Search

X-ray microspectroscopy is a powerful analytical method in geoscientific and environmental research as it provides a unique combination of nanoscale imaging with high spectroscopic sensitivity at relatively low beam-related sample damage. In this study, "classical"scanning transmission soft X-ray microscopy (STXM) with X-ray absorption spectroscopy and the recently established soft X-ray ptychography are applied to the analysis of selected rock varnish samples from urban and arid desert environments. X-ray ptychography enhances the spatial resolution relative to STXM by up to 1 order of magnitude. With its high chemical sensitivity, it can resolve nanoscale differences in valence states of the key varnish elements manganese (Mn) and iron. Our results emphasize the complex nanoarchitecture of rock varnish as well as the diverse mineralogy of the Mn oxy-hydroxide matrix and its embedded dust grains. In contrast to the fast-growing urban varnish, the slow-growing arid desert varnish revealed a remarkable nanoscale stratification of alternating Mn valence states, providing hints on the layer-wise and still enigmatic growth process.

The spatial distribution of transition metal valence states is of broad interest in the microanalysis of geological and environmental samples. An example is rock varnish, a natural manganese (Mn)-rich rock coating, whose genesis mechanism remains a subject of scientific debate. We conducted scanning transmission X-ray microscopy with near-edge X-ray absorption fine-structure spectroscopy (STXM-NEXAFS) measurements of the abundance and spatial distribution of different Mn oxidation states within the nano-to micrometer thick varnish crusts. Such microanalytical measurements of thin and hard rock crusts require sample preparation with minimal contamination risk. Focused ion beam (FIB) slicing was used to obtain ∼ 100-1000nm thin wedge-shaped slices of the samples for STXM, using standard parameters. However, while this preparation is suitable for investigating element distributions and structures in rock samples, we observed artifactual modifications of the Mn oxidation states at the surfaces of the FIB slices. Our results suggest that the preparation causes a reduction of Mn4+ to Mn2+. We draw attention to this issue, since FIB slicing, scanning electron microscopy (SEM) imaging, and other preparation and visualization techniques operating in the kilo-electron-volt range are well-established in geosciences, but researchers are often unaware of the potential for the reduction of Mn and possibly other elements in the samples.

Abstract. Manganese (Mn)-rich natural rock coatings, so-called rock varnishes, are discussed controversially regarding their genesis. Biogenic and abiogenic mechanisms, as well as a combination of both, have been proposed to be responsible for the Mn oxidation and deposition process. We conducted scanning transmission X-ray microscopy - near edge X-ray absorption fine structure spectroscopy (STXM-NEXAFS) measurements to examine the abundance and spatial distribution of the different oxidation states of Mn within these nano- to micrometer thick crusts. Such microanalytical measurements of thin and hard rock crusts require sample preparation with minimal contamination risk. Focused ion beam (FIB) slicing, a well-established technique in geosciences, was used in this study to obtain 100–200 nm thin slices of the samples for X-ray transmission spectroscopy. However, even though this preparation is suitable to investigate element distributions and structures in rock samples, we observed that, using standard parameters, modifications of the Mn oxidation states occur in the surfaces of the FIB slices. Based on our results, the preparation technique likely causes the reduction of Mn4+ to Mn2+/3+. We draw attention to this issue, since FIB slicing, SEM imaging, and other preparation and visualization techniques operating in the keV range are well-established in geosciences, but researchers are often unaware of the potential for reduction of Mn and possibly other elements in the samples’ surface layers.

Black manganese-rich crusts are found worldwide on the façades of historical buildings. In this study, they were studied exemplarily on the façade of the Freiburger Münster (Freiburg Minster), Germany, and measured in-situ by portable X-ray fluorescence (XRF). The XRF was calibrated to allow the conversion from apparent mass fractions to Mn surface density (Mn mass per area), to compensate for the fact that portable XRF mass fraction measurements from thin layers violate the assumption of a homogeneous measurement volume. Additionally, 200-nm femtosecond laser ablation-inductively coupled plasma-mass spectrometry (fs LA-ICP-MS) measurements, scanning transmission X-ray microscopy-near edge X-ray absorption fine structure spectroscopy (STXM-NEXAFS), Raman spectroscopy, and imaging by light microscopy were conducted to obtain further insight into the crust material, such as potential biogenic contributions, element distributions, trace element compositions, and organic functional groups. While black crusts of various types are present at many places on the minster's facade, crusts rich in Mn (with a Mn surface density >150 μg cm−2) are restricted to a maximum height of about 7 m. The only exceptions are those developed on the Renaissance-Vorhalle (Renaissance Portico) at a height of about 8 m. This part of the façade had been cleaned and treated with a silicon resin as recently as 2003. These crusts thus accumulated over a period of only 12 years. Yet, they are exceptionally Mn-rich with a surface density of 1200 μg cm−2, and therefore require an accumulation rate of about 100 μg cm−2 Mn per year. Trace element analyses support the theory that vehicle emissions are responsible for most of the Mn supply. Lead, barium, and zinc correlate with manganese, indicating that tire material, brake pads, and resuspended road dust are likely to be the element sources. Microscopic investigations show no organisms on or in the Mn-rich crusts. In contrast, Mn-free black crusts sampled at greater heights (>8 m) exhibited fungal and cyanobacterial encrustation. Carbon-rich spots were found by STXM-NEXAFS underneath one of the Mn-rich crusts. However, these carbon occurrences originate from soot and polycyclic aromatic hydrocarbons (PAHs) deposited on top of the crust, rather than from organisms responsible for the crust's formation, as shown by STXM-NEXAFS and Raman spectroscopic measurements. Our results suggest that the crusts develop abiogenically, with vehicle emissions as dominant element sources.

Precise and accurate determination of major components in alkali silicate glasses provides critical information concerning element distribution, petrogenesis and magmatic evolution. However, as one of the most important in situ microanalytical technologies, the application of electron probe microanalysis (EPMA) was limited by the time-dependent loss of X-ray intensity of alkali ions (especially Na) during electron beam bombardment on alkali silicate glasses. In this study, an optimized analytical method was developed using a JEOL JXA 8100 EPMA, aiming to get a long enough incubation duration suitable for accurate analysis of major element mass fractions. The optimal analytical conditions were determined as follows: 15 kV accelerating voltage, 2 nA beam current, 20 μm beam diameter, 40 s peak counting time, Na and K analyzed with top priority, time-saving mode with no additional detector movement and no peak search functioned. The availability of this low beam current density condition (6.37 × 10−3 nA μm−2) to 24 anhydrous reference glasses, with their compositions covering the entire spectrum from the ultramafic to highly siliceous range, was verified by the good agreement of the EPMA measured data with their GeoReM preferred values. Similarly, the methodology presented here is also suitable for analysis of hydrous glasses with H2O contents up to approximately 9 wt%, accompanied by no obvious Na loss found and no complicated mathematical corrections needed, and therefore can be used for the estimation of H2O contents in H2O-rich (>1 wt%) geological glasses by the difference method. Despite its analytical accuracy and precision (>0.5 wt%) not better than those of SIMS and FTIR, EPMA can be used as a substitute technique for H2O determination with its main advantages of excellent spatial resolution (down to 5–10 μm) and analytical convenience, especially for small melt inclusions or tiny experimental quench products, and the case with no appropriate calibration standards or no reported extinction coefficients available for those compositions of interest. In daily application, our optimized method is low cost and easy to implement and can achieve comparable precision and detection limits with acceptable efficiency (∼4–5 min/point for ten major elements) relative to routine analysis conditions. [ABSTRACT FROM AUTHOR]