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3. A 14.7Mb/mm2 28nm FDSOI STT-MRAM with Current Starved Read Path, 52Ω/Sigma Offset Voltage Sense Amplifier and Fully Trimmable CTAT Reference

Author

Manuj Rathor, Suk-Soo Pyo, Steve Ngueya Wandji, Andrew Sowden, Jean Christophe Vial, Alexandra Gourio, Gwan-Hyeob Koh, El Mehdi Boujamaa, Jongwook Kye, Samsudeen Mohamed Ali, Yoon-Jong Song, Cyrille Dray, and Taejoong Song

Subjects
Physics, Magnetoresistive random-access memory, Offset (computer science), Input offset voltage, business.industry, Sense amplifier, Amplifier, Electrical engineering, Word error rate, 020207 software engineering, 02 engineering and technology, law.invention, law, 0202 electrical engineering, electronic engineering, information engineering, Resistor, business, Electrical impedance
Abstract

In this paper we present a read circuitry that tackles all STT-MRAM read challenges. First, a negative temperature coefficient (NTC) reference based on an MTJ in series with an “NTC” resistor circuit emulator is described. Then, an offset cancelled voltage sense amplifier using low read current and reference averaging is discussed. Measurement results show a maximum of 2% reference impedance error (vs. ideal) and 1.7% read error rate degradation (vs. technology intrinsic defectivity rate). A 14.7Mb/mm2 memory density is also achieved, which is the best STT-MRAM published density for embedded applications.

Published
2020
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5. Session 16 - Embedded memory

Author

Jean-Christophe Vial and Kenji Noda

Subjects
Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Transistor, Embedded memory, Hardware_PERFORMANCEANDRELIABILITY, law.invention, Flash (photography), law, Embedded system, Hardware_INTEGRATEDCIRCUITS, Non-volatile random-access memory, Session (computer science), Static random-access memory, business, Computer hardware, Computer memory
Abstract

Penetrating into sub-tenth micron regime, variations in transistor characteristics are having a more critical impact on the design of high-density memories, such as SRAM, Flash and ROM. In this session, two papers from industry and five papers from academia will be presented.

Published
2008
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