which results to a considerable improvement in the inference accuracy. Importantly, the achieved accuracy improvement comes also together with a significant energy reduction and without any loss in frequency.

Partially reconfigurable designs on field-programmable gate array (FPGA) bring an opportunity for developers to license third-party intellectual property (IP) cores. There are multiple IP licensing models that can be used by the FPGA IP market. Their focus is mainly on feasibility and security; however, two major challenges have been ignored by almost all of them. First, both academic or industrial tools do not provide a flow to generate IPs in a standalone environment. Second, these tools only offer manual floorplanning of the IPs, which is both time and performance inefficient. In this work, we present a framework, that can be used by multiple parties to generate different parts of a design independently, that are compatible with each other. It also provides automatic floorplanning based on mixed-integer linear programming (MILP) that considers the distribution of heterogeneous resources in modern FPGAs, with efficient resource utilization as the main objective. The proposed floorplanning is evaluated with benchmarks from the related work. Furthermore, a use case of internal and open-source designs is used for the validation and evaluation of the independent IP generation and the floorplanner.

Current research in the area of Neural Networks (NN) has resulted in performance advancements for a variety of complex problems. Especially, embedded system applications rely more and more on the utilization of convolutional NNs to provide services such as image/audio classification and object detection. The core arithmetic computation performed during NN inference is the multiply-accumulate (MAC) operation. In order to meet tighter and tighter throughput constraints, NN accelerators integrate thousands of MAC units resulting in a significant increase in power consumption. Approximate computing is established as a design alternative to improve the efficiency of computing systems by trading computational accuracy for high energy savings. In this work, we bring approximate computing principles and NN inference together by designing NN specific approximate multipliers that feature multiple accuracy levels at run-time. We propose a time-efficient automated framework for mapping the NN weights to the accuracy levels of the approximate reconfigurable accelerator. The proposed weight-oriented approximation mapping is able to satisfy tight accuracy loss thresholds, while significantly reducing energy consumption without any need for intensive NN retraining. Our approach is evaluated against several NNs demonstrating that it delivers high energy savings (17.8% on average) with a minimal loss in inference accuracy (0.5%).

Neural processing units (NPUs) are becoming an integral part in all modern computing systems due to their substantial role in accelerating neural networks (NNs). The significant improvements in cost-energy-performance stem from the massive array of multiply accumulate (MAC) units that remarkably boosts the throughput of NN inference. In this work, we are the first to investigate the thermal challenges that NPUs bring, revealing how MAC arrays, which form the heart of any NPU, impose serious thermal bottlenecks to on-chip systems due to their excessive power densities. For the first time, we explore: 1) the effectiveness of precision scaling and frequency scaling (FS) in temperature reductions and 2) how advanced on-chip cooling using superlattice thin-film thermoelectric (TE) open doors for new tradeoffs between temperature, throughput, cooling cost, and inference accuracy in NPU chips. Our work unveils that hybrid thermal management , which composes different means to reduce the NPU temperature, is a key. To achieve that, we propose and implement PFS-TE technique that couples precision and FS together with superlattice TE cooling for effective NPU thermal management. Using commercial signoff tools, we obtain accurate power and timing analysis of MAC arrays after a full-chip design is performed based on 14-nm Intel FinFET technology. Then, multiphysics simulations using finite-element methods are carried out for accurate heat simulations in the presence and absence of on-chip cooling. Afterward, comprehensive design-space exploration is presented to demonstrate the Pareto frontier and the existing tradeoffs between temperature reductions, power overheads due to cooling, throughput, and inference accuracy. Using a wide range of NNs trained for image classification, experimental results demonstrate that our novel NPU thermal management increases the inference efficiency (TOPS/Joule) by $1.33\times $ , $1.87\times $ , and $2\times $ under different temperature constraints; 105 °C, 85 °C, and 70 °C, respectively, while the average accuracy drops merely from 89.0% to 85.5%.

We demonstrate a novel technique that employs transistor short-term aging effects in integrated circuits (ICs) to detect hardware Trojans in embedded systems. In advanced technology nodes (≤ 45 nm), voltage scaling in combination with short-term aging opens doors for short-term degradations. The induced short-term degradations result in dynamic variation of delays along various paths within the IC. Aging degradation generated under fast voltage switching from high to low results in bit errors at the circuit output. Our experiments use short-term aging-aware standard cell libraries to show the effectiveness of short-term aging to detect hardware Trojans. We extract a rich set of features that capture bit error patterns at the outputs of the IC. We use a one class SVM-based classifier that uses these features to learn the distribution of bit errors at the outputs of a clean IC. We discern the deviation in the pattern of bit errors due to a Trojan in the IC from the baseline distribution. To reiterate, the method uses the model of a clean IC. Furthermore, it is robust against chip-to-chip variations. We illustrate the technique on six Trojans from Trust-Hub spanning two cryptographic chips and an embedded PIC microcontroller. Our approach detects Trojans with an accuracy ≥ 95%. It is easier to detect Trojans in an optimized-netlist circuit as more paths are close to the critical path. Even when the circuit is not optimized (i.e., when very few paths are close to the critical path), short-term aging plus mild overclocking can detect Trojans with high accuracy.

