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1. Methodology and Best-Practice Guidelines for Thermally Optimized Driver Design

Author

Gillon, Renaud, Wieers, Aarnout, Deleu, Frederik, Janssen, Rick, Schoenmaker, Wim, De Smedt, Bart, Guegnaud, Hervé, Reynier, Pascal, Bock, Hans Georg, Series Editor, de Hoog, Frank, Series Editor, Friedman, Avner, Series Editor, Gupta, Arvind, Series Editor, Nachbin, André, Series Editor, Ozawa, Tohru, Series Editor, Pulleyblank, William R., Series Editor, Rusten, Torgeir, Series Editor, Santosa, Fadil, Series Editor, Seo, Jin Keun, Series Editor, Tornberg, Anna-Karin, Series Editor, ter Maten, E. Jan W., editor, Brachtendorf, Hans-Georg, editor, Pulch, Roland, editor, Schoenmaker, Wim, editor, and De Gersem, Herbert, editor

Published
2019
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2. Validation of Simulation Results on Coupled Problems

Author

Janssen, Rick, Gillon, Renaud, Wieers, Aarnout, Deleu, Frederik, Guegnaud, Hervé, Reynier, Pascal, Schoenmaker, Wim, ter Maten, E. Jan W., Bock, Hans Georg, Series Editor, de Hoog, Frank, Series Editor, Friedman, Avner, Series Editor, Gupta, Arvind, Series Editor, Nachbin, André, Series Editor, Ozawa, Tohru, Series Editor, Pulleyblank, William R., Series Editor, Rusten, Torgeir, Series Editor, Santosa, Fadil, Series Editor, Seo, Jin Keun, Series Editor, Tornberg, Anna-Karin, Series Editor, ter Maten, E. Jan W., editor, Brachtendorf, Hans-Georg, editor, Pulch, Roland, editor, Schoenmaker, Wim, editor, and De Gersem, Herbert, editor

Published
2019
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3. Ageing Models and Reliability Prediction

Author

Gillon, Renaud, Wieers, Aarnout, Deleu, Frederik, Gotthans, Tomas, Janssen, Rick, Schoenmaker, Wim, ter Maten, E. Jan W., Bock, Hans Georg, Series Editor, de Hoog, Frank, Series Editor, Friedman, Avner, Series Editor, Gupta, Arvind, Series Editor, Nachbin, André, Series Editor, Ozawa, Tohru, Series Editor, Pulleyblank, William R., Series Editor, Rusten, Torgeir, Series Editor, Santosa, Fadil, Series Editor, Seo, Jin Keun, Series Editor, Tornberg, Anna-Karin, Series Editor, ter Maten, E. Jan W., editor, Brachtendorf, Hans-Georg, editor, Pulch, Roland, editor, Schoenmaker, Wim, editor, and De Gersem, Herbert, editor

Published
2019
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4. Test Cases for Power-MOS Devices and RF-Circuitry

Author

Janssen, Rick, Gillon, Renaud, Wieers, Aarnout, Deleu, Frederik, Guegnaud, Hervé, Reynier, Pascal, Schoenmaker, Wim, ter Maten, E. Jan W., Bock, Hans Georg, Series Editor, de Hoog, Frank, Series Editor, Friedman, Avner, Series Editor, Gupta, Arvind, Series Editor, Nachbin, André, Series Editor, Ozawa, Tohru, Series Editor, Pulleyblank, William R., Series Editor, Rusten, Torgeir, Series Editor, Santosa, Fadil, Series Editor, Seo, Jin Keun, Series Editor, Tornberg, Anna-Karin, Series Editor, ter Maten, E. Jan W., editor, Brachtendorf, Hans-Georg, editor, Pulch, Roland, editor, Schoenmaker, Wim, editor, and De Gersem, Herbert, editor

Published
2019
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5. Fast Fault Simulation for Detecting Erroneous Connections in ICs

