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2. Proton Direct Ionization in Sub-Micron Technologies : Test Methodologies and Modelling

4. SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

6. Methodologies for the Statistical Analysis of Memory Response to Radiation

7. SEGR in SiO${}_2$–Si$_3$N$_4$ Stacks

8. Low Energy Protons at RADEF - Application to Advanced eSRAMs

9. Technological and economical optimization of data center cooling system

10. SEGR in SiO2-Si3N4 stacks

11. Semi-Empirical Model for SEGR Prediction

14. Sotalaivan pääkoneiston erityisvaatimuksia ja valintakriteereitä

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