Many power management algorithms demand accurate and fine-grained runtime estimations of dynamic core power. In the absence of fine-grained power sensors, model-based estimations are needed. Such power models commonly approximate the switching activity of logic gates using performance counters while assuming a linear performance counter/power relation at a fixed frequency and voltage. It has been shown that this relation cannot be captured accurately enough with purely linear models and that well-established nonlinear modeling techniques, e.g., polynomial modeling, easily overfit the underlying performance/power relations. Although neural-network-based modeling has shown to accurately capture nonlinear relations, it has a large training and inference overhead which is too high for fine-grained models on core-level and estimation rates in the range of 1–10 kHz. We propose a methodology for nonlinear transformation of specific performance counters to increase power modeling accuracy at constant frequency and voltage with a relatively low overhead for both model generation and run-time application over a linear model. Furthermore, we use least-angle regression (LARS) to determine a ranking of the performance counter inputs for use in linear and nonlinear modeling and show that the transformed performance counters are better suited for power modeling. The generated dynamic power model consisting of a nonlinear transformation block and a linear regression block reduces relative estimation error on average by 4% and in worst-case scenarios by 7% compared to state-of-the-art fine-grained linear power models. Compared to a state-of-the-art polynomial regression model our proposed approach reduces the relative estimation error by 10% in worst-case scenarios.

Power and energy consumption are the key optimization goals in all modern processors. Negative capacitance field-effect transistors (NCFETs) are a leading emerging technology that promises outstanding performance in addition to better energy efficiency. The thickness of the added ferroelectric layer as well as frequency and voltage are the key parameters that impact the power and energy of NCFET-based processors in addition to the characteristics of runtime workloads. Unlike existing CMOS technologies, operating NCFET-based processors at a higher frequency than the required minimum can result in power/energy minimization. The optimal operating point, however, strongly depends on dynamic workload characteristics and technology parameters. In this work, we propose and implement the first NCFET-aware power and energy management approach that minimizes the processor’s power and energy through optimal voltage/frequency selection under different runtime scenarios. Such an NCFET-aware approach does not result in any tradeoff between power/energy and performance. Instead, it can achieve higher performance while minimizing energy. A comprehensive, simulation-based evaluation of our runtime management under realistic workloads demonstrates up to 58% energy saving with $2.1\times $ higher performance, and 46% power saving compared to conventional NCFET-unaware management techniques, over the total execution of a benchmark. Compared to state-of-the-art NCFET-aware management techniques, our technique provides up to 49% energy saving and 32% power saving.

A cross-layer design space exploration (DSE) method based on a proposed co-simulation technique is presented herein. The proposed method is demonstrated evaluating the impacts on both coding efficiency and power dissipation of applying distinct approximate logic operators in a s $\mu {\mathrm{ m}}$ of absolute differences (SAD) kernel that accelerates an H.265/HEVC (high-efficiency video coding) encoder. The proposed method simulates the gate-level circuit dynamically inside the application, with realistic results of the impact of the adder-tree approximate logic implementation on both quality and encoder bit-rate results. A comprehensive DSE is shown herein, with 13 types of 6 classes of approximate adders in the SAD accelerator hardware blocks. Over 3,000 logic variants of approximations at gate-level were developed. Actual video sequences as inputs to the x265 software encoder are co-simulated, to dynamically capture the video motion-estimation (ME) behavior in the presence of logic approximations. While the prior art that only estimates the impact of the approximate logic on power, area, and quality on static designs with statistical assumptions, which are agnostic to the actual algorithm data-dependent behavior in the application, our method explores accurately the trade-off between power dissipation and coding efficiency dynamically over the entire HEVC encoding. Our approach shows that the lower-part-or and error-tolerant adder I approximate adders, as well as truncation-to-zero deliver better compression-power trade-offs, with substantial differences from the static analysis.

