1. Recognizing Microwave Field Contrast of Invisible Microstrip Defects With High Accuracy by Quantum Wide-Field Microscope
- Author
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Wen, Huan Fei, Jin, Yuchong, Wang, Ding, Wang, Yu, Li, Xin, Li, Zhonghao, Guo, Hao, Ma, Zongmin, Li, Yan Jun, Tang, Jun, and Liu, Jun
- Abstract
Invisible microstrip defect detection is of great significance for ensuring the reliability of integrated circuits and improving the performance of communication system. In this article, the microwave fields radiated by six typically invisible microstrip defects were experimentally characterized with high accuracy based on quantum wide-field microscope, and the origin of microwave field contrast was theoretically analyzed. In a view of
$1400\times 700\,\,\mu \text{m}^{2}$ $1.63~\mu \text{m}$ $^{\mathrm {1/2}}$ - Published
- 2024
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