Author

Dohmen, Jos J., Tasic, Bratislav, Janssen, Rick, ter Maten, E. Jan W., Beelen, Theo G. J., Pulch, Roland, Günther, Michael, Bock, Hans Georg, Series Editor, de Hoog, Frank, Series Editor, Friedman, Avner, Series Editor, Gupta, Arvind, Series Editor, Nachbin, André, Series Editor, Ozawa, Tohru, Series Editor, Pulleyblank, William R., Series Editor, Rusten, Torgeir, Series Editor, Santosa, Fadil, Series Editor, Seo, Jin Keun, Series Editor, Tornberg, Anna-Karin, Series Editor, ter Maten, E. Jan W., editor, Brachtendorf, Hans-Georg, editor, Pulch, Roland, editor, Schoenmaker, Wim, editor, and De Gersem, Herbert, editor

Published
2019
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6. Calibration of Probability Density Function

Author

Dohmen, Jos J., Beelen, Theo G. J., Dvortsova, Oryna, ter Maten, E. Jan W., Tasić, Bratislav, Janssen, Rick, Bock, Hans Georg, Series Editor, de Hoog, Frank, Series Editor, Friedman, Avner, Series Editor, Gupta, Arvind, Series Editor, Nachbin, André, Series Editor, Ozawa, Tohru, Series Editor, Pulleyblank, William R., Series Editor, Rusten, Torgeir, Series Editor, Santosa, Fadil, Series Editor, Seo, Jin Keun, Series Editor, Tornberg, Anna-Karin, Series Editor, ter Maten, E. Jan W., editor, Brachtendorf, Hans-Georg, editor, Pulch, Roland, editor, Schoenmaker, Wim, editor, and De Gersem, Herbert, editor

Published
2019
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7. Estimating Failure Probabilities

Author

ter Maten, E. Jan W., Beelen, Theo G. J., Di Bucchianico, Alessandro, Pulch, Roland, Römer, Ulrich, De Gersem, Herbert, Janssen, Rick, Dohmen, Jos J., Tasić, Bratislav, Gillon, Renaud, Wieers, Aarnout, Deleu, Frederik, Bock, Hans Georg, Series Editor, de Hoog, Frank, Series Editor, Friedman, Avner, Series Editor, Gupta, Arvind, Series Editor, Nachbin, André, Series Editor, Ozawa, Tohru, Series Editor, Pulleyblank, William R., Series Editor, Rusten, Torgeir, Series Editor, Santosa, Fadil, Series Editor, Seo, Jin Keun, Series Editor, Tornberg, Anna-Karin, Series Editor, ter Maten, E. Jan W., editor, Brachtendorf, Hans-Georg, editor, Pulch, Roland, editor, Schoenmaker, Wim, editor, and De Gersem, Herbert, editor

Published
2019
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9. Robust Optimization of an RFIC Isolation Problem Under Uncertainties

Author

Putek, Piotr, Janssen, Rick, Niehof, Jan, ter Maten, E. Jan W., Pulch, Roland, Günther, Michael, Tasić, Bratislav, Bock, Hans Georg, Series Editor, de Hoog, Frank, Series Editor, Friedman, Avner, Series Editor, Gupta, Arvind, Series Editor, Nachbin, André, Series Editor, Ozawa, Tohru, Series Editor, Pulleyblank, William R., Series Editor, Rusten, Torgeir, Series Editor, Santosa, Fadil, Series Editor, Seo, Jin Keun, Series Editor, Tornberg, Anna-Karin, Series Editor, Langer, Ulrich, editor, Amrhein, Wolfgang, editor, and Zulehner, Walter, editor

Published
2018
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11. Nanoelectronic Coupled Problem Solutions: Uncertainty Quantification of RFIC Interference

Author

Putek, Piotr, Janssen, Rick, Niehof, Jan, Maten, E. Jan W. ter, Pulch, Roland, Tasić, Bratislav, Günther, Michael, Bock, Hans Georg, Series Editor, de Hoog, Frank, Series Editor, Friedman, Avner, Series Editor, Gupta, Arvind, Series Editor, Nachbin, André, Series Editor, Ozawa, Tohru, Series Editor, Pulleyblank, William R., Series Editor, Rusten, Torgeir, Series Editor, Santosa, Fadil, Series Editor, Seo, Jin Keun, Series Editor, Tornberg, Anna-Karin, Series Editor, Quintela, Peregrina, editor, Barral, Patricia, editor, Gómez, Dolores, editor, Pena, Francisco J., editor, Rodríguez, Jerónimo, editor, Salgado, Pilar, editor, and Vázquez-Méndez, Miguel E., editor

