119 results on '"Jech, M."'
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2. Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence
3. Comphy — A compact-physics framework for unified modeling of BTI
4. Spectroscopic ellipsometry and X-ray photoelectron comparative studies of tribofilms formed on cast iron surfaces
5. Real time durability of tribofilms in the piston ring – cylinder liner contact
6. Impact of the Device Geometric Parameters on Hot-Carrier Degradation in FinFETs
7. Analysis of the Features of Hot-Carrier Degradation in FinFETs
8. The Importance of Secondary Generated Carriers in Modeling of Full Bias Space
9. Junction Leakage Random Telegraph Signals in Arrays of MOSFETs
10. Advanced Atomic Force Microscope based System for Manipulating at the Nanoscale
11. Multiscale Modeling Study of Native Oxide Growth on a Si(100) Surface
12. Sub-micron wear measurement using activities under the free handling limit
13. Analysis of NM-Scale Scratches on High-Gloss Tribological Surfaces by Using an Angle-Resolved Light Scattering Method
14. Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO2 with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier Stacking
15. Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs
16. First–Principles Parameter–Free Modeling of n– and p–FET Hot–Carrier Degradation
17. Understanding and Physical Modeling Superior Hot-Carrier Reliability of Ge pNWFETs
18. Simulation Study: the Effect of Random Dopants and Random Traps on Hot-Carrier Degradation in nFinFETs
19. Physics-based Modeling of Hot-Carrier Degradation in Ge NWFETs
20. Border Trap Based Modeling of SiC Transistor Transfer Characteristics
21. Physical Principles of Self-Consistent Simulation of the Generation of Interface States and the Transport of Hot Charge Carriers in Field-Effect Transistors Based on Metal–Oxide–Semiconductor Structures
22. Анализ особенностей деградации, вызываемой горячими носителями, в транзисторах с каналом в форме плавника
23. Физические основы самосогласованного моделирования процессов генерации интерфейсных состояний и транспорта горячих носителей в транзисторах на базе структур металл-диэлектрик-кремний
24. О влиянии параметров топологии транзистора с каналом в форме плавника на деградацию, вызываемую горячими носителями
25. Hot-carrier degradation in FinFETs: Modeling, peculiarities, and impact of device topology
26. The impact of mixed negative bias temperature instability and hot carrier stress on single oxide defects
27. Efficient physical defect model applied to PBTI in high-κ stacks
28. Mapping of CMOS FET degradation in bias space—Application to dram peripheral devices
29. Abstracts
30. On the effect of interface traps on the carrier distribution function during hot-carrier degradation
31. On the temperature behavior of hot-carrier degradation
32. The Limits of Applicability of the Analytic Model for Hot Carrier Degradation
33. C1.2 - Dark field particle tracking with enhanced sizing precision by confining particles
34. Characterisation of orange peel on highly polished steel surfaces
35. Improving wear resistance of functional surfaces using the machine hammer peening technique
36. TLA and wear quantification of an aluminium–silicon–copper alloy for the car industry
37. Visualisation of suspended nanoparticles by light scattering in a microfluidic chip and manual 2-D tracking for size determination
38. Advancing “bio” sensor integration with Ocean Observing Systems to support ecosystem based approaches
39. Underwater acoustics for ecosystem-based management: state of the science and proposals for ecosystem indicators
40. High-resolution wear analysis of a ball-on-disc contact using low-activity radioactive isotopes
41. Biomaterials as bonding wires for integrated circuit nanopackaging
42. Automated handling of bio-nanowires for nanopackaging
43. Automated nanorobotic handling of bio- and nano-materials
44. Robotic workstation for AFM-based nanomanipulation inside an SEM
45. Towards automated handling of biomaterials for nano-biosensor fabrication
46. Scatterometric analysis of chatter marks occurring in industrial grinding processes
47. Surface analysis of cylinder liners from tribological model experiments and internal combustion engines
48. Ocean Acoustic Waveguide Remote Sensing (OAWRS) of marine ecosystems
49. Analysis of NM-Scale Scratches on High-Gloss Tribological Surfaces by Using an Angle-Resolved Light Scattering Method
50. Comparison of parametric and profilometric surface analysis methods on machined surfaces
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