Self-heating effect (SHE) is a major reliability concern in current and upcoming technology nodes due to its ability to increase the channel’s temperature of transistor and leading to degradations in the key electrical characteristics such as carrier mobility. In this brief, we study SHE in a full processor at the 7nm FinFET technology node. This is the first work to analyze the impact that executed workloads on top of processors have on stimulating SHE. As matter of fact, SHE in transistors is driven by the workload-induced switching activities. When it comes to evaluating SHE, state of the art typically assumes that the switching frequency $f_{sw}$ and operating clock frequency $f_{clk}$ of a circuit are the same, concluding that SHE is not a concern in digital circuits that operate in the GHz-range like processors. After analysis a wide range of workloads, our investigation revealed that the majority of transistors in the processor’s netlist exhibit a switching frequency in the kHz-range even though the processor’s clock is in the GHz-range. This is because that the majority of transistors are within the data paths and hence their switching is driven by the workload data and not by the clock itself. In addition, we also demonstrate for the first time the important role that the duty cycle (on-/off-ratio) induced by the running workload has on modeling SHE. All in all, the relatively low switching activities together with skewed duty cycles induce a wide variety in channel temperatures. Thus, highlighting the importance of considering the workload when studying SHE.

The massive number of Internet-of-Things (IoT) devices generates a hard-to-manage volume of data. Cloud-centric processing approaches for the IoT data suffer from high and unpredictable network latency, which causes poor experience in real-time IoT applications, such as healthcare. To address this issue, in edge computing, the data inference starts from the data source (i.e., the IoT devices). However, the constrained computational capabilities of the IoT device and the power-hungry data transmission demand a tradeoff between onboard processing and computation offloading. Hence, the IoT information inference requires efficient and lightweight techniques that are tailored for this tradeoff and respect the constrained resources on IoT devices, such as wearables. This article presents a hierarchical classification approach that decomposes the problem into three classifiers in two hierarchy layers. In the first layer, a lightweight classifier executes directly on the IoT device and decides whether to offload the computation to the gateway or to perform it onboard. The second layer comprises a lightweight classifier on the IoT device (can only distinguish a subset of classes) and a complex classifier on the gateway (to distinguish the remaining classes). The experimental results (using a real-world data set for human activity recognition and implemented on a wearable IoT device) show higher accuracy (92% on average) than a nonhierarchical classifier (87% on average). The execution time and power measurements on the IoT device show $3\times $ energy saving for the classification.

Dynamic thermal management (DTM) techniques are being widely used for attenuation of thermal hot spots in many-core systems. Conventionally, DTM techniques are analyzed using simulation and emulation methods, which are in-exhaustive due to their inherent limitations and cannot provide for a comprehensive comparison between DTM techniques owing to the wide range of corresponding design parameters. In order to handle the above discrepancies, we propose to use model checking, a state-space-based formal method, to model, evaluate, and compare DTM techniques across various functional and performance parameters. The suggested framework includes a modeling flow and a set of generic modules that realistically model many-core and DTM parameters like temperature, power, application, intercore communication and task migration, etc. For analysis purpose, the framework provides a common ground for comparing DTM techniques by formalizing DTM principles and performance parameters as a set of logical properties. These properties are verified for different task load configurations, e.g., multithreaded, malleable, and the applications which do not support migration. We analyze state-of-the-art central (c-) and distributed (d-) DTM techniques to demonstrate the generality and efficacy of our approach. Our formal analysis shows that the state-of-the-art cDTM technique performs better than dDTM in terms of achieving thermal stability, task migration, and communication overhead. We believe that conventional analysis methods do not facilitate such an exhaustive comparison among the DTM techniques.

Although manycore processors have plenty of cores, not all of them may run simultaneously at full speed and even some of them might need to be power-gated in order to keep the chip within safe temperature limits. Hence, a resource management technique, that allocates cores to application aiming at maximizing the system performance, will not be able to achieve its goal without taking into account the on-chip temperature and its impact on the availability of the chip's resources. However, considering a temperature constraint by the resource management will further increase its complexity, especially in manycores, and thus implementing it in a centralized scheme might lead to a computation bottleneck and a single point of failure. To avoid such scenarios, it is inevitable to distribute the computation required by the resource management technique throughout the chip. In this article, we propose a distributed resource management technique that considers temperature as an essential factor in allocating cores to applications and determining the power states of these cores and their voltage/frequency levels, while taking into account the performance models of the applications in order to maximize the overall system performance under a temperature constraint. Our proposed technique employs, for the first time, combinatorial auctions within an agent system to achieve the targeted goal in a distributed manner. The experimental evaluations show that our proposed technique achieves significant performance improvements with an average of 41% compared to several distributed resource management techniques.