Published
2017
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15. Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation

Author

ter Maten, E Jan W, Putek, Piotr A, Günther, Michael, Pulch, Roland, Tischendorf, Caren, Strohm, Christian, Schoenmaker, Wim, Meuris, Peter, De Smedt, Bart, Benner, Peter, Feng, Lihong, Banagaaya, Nicodemus, Yue, Yao, Janssen, Rick, Dohmen, Jos J, Tasić, Bratislav, Deleu, Frederik, Gillon, Renaud, Wieers, Aarnout, Brachtendorf, Hans-Georg, Bittner, Kai, Kratochvíl, Tomáš, Petřzela, Jiří, Sotner, Roman, Götthans, Tomáš, Dřínovský, Jiří, Schöps, Sebastian, Duque Guerra, David J, Casper, Thorben, De Gersem, Herbert, Römer, Ulrich, Reynier, Pascal, Barroul, Patrice, Masliah, Denis, and Rousseau, Benoît

Published
2016
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23. nanoCOPS: Nanoelectronic COupled Problem Solutions

Author

ter Maten, E Jan W, Günther, Michael, Putek, Piotr, Benner, Peter, Feng, Lihong, Schneider, Judith, Brachtendorf, Hans-Georg, Bittner, Kai, Deleu, Frederik, Wieers, Aarnout, Janssen, Rick, Kratochvíl, Tomáš, Götthans, Tomáš, Pulch, Roland, Liu, Qingzhe, Reynier, Pascal, Schoenmaker, Wim, Meuris, Peter, Schöps, Sebastian, De Gersem, Herbert, Tischendorf, Caren, and Strohm, Christian

Abstract

ispartof: ECMI Newsletter pages:62-67 ispartof: pages:62-67 status: published

Published
2014

26. The nanocops project on algorithms for nanoelectronic coupled problems solutions

Author

Janssen, Rick, Ter Maten, Jan, Tischendorf, Caren, Bachtendorf, Hans-Georg, Bittner, Kai, Schoenmaker, Wim, Benner, Peter, Feng, Lihong, Pulch, Roland, Deleu, Frederik, Wieers, Aarnout, Janssen, Rick, Ter Maten, Jan, Tischendorf, Caren, Bachtendorf, Hans-Georg, Bittner, Kai, Schoenmaker, Wim, Benner, Peter, Feng, Lihong, Pulch, Roland, Deleu, Frederik, and Wieers, Aarnout

Abstract

The nanoCOPS project [1, 2] is a collaborative research project within the FP7- ICT research program funded by the European Union. The consortium comprises experts in mathematics, physics and electrical engineering from seven universities (BU Wuppertal, HU Berlin, Brno UT, TU Darmstadt, FH OÖ Hagenberg, U Greifswald, KU Leuven), one research institute (MPG Magdeburg), two industrial partners (NXP Semiconductors Netherland and ON Semiconductor Belgium) and two SMEs (MAGWEL and ACCO Semiconductor). We present an overview of the project subjects addressing the "bottlenecks" in the currently-available infrastructure for nanoelectronic design and simulation. In particular, we discuss the issues of an electro-thermal-stress coupled simulation for Power-MOS device design and of simulation approaches for transceiver designs at high carrier frequencies and baseband waveforms such as OFDM (Orthogonal Frequency Division Multiplex).

Published
2015

28. Robust and Efficient Uncertainty Quantification and Validation of RFIC Isolation

Author

Di Bucchianico, Alessandro, Ter Maten, Jan, Pulch, Roland, Janssen, Rick, Niehof, Jan, Hanssen, Marcel, Kpora, Sergei, Di Bucchianico, Alessandro, Ter Maten, Jan, Pulch, Roland, Janssen, Rick, Niehof, Jan, Hanssen, Marcel, and Kpora, Sergei

Abstract

Modern communication and identification products impose demanding constraints on reliability of components. Due to this statistical constraints more and more enter optimization formulations of electronic products. Yield constraints often require efficient sampling techniques to obtain uncertainty quantification also at the tails of the distributions. These sampling techniques should outperform standard Monte Carlo techniques, since these latter ones are normally not efficient enough to deal with tail probabilities. One such a technique, Importance Sampling, has successfully been applied to optimize Static Random Access Memories (SRAMs) while guaranteeing very small failure probabilities, even going beyond 6-sigma variations of parameters involved. Apart from this, emerging uncertainty quantifications techniques offer expansions of the solution that serve as a response surface facility when doing statistics and optimization. To efficiently derive the coefficients in the expansions one either has to solve a large number of problems or a huge combined problem. Here parameterized Model Order Reduction (MOR) techniques can be used to reduce the work load. To also reduce the amount of parameters we identify those that only affect the variance in a minor way. These parameters can simply be set to a fixed value. The remaining parameters can be viewed as dominant. Preservation of the variation also allows to make statements about the approximation accuracy obtained by the parameter-reduced problem. This is illustrated on an RLC circuit. Additionally, the MOR technique used should not affect the variance significantly. Finally we consider a methodology for reliable RFIC isolation using floor-plan modeling and isolation grounding. Simulations show good comparison with measurements.

Published
2014

35. Bulk Synchronous Parallelization of Industrial Electromagentic Software.

Author

Dracopoulos, Mike C., Glasgow, Craig, Parrott, A. Kevin, Janssen, Rick, Alotto, Pergiorgio, and Simkin, John

Abstract

The parallelization of existing/industrial electromagnetic software using the bulk synchronous parallel (BSP) com putation model is presented. The software employs the finite element method with a preconditioned conjugate gradient-type solution for the resulting linear systems of equations. A geometric mesh-partitioning approach is ap plied within the BSP framework for the assembly and solution phases of the finite element computation. This is combined with a nongeometric, data-driven parallel quad rature procedure for the evaluation of right-hand-side terms in applications involving coil fields. A similar parallel decomposition is applied to the parallel calculation of electron beam trajectories required for the design of tube devices. The BSP parallelization approach adopted is fully portable, conceptually simple, and cost-effective, and it can be applied to a wide range of finite element applica tions not necessarily related to electromagnetics. [ABSTRACT FROM PUBLISHER]

Published
1997
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36. The nanocops project on algorithms for nanoelectronic coupled problems solutions

Author

Janssen, Rick, Ter Maten, Jan, Tischendorf, Caren, Brachtendorf, Hans-Georg, Bittner, Kai, Schoenmaker, Wim, Peter Benner, Feng, Lihong, Pulch, Roland, Deleu, Frederik, and Wieers, Aarnout

Subjects
Finite element method, nanoelectronics, coupled problems, power devices, RF circuits, Elements finits, Mètode dels, Coupled problems (Complex systems) -- Numerical solutions, Matemàtiques i estadística::Anàlisi numèrica::Mètodes en elements finits [Àrees temàtiques de la UPC]
Abstract

The nanoCOPS project [1, 2] is a collaborative research project within the FP7- ICT research program funded by the European Union. The consortium comprises experts in mathematics, physics and electrical engineering from seven universities (BU Wuppertal, HU Berlin, Brno UT, TU Darmstadt, FH OÖ Hagenberg, U Greifswald, KU Leuven), one research institute (MPG Magdeburg), two industrial partners (NXP Semiconductors Netherland and ON Semiconductor Belgium) and two SMEs (MAGWEL and ACCO Semiconductor). We present an overview of the project subjects addressing the "bottlenecks" in the currently-available infrastructure for nanoelectronic design and simulation. In particular, we discuss the issues of an electro-thermal-stress coupled simulation for Power-MOS device design and of simulation approaches for transceiver designs at high carrier frequencies and baseband waveforms such as OFDM (Orthogonal Frequency Division Multiplex).

37. [Ethics in practice: an injured pig].

Author

Janssen R

Subjects
Animals, Female, Pregnancy, Swine surgery, Animal Welfare ethics, Ethics, Clinical, Euthanasia, Animal ethics, Swine injuries
Published
2009

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